From analog to digital

Analog-to-digital conversion and its reverse, digital-to-analog conversion, are ubiquitous in all modern electronics, from instrumentation and telecommunication equipment to computers and entertainment. We shall explore the consequences of converting signals between the analog and digital domains and give an overview of the internal architecture and operation of a number of converter types. The importance of analog input and clock signal integrity will be explained and methods to prevent or mitigate the effects of interference will be shown. Examples will be drawn from several manufacturers' datasheets

A 1.67 pJ/Conversion-step 8-bit SAR-Flash ADC Architecture in 90-nm CMOS Technology

A novice advanced architecture of 8-bit analog todigital converter is introduced and analyzed in this work. Thestructure of proposed ADC is based on the sub-ranging ADCarchitecture in which a 4-bit resolution flash-ADC is utilized. Theproposed ADC architecture is designed by employing a comparatorwhich is equipped with common mode current feedback andgain boosting technique (CMFD-GB) and a residue amplifier. Theproposed 8 bits ADC structure can achieve the speed of 140 megasamplesper second. The proposed ADC architecture is designedat a resolution of 8 bits at 10 MHz sampling frequency. DNL andINL values of the proposed design are -0.94/1.22 and -1.19/1.19respectively. The ADC design dissipates a power of 1.24 mWwith the conversion speed of 0.98 ns. The magnitude of SFDRand SNR from the simulations at Nyquist input is 39.77 and 35.62decibel respectively. Simulations are performed on a SPICE basedtool in 90 nm CMOS technology. The comparison shows betterperformance for the proposed ADC design in comparison toother ADC architectures regarding speed, resolution and powerconsumption

A 1.67 pJ/Conversion-step 8-bit SAR-Flash ADC Architecture in 90-nm CMOS Technology

A novice advanced architecture of 8-bit analog todigital converter is introduced and analyzed in this work. Thestructure of proposed ADC is based on the sub-ranging ADCarchitecture in which a 4-bit resolution flash-ADC is utilized. Theproposed ADC architecture is designed by employing a comparatorwhich is equipped with common mode current feedback andgain boosting technique (CMFD-GB) and a residue amplifier. Theproposed 8 bits ADC structure can achieve the speed of 140 megasamplesper second. The proposed ADC architecture is designedat a resolution of 8 bits at 10 MHz sampling frequency. DNL andINL values of the proposed design are -0.94/1.22 and -1.19/1.19respectively. The ADC design dissipates a power of 1.24 mWwith the conversion speed of 0.98 ns. The magnitude of SFDRand SNR from the simulations at Nyquist input is 39.77 and 35.62decibel respectively. Simulations are performed on a SPICE basedtool in 90 nm CMOS technology. The comparison shows betterperformance for the proposed ADC design in comparison toother ADC architectures regarding speed, resolution and powerconsumption

Low power data converters for specific applications

Due to increasing importance of portable equipment and reduction of the supply voltage due to technology scaling, recent efforts in the design of mixed-signal circuits have focused on developing new techniques to reduce the power dissipation and supply voltage. This requires research into new architectures and circuit techniques that enable both integration and programmability. Programmability allows each component to be used for different applications, reducing the total number of components, and increased integration by eliminating external components will reduce cost and power;Since data converters are used in many different applications, in this thesis new low voltage and low power data converter techniques at both the architecture and circuit design levels are investigated to minimize power dissipation and supply voltage. To demonstrate the proposed techniques, test the performance of the proposed architectures, and verify their effectiveness in terms of power savings, five prototype chips are fabricated and tested;First, a re-configurable data converter (RDC) architecture is presented that can be programmed as analog-to-digital converter (ADC), digital-to-analog converter (DAC), or both. The reconfigurability of the RDC to different numbers of ADCs and DACs having different speeds and resolutions makes it an ideal choice for analog test bus, mixed-mode boundary scan, and built-in self test applications. It combines the advantages of both analog test buses and boundary scan techniques while the area overhead of the proposed techniques is very low compared to the mixed-mode boundary scan techniques. RDC can save power by allowing the designer to program it as the right converter for desired application. This architecture can be potentially implemented inside a field programmable gate array (FPGA) to allow the FPGA communicate with the analog world. It can also be used as a stand-alone product to give flexibility to the user to choose ADC/DAC combinations for the desired application;Next, a new method for designing low power and small area ROMless direct digital frequency synthesizers (DDFSs) is presented. In this method, a non-linear digital-to-analog converter is used to replace the phase-to-sine amplitude ROM look-up table and the linear DAC in conventional DDFS. Since the non-linear DAC converts the phase information directly into analog sine wave, no phase-to-amplitude ROM look-up table is required;Finally, a new low voltage technique based on biased inverting opamp that can have almost rail-to-rail swing with continuously valid output is discussed. Based on this biasing technique, a 10-bit segmented R-2R DAC and an 8-bit successive approximation ADC are designed and presented

