On the Resilience of RTL NN Accelerators: Fault Characterization and Mitigation

Machine Learning (ML) is making a strong resurgence in tune with the massive generation of unstructured data which in turn requires massive computational resources. Due to the inherently compute- and power-intensive structure of Neural Networks (NNs), hardware accelerators emerge as a promising solution. However, with technology node scaling below 10nm, hardware accelerators become more susceptible to faults, which in turn can impact the NN accuracy. In this paper, we study the resilience aspects of Register-Transfer Level (RTL) model of NN accelerators, in particular, fault characterization and mitigation. By following a High-Level Synthesis (HLS) approach, first, we characterize the vulnerability of various components of RTL NN. We observed that the severity of faults depends on both i) application-level specifications, i.e., NN data (inputs, weights, or intermediate), NN layers, and NN activation functions, and ii) architectural-level specifications, i.e., data representation model and the parallelism degree of the underlying accelerator. Second, motivated by characterization results, we present a low-overhead fault mitigation technique that can efficiently correct bit flips, by 47.3% better than state-of-the-art methods.Comment: 8 pages, 6 figure

On the Resilience of RTL NN Accelerators: Fault Characterization and Mitigation

Machine Learning (ML) is making a strong resurgence in tune with the massive generation of unstructured data which in turn requires massive computational resources. Due to the inherently compute and power-intensive structure of Neural Networks (NNs), hardware accelerators emerge as a promising solution. However, with technology node scaling below 10nm, hardware accelerators become more susceptible to faults, which in turn can impact the NN accuracy. In this paper, we study the resilience aspects of Register-Transfer Level (RTL) model of NN accelerators, in particular, fault characterization and mitigation. By following a High-Level Synthesis (HLS) approach, first, we characterize the vulnerability of various components of RTL NN. We observed that the severity of faults depends on both i) application-level specifications, i.e., NN data (inputs, weights, or intermediate) and NN layers and ii) architectural-level specifications, i.e., data representation model and the parallelism degree of the underlying accelerator. Second, motivated by characterization results, we present a low-overhead fault mitigation technique that can efficiently correct bit flips, by 47.3% better than state-of-the-art methods.We thank Pradip Bose, Alper Buyuktosunoglu, and Augusto Vega from IBM Watson for their contribution to this work. The research leading to these results has received funding from the European Union’s Horizon 2020 Programme under the LEGaTO Project (www.legato-project.eu), grant agreement nº 780681.Peer ReviewedPostprint (author's final draft

Timing error detection and correction for power efficiency: an aggressive scaling approach

Low-power consumption has become an important aspect of processors and systems design. Many techniques ranging from architectural to system level are available. Voltage scaling or frequency boosting methods are the most effective to achieve low-power consumption as the dynamic power is proportional to the frequency and to the square of the supply voltage. The basic principle of operation of aggressive voltage scaling is to adjust the supply voltage to the lowest level possible to achieve minimum power consumption while maintaining reliable operations. Similarly, aggressive frequency boosting is to alter the operating frequency to achieve optimum performance improvement. In this study, an aggressive technique which employs voltage or frequency varying hardware circuit with the time-borrowing feature is presented. The proposed technique double samples the data to detect any timing violations as the frequency/voltage is scaled. The detected violations are masked by phase delaying the flip-flop clock to capture the late arrival data. This makes the system timing error tolerant without incurring error correction timing penalty. The proposed technique is implemented in a field programmable gate array using a two-stage arithmetic pipeline. Results on various benchmarks clearly demonstrate the achieved power savings and performance improvement.N/

Comprehensive Evaluation of Supply Voltage Underscaling in FPGA on-Chip Memories

In this work, we evaluate aggressive undervolting, i.e., voltage scaling below the nominal level to reduce the energy consumption of Field Programmable Gate Arrays (FPGAs). Usually, voltage guardbands are added by chip vendors to ensure the worst-case process and environmental scenarios. Through experimenting on several FPGA architectures, we measure this voltage guardband to be on average 39% of the nominal level, which in turn, delivers more than an order of magnitude power savings. However, further undervolting below the voltage guardband may cause reliability issues as the result of the circuit delay increase, i.e., start to appear faults. We extensively characterize the behavior of these faults in terms of the rate, location, type, as well as sensitivity to environmental temperature, with a concentration of on-chip memories, or Block RAMs (BRAMs). Finally, we evaluate a typical FPGA-based Neural Network (NN) accelerator under low-voltage BRAM operations. In consequence, the substantial NN energy savings come with the cost of NN accuracy loss. To attain power savings without NN accuracy loss, we propose a novel technique that relies on the deterministic behavior of undervolting faults and can limit the accuracy loss to 0.1% without any timing-slack overhead.Peer ReviewedPostprint (author's final draft

Design and application of reconfigurable circuits and systems

Open Acces

Power efficient and power attacks resistant system design and analysis using aggressive scaling with timing speculation

Growing usage of smart and portable electronic devices demands embedded system designers to provide solutions with better performance and reduced power consumption. Due to the new development of IoT and embedded systems usage, not only power and performance of these devices but also security of them is becoming an important design constraint. In this work, a novel aggressive scaling based on timing speculation is proposed to overcome the drawbacks of traditional DVFS and provide security from power analysis attacks at the same time. Dynamic voltage and frequency scaling (DVFS) is proven to be the most suitable technique for power efficiency in processor designs. Due to its promising benefits, the technique is still getting researchers attention to trade off power and performance of modern processor designs. The issues of traditional DVFS are: 1) Due to its pre-calculated operating points, the system is not able to suit to modern process variations. 2) Since Process Voltage and Temperature (PVT) variations are not considered, large timing margins are added to guarantee a safe operation in the presence of variations. The research work presented here addresses these issues by employing aggressive scaling mechanisms to achieve more power savings with increased performance. This approach uses in-situ timing error monitoring and recovering mechanisms to reduce extra timing margins and to account for process variations. A novel timing error detection and correction mechanism, to achieve more power savings or high performance, is presented. This novel technique has also been shown to improve security of processors against differential power analysis attacks technique. Differential power analysis attacks can extract secret information from embedded systems without knowing much details about the internal architecture of the device. Simulated and experimental data show that the novel technique can provide a performance improvement of 24% or power savings of 44% while occupying less area and power overhead. Overall, the proposed aggressive scaling technique provides an improvement in power consumption and performance while increasing the security of processors from power analysis attacks.N/

Timing Fault Detection in FPGA-Based Circuits

The operation of FPGA systems, like most VLSI technology, is traditionally governed by static timing analysis, whereby safety margins for operating and manufacturing uncertainty are factored in at design-time. If we operate FPGA designs beyond these conservative margins we can obtain substantial energy and performance improvements. However, doing this carelessly would cause unacceptable impacts to reliability, lifespan and yield - issues which are growing more severe with continuing process scaling. Fortunately, the flexibility of FPGA architecture allows us to monitor and control reliability problems with a variety of runtime instrumentation and adaptation techniques. In this paper we develop a system for detecting timing faults in arbitrary FPGA circuits based on Razor-like shadow register insertion. Through a combination of calibration, timing constraint and adaptation of the CAD flow, we deliver low-overhead, trustworthy fault detection for FPGA-based circuits.Accepted versio