A Temperature and Reliability Oriented Simulation Framework for Multi-core Architectures

The increasing complexity of multi-core architectures demands for a comprehensive evaluation of different solutions and alternatives at every stage of the design process, considering different aspects at the same time. Simulation frameworks are attractive tools to fulfil this requirement, due to their flexibility. Nevertheless, state-of-the-art simulation frameworks lack a joint analysis of power, performance, temperature profile and reliability projection at system-level, focusing only on a specific aspect. This paper presents a comprehensive estimation framework that jointly exploits these design metrics at system-level, considering processing cores, interconnect design and storage elements. We describe the framework in details, and provide a set of experiments that highlight its capability and flexibility, focusing on temperature and reliability analysis of multi-core architectures supported by Network-on-Chip interconnect

A sensor-less NBTI mitigation methodology for NoC architectures

CMOS technology improvement allows to increase the number of cores integrated on a single chip and makes Network-on-Chips (NoCs) a key component from the performance and reliability standpoints. Unfortunately, continuous scaling of CMOS technology poses severe concerns regarding failure mechanisms such as NBTI and stressmigration, that are crucial in achieving acceptable component lifetime. Process variation complicates the scenario, decreasing device lifetime and performance predictability during chip fabrication. This paper presents a novel sensor-less methodology to reduce the NBTI degradation in the on-chip network virtual channel buffers, considering process variation effects as well. Experimental validation is obtained using a cycle accurate simulator considering both real and synthetic traffic patterns. We compare our methodology to the best sensor-wise approach used as reference golden model. The proposed sensor-less strategy achieves results within 25% to the optimal sensor-wise methodology while this gap is reduced around 10% decreasing the number of virtual channels per input port. Moreover, our proposal can mitigate NBTI impact both in short and long run, since we recover both the most degraded VC (short run) as well as all the other VCs (long term)

Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits

The Negative Bias Temperature Instability (NBTI) phenomenon is agreed to be one of the main reliability concerns in nanoscale circuits. It increases the threshold voltage of pMOS transistors, thus, slows down signal propagation along logic paths between flip-flops. NBTI may cause intermittent faults and, ultimately, the circuit’s permanent functional failures. In this paper, we propose an innovative NBTI mitigation approach by rejuvenating the nanoscale logic along NBTI-critical paths. The method is based on hierarchical identification of NBTI-critical paths and the generation of rejuvenation stimuli using an Evolutionary Algorithm. A new, fast, yet accurate model for computation of NBTI-induced delays at gate-level is developed. This model is based on intensive SPICE simulations of individual gates. The generated rejuvenation stimuli are used to drive those pMOS transistors to the recovery phase, which are the most critical for the NBTI-induced path delay. It is intended to apply the rejuvenation procedure to the circuit, as an execution overhead, periodically. Experimental results performed on a set of designs demonstrate reduction of NBTI-induced delays by up to two times with an execution overhead of 0.1 % or less. The proposed approach is aimed at extending the reliable lifetime of nanoelectronics

Proactive NBTI Mitigation for Busy Functional Units in Out-of-Order Microprocessors

Abstract—Due to fast technology scaling, negative bias temperature instability (NBTI) has become a major reliability concern in designing modern integrated circuits. In this paper, we present a simple and proactive NBTI recovery scheme targeting at critical and busy functional units with storage cells in modern microprocessors. Existing schemes have limitations when recovering these functional units. By exploiting the idle time of busy functional units at per-buffer-entry level, our scheme achieves on average 5.57 × MTTF (Mean Time To Failure) improvement at the cost of <1 % IPC degradation and <1 % area overhead. I

Techniques for Aging, Soft Errors and Temperature to Increase the Reliability of Embedded On-Chip Systems

This thesis investigates the challenge of providing an abstracted, yet sufficiently accurate reliability estimation for embedded on-chip systems. In addition, it also proposes new techniques to increase the reliability of register files within processors against aging effects and soft errors. It also introduces a novel thermal measurement setup that perspicuously captures the infrared images of modern multi-core processors