A 1.2-V 10- µW NPN-Based Temperature Sensor in 65-nm CMOS With an Inaccuracy of 0.2 °C (3σ) From 70 °C to 125 °C

An NPN-based temperature sensor with digital output transistors has been realized in a 65-nm CMOS process. It achieves a batch-calibrated inaccuracy of ±0.5 ◦C (3¾) and a trimmed inaccuracy of ±0.2 ◦C (3¾) over the temperature range from −70 ◦C to 125 ◦C. This performance is obtained by the use of NPN transistors as sensing elements, the use of dynamic techniques, i.e. correlated double sampling and dynamic element matching, and a single room-temperature trim. The sensor draws 8.3 μA from a 1.2-V supply and occupies an area of 0.1 mm2

An accurate, trimless, high PSRR, low-voltage, CMOS bandgap reference IC

Bandgap reference circuits are used in a host of analog, digital, and mixed-signal systems to establish an accurate voltage standard for the entire IC. The accuracy of the bandgap reference voltage under steady-state (dc) and transient (ac) conditions is critical to obtain high system performance. In this work, the impact of process, power-supply, load, and temperature variations and package stresses on the dc and ac accuracy of bandgap reference circuits has been analyzed. Based on this analysis, the a bandgap reference that 1. has high dc accuracy despite process and temperature variations and package stresses, without resorting to expensive trimming or noisy switching schemes, 2. has high dc and ac accuracy despite power-supply variations, without using large off-chip capacitors that increase bill-of-material costs, 3. has high dc and ac accuracy despite load variations, without resorting to error-inducing buffers, 4. is capable of producing a sub-bandgap reference voltage with a low power-supply, to enable it to operate in modern, battery-operated portable applications, 5. utilizes a standard CMOS process, to lower manufacturing costs, and 6. is integrated, to consume less board space has been proposed. The functionality of critical components of the system has been verified through prototypes after which the performance of the complete system has been evaluated by integrating all the individual components on an IC. The proposed CMOS bandgap reference can withstand 5mA of load variations while generating a reference voltage of 890mV that is accurate with respect to temperature to the first order. It exhibits a trimless, dc 3-sigma accuracy performance of 0.84% over a temperature range of -40°C to 125°C and has a worst case ac power-supply ripple rejection (PSRR) performance of 30dB up to 50MHz using 60pF of on-chip capacitance. All the proposed techniques lead to the development of a CMOS bandgap reference that meets the low-cost, high-accuracy demands of state-of-the-art System-on-Chip environments.Ph.D.Committee Chair: Rincon-Mora, Gabriel; Committee Member: Ayazi, Farrokh; Committee Member: Bhatti, Pamela; Committee Member: Leach, W. Marshall; Committee Member: Morley, Thoma

A 65-nm CMOS Temperature-Compensated Mobility-Based Frequency reference for wireless sensor networks

For the first time, a temperature-compensated CMOS frequency reference based on the electron mobility in a MOS transistor is presented. Over the temperature range from -55°C to 125 °C, its frequency spread is less than ±0.5% after a two-point trim and less than ±2.7% after a one-point trim. These results make it suitable for use in Wireless Sensor Network nodes. Fabricated in a baseline 65-nm CMOS process, the 150 kHz frequency reference occupies 0.2 mm2 and draws 42.6 μA from a 1.2-V supply at room temperature.\ud \u

Bandgap Reference Design at the 14-Nanometer FinFET Node

As supply voltages continue to decrease, it becomes harder to ensure that the voltage drop across a diode-connected BJT is sufficient to conduct current without sacrificing die area. One such solution to this potential problem is the diode-connected MOSFET operating in weak inversion. In addition to conducting appreciable current at voltages significantly lower than the power supply, the diode-connected MOSFET reduces the total area for the bandgap implementation. Reference voltage variations across Monte Carlo perturbations are more pronounced as the variation of process parameters are exponentially affected in subthreshold conduction. In order for this proposed solution to be feasible, a design methodology was introduced to mitigate the effects of process variation. A 14 nm bandgap reference was created and simulated across Monte Carlo perturbations for 100 runs at nominal supply voltage and 10% variation of the power supply in either direction. The best case reference voltage was found and used to verify the proposed resistive network solution. The average temperature coefficient was measured to be 66.46 ppm/◦C and the voltage adjustment range was found to be 204.1 mV. The two FinFET subthreshold diodes consume approximately 2.8% of the area of the BJT diode equivalent. Utilizing an appropriate process control technique, subthreshold bandgap references have the potential to overtake traditional BJT-based bandgap architectures in low-power, limited-area applications

A simple bandgap reference based on VGO extraction with single-temperature trimming

