A fully digital power supply noise thermometer

Power Supply Noise (PSN) is one of the main concerns in scaled technology circuits, both if performance reliability must be assured and if power supply is to be dynamically reduced for dissipation regulation. In this paper we propose a new system for digitally sensing Power Supply and Ground levels that can be both transferred to the output for verification purposes and used by a control block within the circuit under test (CUT) for the activation of power aware policies. The sensor system shows very low overhead in terms of power and area, and works at the nominal CUT frequency. It allows to change on-site the Power Supply and Ground ranges to be sensed and, after a fine tuning, can be arranged for a process variation aware measures. This sensor is fully digital and standard cell based and can be used for every type of architecture on a systematic basis for PSN measure as scan chains are for fault verification. It thus represents a change of paradigm in the way in which PSN measure systems are thought nowaday

Voltage noise analysis with ring oscillator clocks

Voltage noise is the main source of dynamic variability in integrated circuits and a major concern for the design of Power Delivery Networks (PDNs). Ring Oscillators Clocks (ROCs) have been proposed as an alternative to mitigate the negative effects of voltage noise as technology scales down and power density increases. However, their effectiveness highly depends on the design parameters of the PDN, power consumption patterns of the system and spatial locality of the ROCs within the clock domains. This paper analyzes the impact of the PDN parameters and ROC location on the robustness to voltage noise. The capability of reacting instantaneously to unpredictable voltage droops makes ROCs an attractive solution, which allows to reduce the amount of decoupling capacitance without downgrading performance. Tolerance to voltage noise and related benefits can be increased by using multiple ROCs and reducing the size of the clock domains. The analysis shows that up to 83% of the margins for voltage noise and up to 27% of the leakage power can be reduced by using local ROCs.Peer ReviewedPostprint (author's final draft

Increasing the robustness of digital circuits with ring oscillator clocks

Technology scaling enables lower supply voltages, but also increases power density of integrated circuits. In this context, power integrity becomes a major concern in the implementation of highperformance designs. This paper analyzes the influence of Ring Oscillator Clocks (ROCs) on mitigating the impacts of voltage noise. A design with an ROC as the clock source is able to work correctly even in the presence of severe and unpredictable voltage emergencies, without degrading the average performance and power metrics of the circuit. ROCs offer an instantaneous and continuous adaptation to the environment conditions, thus reducing the margins used to prevent timing failures. ROCs provide robustness independently of the power delivery network, thus relaxing the constraints required for the design of the PCB and package. As a by-product, the inherent jitter generated by ROCs produces a spreadspectrum effect that reduces electromagnetic emissions.Peer ReviewedPostprint (published version

Noise reduction in nanometre CMOS

With nanometre scaling, the amount of transistors per 100 square millimetre will increase following Moore's Law. The maximum power will, without additional cooling, be limited to a few watt whereas the on- and off-chip clock and data speeds will increase further. To accommodate this, the core supply voltages are reduced further down to below 1 volt as where the peripheral supply voltages will have to follow international agreed voltages levels to enable interfacing. While lowering the core supply voltages, the on-chip noise margin will drop accordingly and tight on- and off-chip decoupling measures are necessary. However by application, RF switching noise from nanometre CMOS designs are forced out of their packages through the supply and ground pins when applying conventional off-chip decoupling is applied. In this paper, the state-of-the-art, as well as a new noise reduction technique, which is possible with today's nanometre CMOS processes, will be discussed together with guidance to accompanying complementary off-chip measures

Effective network grid synthesis and optimization for high performance very large scale integration system design

制度:新 ; 文部省報告番号:甲2642号 ; 学位の種類:博士(工学) ; 授与年月日:2008/3/15 ; 早大学位記番号:新480

Characterization and management of voltage noise in multi-core, multi-threaded processors

textReliability is one of the important issues of recent microprocessor design. Processors must provide correct behavior as users expect, and must not fail at any time. However, unreliable operation can be caused by excessive supply voltage fluctuations due to an inductive part in a microprocessor power distribution network. This voltage fluctuation issue is referred to as inductive or di/dt noise, and requires thorough analysis and sophisticated design solutions. This dissertation proposes an automated stressmark generation framework to characterize di/dt noise effect, and suggests a practical solution for management of di/dt effects while achieving performance and energy goals. First, the di/dt noise issue is analyzed from theory to a practical view. Inductance is a parasitic part in power distribution network for microprocessor, and its characteristics such as resonant frequencies are reviewed. Then, it is shown that supply voltage fluctuation from resonant behavior is much harmful than single event voltage fluctuations. Voltage fluctuations caused by standard benchmarks such as SPEC CPU2006, PARSEC, Linpack, etc. are studied. Next, an AUtomated DI/dT stressmark generation framework, referred to as AUDIT, is proposed to identify maximum voltage droop in a microprocessor power distribution network. The di/dt stressmark generated from AUDIT framework is an instruction sequence, which draws periodic high and low current pulses that maximize voltage fluctuations including voltage droops. AUDIT uses a Genetic Algorithm in scheduling and optimizing candidate instruction sequences to create a maximum voltage droop. In addition, AUDIT provides with both simulation and hardware measurement methods for finding maximum voltage droops in different design and verification stages of a processor. Failure points in hardware due to voltage droops are analyzed. Finally, a hardware technique, floating-point (FP) issue throttling, is examined, which provides a reduction in worst case voltage droop. This dissertation shows the impact of floating point throttling on voltage droop, and translates this reduction in voltage droop to an increase in operating frequency because additional guardband is no longer required to guard against droops resulting from heavy floating point usage. This dissertation presents two techniques to dynamically determine when to tradeoff FP throughput for reduced voltage margin and increased frequency. These techniques can work in software level without any modification of existing hardware.Electrical and Computer Engineerin

