Timed circuit verification using TEL structures

Journal ArticleAbstract-Recent design examples have shown that significant performance gains are realized when circuit designers are allowed to make aggressive timing assumptions. Circuit correctness in these aggressive styles is highly timing dependent and, in industry, they are typically designed by hand. In order to automate the process of designing and verifying timed circuits, algorithms for their synthesis and verification are necessary. This paper presents timed event/level (TEL) structures, a specification formalism for timed circuits that corresponds directly to gate-level circuits. It also presents an algorithm based on partially ordered sets to make the state-space exploration o f TEL structures more tractable. The combination of the new specification method and algorithm significantly improves efficiency for gate-level timing verification. Results on a number of circuits, including many from the recently published gigahertz unit Test Site (guTS) processor from IBM indicate that modules of significant size can be verified using a level of abstraction that preserves the interesting timing properties of the circuit. Accurate circuit level verification allows the designer to include less margin in the design, which can lead to increased performance

Level oriented formal model for asynchronous circuit verification and its efficient analysis method

Journal ArticleUsing a level-oriented model for verification of asynchronous circuits helps users to easily construct formal models with high readability or to naturally model datapath circuits. On the other hand, in order to use such a model on large circuits, techniques to avoid the state explosion problem must be developed. This paper first introduces a level-oriented formal model based on time Petri nets, and then proposes its partial order reduction algorithm that prunes unnecessary state generation while guaranteeing the correctness of the verification

Verification of timed circuits with failure directed abstractions

Journal ArticleThis paper presents a method to address state explosion in timed circuit verification by using abstraction directed by the failure model. This method allows us to decompose the verification problem into a set of subproblems, each of which proves that a specific failure condition does not occur. To each subproblem, abstraction is applied using safe transformations to reduce the complexity of verification. The abstraction preserves all essential behaviors conservatively for the specific failure model in the concrete description. Therefore, no violations of the given failure model are missed when only the abstract description is analyzed. An algorithm is also shown to examine the abstract error trace to either find a concrete error trace or report that it is a false negative. This paper presents results using the proposed failure directed abstractions as applied to two large timed circuit designs

Relative timing

Journal ArticleAbstract-Relative timing (RT) is introduced as a method for asynchronous design. Timing requirements of a circuit are made explicit using relative timing. Timing can be directly added, removed, and optimized using this style. RT synthesis and verification are demonstrated on three example circuits, facilitating transformations from speed-independent circuits to burst-mode and pulse-mode circuits. Relative timing enables improved performance, area, power, and functional testability of up to a factor of 3x in all three cases. This method is the foundation of optimized timed circuit designs used in an industrial test chip, and may be formalized and automated

Doctor of Philosophy

dissertationThe increasing demand for smaller, more efficient circuits has created a need for both digital and analog designs to scale down. Digital technologies have been successful in meeting this challenge, but analog circuits have lagged behind due to smaller transistor sizes having a disproportionate negative affect. Since many applications require small, low-power analog circuits, the trend has been to take advantage of digital's ability to scale by replacing as much of the analog circuitry as possible with digital counterparts. The results are known as \emph{digitally-intensive analog/mixed-signal} (AMS) circuits. Though such circuits have helped the scaling problem, they have further complicated verification. This dissertation improves on techniques for AMS property specifications, as well as, develops sound, efficient extensions to formal AMS verification methods. With the \emph{language for analog/mixed-signal properties} (LAMP), one has a simple intuitive language for specifying AMS properties. LAMP provides a more procedural method for describing properties that is more straightforward than temporal logic-like languages. However, LAMP is still a nascent language and is limited in the types of properties it is capable of describing. This dissertation extends LAMP by adding statements to ignore transient periods and be able to reset the property check when the environment conditions change. After specifying a property, one needs to verify that the circuit satisfies the property. An efficient method for formally verifying AMS circuits is to use the restricted polyhedral class of \emph{zones}. Zones have simple operations for exploring the reachable state space, but they are only applicable to circuit models that utilize constant rates. To extend zones to more general models, this dissertation provides the theory and implementation needed to soundly handle models with ranges of rates. As a second improvement to the state representation, this dissertation describes how octagons can be adapted to model checking AMS circuit models. Though zones have efficient algorithms, it comes at a cost of over-approximating the reachable state space. Octagons have similarly efficient algorithms while adding additional flexibility to reduce the necessary over-approximations. Finally, the full methodology described in this dissertation is demonstrated on two examples. The first example is a switched capacitor integrator that has been studied in the context of transforming the original formal model to use only single rate assignments. Th property of not saturating is written in LAMP, the circuit is learned, and the property is checked against a faulty and correct circuit. In addition, it is shown that the zone extension, and its implementation with octagons, recovers all previous conclusions with the switched capacitor integrator without the need to translate the model. In particular, the method applies generally to all the models produced and does not require the soundness check needed by the translational approach to accept positive verification results. As a second example, the full tool flow is demonstrated on a digital C-element that is driven by a pair of RC networks, creating an AMS circuit. The RC networks are chosen so that the inputs to the C-element are ordered. LAMP is used to codify this behavior and it is verified that the input signals change in the correct order for the provided SPICE simulation traces