Undersampled Phase Retrieval with Outliers

We propose a general framework for reconstructing transform-sparse images from undersampled (squared)-magnitude data corrupted with outliers. This framework is implemented using a multi-layered approach, combining multiple initializations (to address the nonconvexity of the phase retrieval problem), repeated minimization of a convex majorizer (surrogate for a nonconvex objective function), and iterative optimization using the alternating directions method of multipliers. Exploiting the generality of this framework, we investigate using a Laplace measurement noise model better adapted to outliers present in the data than the conventional Gaussian noise model. Using simulations, we explore the sensitivity of the method to both the regularization and penalty parameters. We include 1D Monte Carlo and 2D image reconstruction comparisons with alternative phase retrieval algorithms. The results suggest the proposed method, with the Laplace noise model, both increases the likelihood of correct support recovery and reduces the mean squared error from measurements containing outliers. We also describe exciting extensions made possible by the generality of the proposed framework, including regularization using analysis-form sparsity priors that are incompatible with many existing approaches.Comment: 11 pages, 9 figure

Advanced Denoising for X-ray Ptychography

The success of ptychographic imaging experiments strongly depends on achieving high signal-to-noise ratio. This is particularly important in nanoscale imaging experiments when diffraction signals are very weak and the experiments are accompanied by significant parasitic scattering (background), outliers or correlated noise sources. It is also critical when rare events such as cosmic rays, or bad frames caused by electronic glitches or shutter timing malfunction take place. In this paper, we propose a novel iterative algorithm with rigorous analysis that exploits the direct forward model for parasitic noise and sample smoothness to achieve a thorough characterization and removal of structured and random noise. We present a formal description of the proposed algorithm and prove its convergence under mild conditions. Numerical experiments from simulations and real data (both soft and hard X-ray beamlines) demonstrate that the proposed algorithms produce better results when compared to state-of-the-art methods.Comment: 24 pages, 9 figure