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3 research outputs found
Removing constant‐induced errors in stochastic circuits
Author
Hayes John P.
Ting Paishun
Publication venue
'Institution of Engineering and Technology (IET)'
Publication date
01/05/2019
Field of study
Full text link
Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/163790/1/cdt2bf00226.pd
Deep Blue Documents at the University of Michigan
Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Author
Khursheed S.
Miele A.
Trefzer M. A.
Publication venue
Publication date
01/01/2019
Field of study
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Archivio istituzionale della ricerca - Politecnico di Milano
Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems
Author
Khursheed Saqib
Miele Antonio
Trefzer Martin A
Publication venue
'Institution of Engineering and Technology (IET)'
Publication date
01/05/2019
Field of study
Get PDF
University of Liverpool Repository
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