3 research outputs found

    A NEW APPROACH OF AN ERROR DETECTING AND CORRECTING CIRCUIT BY ARITHMETIC LOGIC BLOCKS

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    This paper proposes a unique method of an error detection and correction (EDAC) circuit, carried out using arithmetic logic blocks. The modified logic blocks circuit and its auxiliary components are designed with Boolean and block reduction technique, which reduced one logic gate per block. The reduced logic circuits were simulated and designed using MATLAB Simulink, DSCH 2 CAD, and Microwind CAD tools. The modified, 2:1 multiplexer, demultiplexer, comparator, 1-bit adder, ALU, and error correction and detection circuit were simulated using MATLAB and Microwind. The EDAC circuit operates at a speed of 454.676 MHz and a slew rate of -2.00 which indicates excellence in high speed and low-area.

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    ํ•™์œ„๋…ผ๋ฌธ (์„์‚ฌ)-- ์„œ์šธ๋Œ€ํ•™๊ต ๋Œ€ํ•™์› : ์ „๊ธฐยท์ปดํ“จํ„ฐ๊ณตํ•™๋ถ€, 2015. 2. ์ตœ๊ธฐ์˜.Modern embedded systems are becoming more and more constrained by power consumption. While we require those systems to compute even more data at faster speed, lowering energy consumption is essential to preserve battery life as well as integrity of devices. Amongst many techniques to reduce power consumption of chips such as power gating, clock gating, etc., lowering the supply voltage (maybe reducing chips frequency) is known to be the most effective one. However, lowering the supply voltage of chips too much down to near the threshold voltage of transistors causes the logic delay to vary exponentially with intrinsic and extrinsic variations (process variations, temperature, aging, etc.) and thus forces the designer to set increased timing margin. This thesis proposes a technique for automatically adjusting the supply voltage to match the speed of a logic block with a given time constraint. Depending on process and temperature variations, our technique chooses the minimum supply voltage to satisfy the timing constraint defined by the designer. This allows him/her to reduce the default supply voltage of the logic block and thus save power. In our experiments at the 28/32nm technology node, we succeeded in reducing the logic block power by 52% on average by varying the supply voltage between 0.55V and 1V, while the nominal supply voltage is 1.05V.Abstract Contents List of Figures List of Tables Chapter 1 Introduction 1 Chapter 2 Background 5 1.1 Near-Threshold Computing 5 1.2 Current Sensing Completion Detection 7 Chapter 3 Proposed Approach 12 Chapter 4 Experimental setup 16 4.1 Intrinsic Variations 16 4.2 Extrinsic Variations 17 4.3 Control Block 17 4.4 Logic Block 17 4.5 Experimental parameters 19 Chapter 5 Experimental Results 20 5.1 Results at the TT 22 5.2 Result at the FF 22 5.3 Results at the SS 22 5.4 Effect on temperature 25U 5.5 Final power savings 26 Chapter 6 Conclusion and future work 29 Bibliography 31Maste

    A Novel Methodology for Error-Resilient Circuits in Near-Threshold Computing

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    Department of Electrical EngineeringThe main goal of designing VLSI system is high performance with low energy consumption. Actually, to realize the human-related techniques, such as internet of things (IoTs) and wearable devices, efficient power management techniques are required. Near threshold computing (NTC) is one of the most well-known techniques which is proposed for the trade-off between energy consumption and performance improvement. With this technique, the solution would be selected by the lowest energy with highest performance. However, NTC suffers a significant performance degradation, which is prone to timing errors. However, main goal of Integrated Circuit (IC) design is making the circuit to always operate correctly though worst-case condition. But, in order to make the circuit always work correctly, considerable area and power overheads may occur. As an alternative, better-than-worst-case (BTWC) design paradigm has been proposed. One of the main design of BTWC design includes error-resilient circuits which detect and correct timing errors, though they cause area and power overheads. In this thesis, we propose various design methodologies which provide an optimal implementation of error-resilient circuits. Slack-based, sensitivity-based methodology and modified Quine-McCluskey (Q-M) algorithm have been exploited to earn the minimum set of error-resilient circuits without any loss of detection ability. From sensitivity-based methodology, benchmark results show that the optimal designs reduces up to 46% monitoring area without compromising error detection ability of the initial error-resilient design. From the Quine-McCluskey (Q-M) algorithm, benchmark results show that optimal design reduces up to 72% of flip-flops which are required to be changed to error-resilient circuits without compromising an error detection ability. In addition, more power and area reduction can be possible when reasonable underestimation of error detection ability is accepted. Monte-Carlo analysis validates that our proposed method is tolerant to process variation.ope
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