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2 research outputs found
Built-in self test for memory systems /
Author
Lerner Steven A.
Publication venue
Lehigh Preserve
Publication date
Field of study
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Lehigh University: Lehigh Preserve
Random access memory testing : theory and practice : the gains of fault modelling
Author
Veenstra P.K.
Publication venue
Eindhoven University of Technology
Publication date
01/01/1986
Field of study
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Repository TU/e
Pure OAI Repository
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