7 research outputs found
Tunable resistivity exponents in the metallic phase of epitaxial nickelates
We report a detailed analysis of the electrical resistivity exponent of thin films of NdNiO3 as a function of epitaxial strain. Thin films under low strain conditions show a linear dependence of the resistivity versus temperature, consistent with a classical Fermi gas ruled by electron-phonon interactions. In addition, the apparent temperature exponent, n, can be tuned with the epitaxial strain between n = 1 and n = 3. We discuss the critical role played by quenched random disorder in the value of n. Our work shows that the assignment of Fermi/Non-Fermi liquid behaviour based on experimentally obtained resistivity exponents requires an in-depth analysis of the degree of disorder in the material
Threshold Switching and Self-Oscillation in Niobium Oxide
Volatile threshold switching, or current controlled negative
differential resistance (CC-NDR), has been observed in a range of
transition metal oxides. Threshold switching devices exhibit a
large non-linear change in electrical conductivity, switching
from an insulating to a metallic state under external stimuli.
Compact, scalable and low power threshold switching devices are
of significant interest for use in existing and emerging
technologies, including as a selector element in high-density
memory arrays and as solid-state oscillators for hardware-based
neuromorphic computing.
This thesis explores the threshold switching in amorphous NbOx
and the properties of individual and coupled oscillators based on
this response. The study begins with an investigation of
threshold switching in Pt/NbOx/TiN devices as a function device
area, NbOx film thickness and temperature, which provides
important insight into the structure of the self-assembled
switching region. The devices exhibit combined threshold-memory
behaviour after an initial voltage-controlled forming
process, but exhibit symmetric threshold switching when the RESET
and SET currents are kept below a critical value. In this mode,
the threshold and hold voltages are shown to be independent of
the device area and film thickness, and the threshold power,
while independent of device area, is shown to decrease with
increasing film thickness. These results are shown to be
consistent with a structure in which the threshold switching
volume is confined, both laterally and vertically, to the region
between the residual memory filament and the electrode, and where
the memory filament has a core-shell structure comprising a
metallic core and a semiconducting shell. The veracity of this
structure is demonstrated by comparing experimental results with
the predictions of a resistor network model, and detailed finite
element simulations.
The next study focuses on electrical self-oscillation of an NbOx
threshold switching device incorporated into a Pearson-Anson
circuit configuration. Measurements confirm stable operation of
the oscillator at source voltages as low as 1.06 V, and
demonstrate frequency control in the range from 2.5 to 20.5 MHz
with maximum frequency tuning range of 18 MHz/V. The oscillator
exhibit three distinct oscillation regimes: sporadic spiking,
stable oscillation and damped oscillation. The oscillation
frequency, peak-to-peak amplitude and frequency are shown to be
temperature and voltage dependent with stable oscillation
achieved for temperatures up to ∼380 K. A physics-based
threshold switching model with inclusion of device and circuit
parameters is shown to explain the oscillation waveform and
characteristic.
The final study explores the oscillation dynamics of capacitively
coupled Nb/Nb2O5 relaxation oscillators. The coupled system
exhibits rich collective behaviour, from weak coupling to
synchronisation, depending on the negative differential
resistance response of the individual devices, the operating
voltage and the coupling capacitance. These coupled oscillators
are shown to exhibit stable frequency and phase locking states at
source voltages as low as 2.2 V with MHz frequency tunable range.
The numerical simulation of the coupled system highlights the
role of source voltage, and circuit and device capacitance in
controlling the coupling modes and dynamics