33 research outputs found

    Highly Scalable Neuromorphic Hardware with 1-bit Stochastic nano-Synapses

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    Thermodynamic-driven filament formation in redox-based resistive memory and the impact of thermal fluctuations on switching probability of emerging magnetic switches are probabilistic phenomena in nature, and thus, processes of binary switching in these nonvolatile memories are stochastic and vary from switching cycle-to-switching cycle, in the same device, and from device-to-device, hence, they provide a rich in-situ spatiotemporal stochastic characteristic. This work presents a highly scalable neuromorphic hardware based on crossbar array of 1-bit resistive crosspoints as distributed stochastic synapses. The network shows a robust performance in emulating selectivity of synaptic potentials in neurons of primary visual cortex to the orientation of a visual image. The proposed model could be configured to accept a wide range of nanodevices.Comment: 9 pages, 6 figure

    Computational Capacity and Energy Consumption of Complex Resistive Switch Networks

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    Resistive switches are a class of emerging nanoelectronics devices that exhibit a wide variety of switching characteristics closely resembling behaviors of biological synapses. Assembled into random networks, such resistive switches produce emerging behaviors far more complex than that of individual devices. This was previously demonstrated in simulations that exploit information processing within these random networks to solve tasks that require nonlinear computation as well as memory. Physical assemblies of such networks manifest complex spatial structures and basic processing capabilities often related to biologically-inspired computing. We model and simulate random resistive switch networks and analyze their computational capacities. We provide a detailed discussion of the relevant design parameters and establish the link to the physical assemblies by relating the modeling parameters to physical parameters. More globally connected networks and an increased network switching activity are means to increase the computational capacity linearly at the expense of exponentially growing energy consumption. We discuss a new modular approach that exhibits higher computational capacities and energy consumption growing linearly with the number of networks used. The results show how to optimize the trade-off between computational capacity and energy efficiency and are relevant for the design and fabrication of novel computing architectures that harness random assemblies of emerging nanodevices

    Toward large-scale access-transistor-free memristive crossbars

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    Abstract — Memristive crossbars have been shown to be excel-lent candidates for building an ultra-dense memory system be-cause a per-cell access-transistor may no longer be necessary. However, the elimination of the access-transistor introduces sev-eral parasitic effects due to the existence of partially-selected de-vices during memory accesses, which could limit the scalability of access-transistor-free (ATF) memristive crossbars. In this paper we discuss these challenges in detail and describe some solutions addressing these challenges at multiple levels of design abstrac-tion. I

    A data-driven Verilog-A ReRam model

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    The translation of emerging application concepts that exploit Resistive Random Access Memory (ReRAM) into large-scale practical systems requires realistic yet computationally efficient device models. Here, we present a ReRAM model where device current-voltage characteristics and resistive switching rate are expressed as a function of a) bias voltage and b) initial resistive state. The model’s versatility is validated on detailed characterization data, for both filamentary valence change memory and non-filamentary ReRAM technologies, where device resistance is swept across its operating range using multiple input voltage levels. Furthermore, the proposed model embodies a window function which features a simple mathematical form analytically describing resistive state response under constant bias voltage as extracted from physical device response data. Its Verilog-A implementation captures the ReRAM memory effect without requiring integration of the model state variable, making it suitable for fast and/or large-scale simulations and overall interoperable with current design tools
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