Bandgap references are widely used in analog and mixed-signal systems to provide temperature-independent voltage or current reference. In traditional bandgap structure, the base-emitter voltage VBE of a diode is used to generate a complementary to absolute temperature (CTAT) voltage, which reduces as temperature increases. The base-emitter voltage difference ∆VBE between two diodes with the same current but different emitter areas supplies a proportional to absolute temperature (PTAT) voltage. With the proper adjustment of the coefficients of VBE and ∆VBE in a voltage summer, the temperature dependency of the summed voltage can be mostly canceled out and the output voltage can achieve a relative temperature-constant property. However, even though the linear terms of temperature-dependent components in PTAT and CTAT expressions can be canceled out, there are still some high order terms left, which still affect temperature dependency. For this reason, a first-order bandgap reference with only PTAT and CTAT linear term compensation cannot achieve a sufficiently low temperature coefficient (TC), normally ranging from 10ppm/°C to over 100ppm/°C. To achieve higher precision and lower TC, the high order terms also need to be considered and compensated by some techniques. This thesis study describes the development of a high order bandgap structure, including the initial thinking, design flow, equation derivation, circuit implementation, and simulation result

Noise and thermal stability of vibrating micro-gyrometers preamplifiers

The preamplifier is a critical component of gyrometer's electronics. Indeed the resolution of the sensor is limited by its signal to noise ratio, and the gyrometer's thermal stability is limited by its gain drift. In this paper, five different kinds of preamplifiers are presented and compared. Finally, the design of an integrated preamplifier is shown in order to increase the gain stability while reducing its noise and size.Comment: Submitted on behalf of EDA Publishing Association (http://irevues.inist.fr/EDA-Publishing

A low-power native NMOS-based bandgap reference operating from −55°C to 125°C with Li-Ion battery compatibility

Summary The paper describes the implementation of a bandgap reference based on native-MOSFET transistors for low-power sensor node applications. The circuit can operate from −55°C to 125°C and with a supply voltage ranging from 1.5 to 4.2 V. Therefore, it is compatible with the temperature range of automotive and military-aerospace applications, and for direct Li-Ion battery attach. Moreover, the circuit can operate without any dedicated start-up circuit, thanks to its inherent single operating point. A mathematical model of the reference circuit is presented, allowing simple portability across technology nodes, with current consumption and silicon area as design parameters. Implemented in a 55-nm CMOS technology, the voltage reference achieves a measured average (maximum) temperature coefficient of 28 ppm/°C (43 ppm/°C) and a measured sample-to-sample variation within 57 mV, with a current consumption of 420 nA at 27°C

A sub 1V bandgap reference circuit

This thesis proposes a novel technique for a low supply voltage temperature-independent reference voltage. With the scaling of supply voltages, the threshold voltages don’t scale proportionally and thus low supply reference circuits have replaced the conventional bandgap reference circuit. The first chapter of this work discusses the conventional bandgap references (The Widlar and Brokaw references). The terminology used in the bandgap world is introduced here. The second chapter investigates the existing low supply voltage reference circuits with their advantages and the limitations. A table discussing all the investigated circuits is provided towards the end of the chapter as a summary. Chapter Three proposes a novel technique to generate a temperature-independent voltage which does not use an operational amplifier. This chapter also provides a mathematical understanding for behavior of the circuit. Chapter Four talks about two variations of the proposed architecture. These variations are designed in order to improve the performance of the proposed circuit against power supply variations. Each one of them has its own merits and drawbacks. Finally Chapter Five discusses the effects of process variations and transient response of the proposed circuit. A digital trimming scheme using an EE-PROM is proposed to manage almost all of the process variation effects on the circuit

Design and Performance of the CMS Pixel Detector Readout Chip

The readout chip for the CMS pixel detector has to deal with an enormous data rate. On-chip zero suppression is inevitable and hit data must be buffered locally during the latency of the first level trigger. Dead-time must be kept at a minimum. It is dominated by contributions coming from the readout. To keep it low an analog readout scheme has been adopted where pixel addresses are analog coded. We present the architecture of the final CMS pixel detector readout chip with special emphasis on the analog readout chain. Measurements of its performance are discussed.Comment: 8 pages, 11 figures. Contribution to the Proceedings of the Pixel2005 Workshop, Bonn, German

An offset auto-calibration technique with cost-effective implementation for comparator and operational amplifier

Comparators are one of the most fundamental building blocks in all electronic systems involving analog and digital information. A comparator’s performance, or the accuracy of its output, is determined by the comparator’s offset voltage, which includes random offset and systematic offset. To guarantee the overall performance of an entire electronic system, offset-trimming techniques are often necessary to reduce inaccuracy. This study analyzes the offset errors in a representative comparator structure and describes an auto-calibration technique to systematically and significantly reducing the offset. The auto-calibration technique involves trimming of the comparator input transistor pair. Various trimming-switch structures are considered and compared, such as constant-sized drain switch (CDS), constant-sized gate switch (CGS), constant-sized source switch (CSS), binary-weighted source switch (BSS), and constant size split-source switch (SSS). The comparator and the offset auto-calibration circuits are designed using the GlobalFoundry 0.13μm process. Then an offset trimming algorithm, which is written on MATLAB, is applied to these circuits. Afterwards, the results are collected and analyzed. A comparison of linearity and trimming range (TR) achieved with different trimming switch structures is performed to demonstrate advantages and disadvantages of each switch scheme. The results are also plotted in a histogram to show the normal distribution of each scheme. Finally, offset cancellation technique is implemented in an operational amplifier (Op Amp) circuit with further analysis and comparison to prove the methodology