Generalized disjunction decomposition for the evolution of programmable logic array structures

Evolvable hardware refers to a self reconfigurable electronic circuit, where the circuit configuration is under the control of an evolutionary algorithm. Evolvable hardware has shown one of its main deficiencies, when applied to solving real world applications, to be scalability. In the past few years several techniques have been proposed to avoid and/or solve this problem. Generalized disjunction decomposition (GDD) is one of these proposed methods. GDD was successful for the evolution of large combinational logic circuits based on a FPGA structure when used together with bi-directional incremental evolution and with (1+ë) evolution strategy. In this paper a modified generalized disjunction decomposition, together with a recently introduced multi-population genetic algorithm, are implemented and tested for its scalability for solving large combinational logic circuits based on Programmable Logic Array (PLA) structures

Hierarchical gate-level verification of speed-independent circuits

This paper presents a method for the verification of speed-independent circuits. The main contribution is the reduction of the circuit to a set of complex gates that makes the verification time complexity depend only on the number of state signals (C elements, RS flip-flops) of the circuit. Despite the reduction to complex gates, verification is kept exact. The specification of the environment only requires to describe the transitions of the input/output signals of the circuit and is allowed to express choice and non-determinism. Experimental results obtained from circuits with more than 500 gates show that the computational cost can be drastically reduced when using hierarchical verification.Peer ReviewedPostprint (published version

An Integrated Test Plan for an Advanced Very Large Scale Integrated Circuit Design Group

VLSI testing poses a number of problems which includes the selection of test techniques, the determination of acceptable fault coverage levels, and test vector generation. Available device test techniques are examined and compared. Design rules should be employed to assure the design is testable. Logic simulation systems and available test utilities are compared. The various methods of test vector generation are also examined. The selection criteria for test techniques are identified. A table of proposed design rules is included. Testability measurement utilities can be used to statistically predict the test generation effort. Field reject rates and fault coverage are statistically related. Acceptable field reject rates can be achieved with less than full test vector fault coverage. The methods and techniques which are examined form the basis of the recommended integrated test plan. The methods of automatic test vector generation are relatively primitive but are improving