A radiation-hard dual-channel 12-bit 40 MS/s ADC prototype for the ATLAS liquid argon calorimeter readout electronics upgrade at the CERN LHC

The readout electronics upgrade for the ATLAS Liquid Argon Calorimeters at the CERN Large Hadron Collider requires a radiation-hard ADC. The design of a radiation-hard dual-channel 12-bit 40 MS/s pipeline ADC for this use is presented. The design consists of two pipeline A/D channels each with four Multiplying Digital-to-Analog Converters followed by 8-bit Successive-Approximation-Register analog-to-digital converters. The custom design, fabricated in a commercial 130 nm CMOS process, shows a performance of 67.9 dB SNDR at 10 MHz for a single channel at 40 MS/s, with a latency of 87.5 ns (to first bit read out), while its total power consumption is 50 mW/channel. The chip uses two power supply voltages: 1.2 and 2.5 V. The sensitivity to single event effects during irradiation is measured and determined to meet the system requirements

Built-in self-test and self-calibration for analog and mixed signal circuits

Analog-to-digital converters (ADC) are one of the most important components in modern electronic systems. In the mission-critical applications such as automotive, the reliability of the ADC is critical as the ADC impacts the system level performance. Due to the aging effect and environmental changes, the performance of the ADC may degrade and even fail to meet the accuracy requirement over time. Built-in self-test (BIST) and self-calibration are becoming the ultimate solution to achieve lifetime reliability. This dissertation introduces two ADC testing algorithms and two ADC built-in self-test circuit implementations to test the ADC integral nonlinearity (INL) and differential nonlinearity (DNL) on-chip. In the first testing algorithm, the ultrafast stimulus error removal and segmented model identification of linearity errors (USER-SMILE) is developed for ADC built-in self-test, which eliminates the need for precision stimulus and reduces the overall test time. In this algorithm, the ADC is tested twice with a nonlinear ramp, instead of using a linear ramp signal. Therefore, the stimulus can be easily generated on-chip in a low-cost way. For the two ramps, there is a constant voltage shift in between. As the input stimulus linearity is completely relaxed, there is no requirement on the waveform of the input stimulus as long as it covers the ADC input range. In the meantime, the high-resolution ADC linearity is modeled with segmented parameters, which reduces the number of samples required for achieving high-precision test, thus saving the test time. As a result, the USER-SMILE algorithm is able to use less than 1 sample/code nonlinear stimulus to test high resolution ADCs with less than 0.5 least significant bit (LSB) INL estimation error, achieving more than 10-time test time reduction. This algorithm is validated with both board-level implementation and on-chip silicon implementation. The second testing algorithm is proposed to test the INL/DNL for multi-bit-per-stages pipelined ADCs with reduced test time and better test coverage. Due to the redundancy characteristics of multi-bit-per-stages pipelined ADC, the conventional histogram test cannot estimate and calibrate the static linearity accurately. The proposed method models the pipelined ADC nonlinearity as segmented parameters with inter-stage gain errors using the raw codes instead of the final output codes. During the test phase, a pure sine wave is sent to the ADC as the input and the model parameters are estimated from the output data with the system identification method. The modeled errors are then removed from the digital output codes during the calibration phase. A high-speed 12-bit pipelined ADC is tested and calibrated with the proposed method. With only 4000 samples, the 12-bit ADC is accurately tested and calibrated to achieve less than 1 LSB INL. The ADC effective number of bits (ENOB) is improved from 9.7 bits to 10.84 bits and the spurious-free