Modeling and Analysis of Large-Scale On-Chip Interconnects

As IC technologies scale to the nanometer regime, efficient and accurate modeling and analysis of VLSI systems with billions of transistors and interconnects becomes increasingly critical and difficult. VLSI systems impacted by the increasingly high dimensional process-voltage-temperature (PVT) variations demand much more modeling and analysis efforts than ever before, while the analysis of large scale on-chip interconnects that requires solving tens of millions of unknowns imposes great challenges in computer aided design areas. This dissertation presents new methodologies for addressing the above two important challenging issues for large scale on-chip interconnect modeling and analysis: In the past, the standard statistical circuit modeling techniques usually employ principal component analysis (PCA) and its variants to reduce the parameter dimensionality. Although widely adopted, these techniques can be very limited since parameter dimension reduction is achieved by merely considering the statistical distributions of the controlling parameters but neglecting the important correspondence between these parameters and the circuit performances (responses) under modeling. This dissertation presents a variety of performance-oriented parameter dimension reduction methods that can lead to more than one order of magnitude parameter reduction for a variety of VLSI circuit modeling and analysis problems. The sheer size of present day power/ground distribution networks makes their analysis and verification tasks extremely runtime and memory inefficient, and at the same time, limits the extent to which these networks can be optimized. Given today?s commodity graphics processing units (GPUs) that can deliver more than 500 GFlops (Flops: floating point operations per second). computing power and 100GB/s memory bandwidth, which are more than 10X greater than offered by modern day general-purpose quad-core microprocessors, it is very desirable to convert the impressive GPU computing power to usable design automation tools for VLSI verification. In this dissertation, for the first time, we show how to exploit recent massively parallel single-instruction multiple-thread (SIMT) based graphics processing unit (GPU) platforms to tackle power grid analysis with very promising performance. Our GPU based network analyzer is capable of solving tens of millions of power grid nodes in just a few seconds. Additionally, with the above GPU based simulation framework, more challenging three-dimensional full-chip thermal analysis can be solved in a much more efficient way than ever before

Voltage drop tolerance by adaptive voltage scaling using clock-data compensation

Proyecto de Graduación (Maestría en Ingeniería en Electrónica) Instituto Tecnológico de Costa Rica, Escuela de Ingeniería Electrónica, 2019.El ruido de alta frecuencia en la red de alimentación compromete el rendimiento y la eficiencia energética de los sistemas electrónicos con microprocesadores, restringiendo la frecuencia máxima de operación de los sistemas y disminuyendo la confiabilidad de los dispositivos. La frecuencia máxima será determinada por la ruta de datos más crítica (la ruta de datos más lenta). De esta manera, es necesario configurar una banda de guarda para tolerar caídas de voltaje sin tener ningún problema de ejecución, pero sacrificando el rendimiento eléctrico. Este trabajo evalúa el impacto de la caída de voltaje en el rendimiento de los circuitos CMOS de alta densidad, estableciendo un conjunto de casos de prueba que contienen diferentes configuraciones de circuitos. Se desarrolló una técnica adaptable y escalable para mejorar la tolerancia a la caída de voltaje en los circuitos CMOS a través del escalado adaptativo, aprovechando el efecto de compensación de datos del reloj. La solución propuesta se validó aplicándola a diferentes casos de prueba en una tecnología FinFet-CMOS a nivel de simulación del diseño físico.High-frequency power supply noise compromises performance and energy efficiency of microprocessor-based products, restricting the maximum frequency of operation for electronic systems and decreasing device reliability. The maximum frequency is going to be determine by the most critical data path (the slowest data path). In this way, a guard band needs to be set in order to tolerate voltage drops without having any execution problem, but leading to a performance reduction. This work evaluates the impact of voltage drop in the performance of CMOS circuits by establishing a set of test cases containing different circuit configurations. An adaptive and scalable technique is proposed to enhance voltage drop tolerance in CMOS circuits through adaptive scaling, taking advantage of the clock-data compensation effect. The proposed solution is validated by applying it to different test cases in a FinFet CMOS technology at a post-layout simulation level