dynamic range (SFDR) is improved by more than 20dB after calibration. In the first circuit implementation, a low-cost on-chip built-in self-test solution is developed using an R2R digital-to-analog converter (DAC) structure as the signal generator and the voltage shift generator for ADC linearity test. The proposed DAC is a subradix-2 R2R DAC with a constant voltage shift generation capability. The subradix-2 architecture avoids positive voltage gaps caused by mismatches, which relaxes the DAC matching requirements and reduces the design area. The R2R DAC based BIST circuit is fabricated in TSMC 40nm technology with a small area of 0.02mm^2. Measurement results show that the BIST circuit is capable of testing a 15-bit ADC INL accurately with less than 0.5 LSB INL estimation error. In the second circuit implementation, a complete SAR ADC built-in self-test solution using the USER-SMILE is developed and implemented in a 28nm automotive microcontroller. A low-cost 12-bit resistive DAC with less than 12-bit linearity is used as the signal generator to test and calibrate a SAR ADC with a target linearity of 12 bits. The voltage shift generation is created inside the ADC with capacitor switching. The entire algorithm processing unit for USER-SMILE algorithm is also implemented on chip. The final testing results are saved in the memory for further digital calibration. Both the total harmonic distortion (THD) and the SFDR are improved by 20dB after calibration, achieving -84.5dB and 86.5dB respectively. More than 700 parts are tested to verify the robustness of the BIST solution

Design techniques for high-performance current-steering digital-to-analog converters

Digital-to-Analog Converter (DAC) is a crucial building block limiting the accuracy and speed of many signal processing and telecommunication systems. To achieve high speed and high resolution, the current-steering architecture is almost exclusively used. Three important issues for current-steering DAC design are addressed in this dissertation. In a current-steering DAC design, it is essential that a designer determine the minimum required current source accuracy to overcome random current mismatch and achieve high linearity with guaranteed yield. Simple formulas are derived that clearly exhibit the relationship between the standard deviation of unit current sources, the bits of resolution, the INL/DNL, and the soft yield of DAC arrays. It is shown that these formulas are very effective for optimizing the DAC segmentation so as to achieve high performance and high yield with minimal area and power consumption. To overcome random mismatch effects without any trimming, the current source array of a high-accuracy DAC is usually rather large, causing the gradient errors in these arrays to become significant. How gradient errors affect the DAC linearity and how to compensate for them through switching sequence optimization is analyzed in the second part of this dissertation. To overcome technology barriers, relax the requirements on layout and reduce the sensitivities of DACs to process, temperature and aging, calibration is emerging as an attractive solution for the next-generation high-performance DACs, especially as process feature size keeps shrinking and supply voltage is reduced correspondingly. A new foreground calibration technique suitable for low-voltage environment is presented in the third part of this dissertation. It can effectively compensate for current source mismatches, and achieve high linearity with small die size and low power consumption. The dynamic performance of the DAC is also improved due to the dramatic reduction of parasitic effects. To demonstrate this technique, a 14-bit prototype was designed and fabricated in a 0.13u digital CMOS process. It is the first 14-bit CMOS DAC ever reported that operates with a single 1.5V power supply, occupies an active area less than 0.1mm2, and requires only 16.7mW at 100MHz sampling rate, but still maintains state-of-art linearity and speed