Binary Patterns Encoded Convolutional Neural Networks for Texture Recognition and Remote Sensing Scene Classification

Designing discriminative powerful texture features robust to realistic imaging conditions is a challenging computer vision problem with many applications, including material recognition and analysis of satellite or aerial imagery. In the past, most texture description approaches were based on dense orderless statistical distribution of local features. However, most recent approaches to texture recognition and remote sensing scene classification are based on Convolutional Neural Networks (CNNs). The d facto practice when learning these CNN models is to use RGB patches as input with training performed on large amounts of labeled data (ImageNet). In this paper, we show that Binary Patterns encoded CNN models, codenamed TEX-Nets, trained using mapped coded images with explicit texture information provide complementary information to the standard RGB deep models. Additionally, two deep architectures, namely early and late fusion, are investigated to combine the texture and color information. To the best of our knowledge, we are the first to investigate Binary Patterns encoded CNNs and different deep network fusion architectures for texture recognition and remote sensing scene classification. We perform comprehensive experiments on four texture recognition datasets and four remote sensing scene classification benchmarks: UC-Merced with 21 scene categories, WHU-RS19 with 19 scene classes, RSSCN7 with 7 categories and the recently introduced large scale aerial image dataset (AID) with 30 aerial scene types. We demonstrate that TEX-Nets provide complementary information to standard RGB deep model of the same network architecture. Our late fusion TEX-Net architecture always improves the overall performance compared to the standard RGB network on both recognition problems. Our final combination outperforms the state-of-the-art without employing fine-tuning or ensemble of RGB network architectures.Comment: To appear in ISPRS Journal of Photogrammetry and Remote Sensin

Local Pyramidal Descriptors for Image Recognition

In this paper, we present a novel method to improve the flexibility of descriptor matching for image recognition by using local multiresolution pyramids in feature space. We propose that image patches be represented at multiple levels of descriptor detail and that these levels be defined in terms of local spatial pooling resolution. Preserving multiple levels of detail in local descriptors is a way of hedging one's bets on which levels will most relevant for matching during learning and recognition. We introduce the Pyramid SIFT (P-SIFT) descriptor and show that its use in four state-of-the-art image recognition pipelines improves accuracy and yields state-of-the-art results. Our technique is applicable independently of spatial pyramid matching and we show that spatial pyramids can be combined with local pyramids to obtain further improvement. We achieve state-of-the-art results on Caltech-101 (80.1%) and Caltech-256 (52.6%) when compared to other approaches based on SIFT features over intensity images. Our technique is efficient and is extremely easy to integrate into image recognition pipelines

Classification and Retrieval of Digital Pathology Scans: A New Dataset

In this paper, we introduce a new dataset, \textbf{Kimia Path24}, for image classification and retrieval in digital pathology. We use the whole scan images of 24 different tissue textures to generate 1,325 test patches of size 1000$\times$1000 (0.5mm$\times$0.5mm). Training data can be generated according to preferences of algorithm designer and can range from approximately 27,000 to over 50,000 patches if the preset parameters are adopted. We propose a compound patch-and-scan accuracy measurement that makes achieving high accuracies quite challenging. In addition, we set the benchmarking line by applying LBP, dictionary approach and convolutional neural nets (CNNs) and report their results. The highest accuracy was 41.80\% for CNN.Comment: Accepted for presentation at Workshop for Computer Vision for Microscopy Image Analysis (CVMI 2017) @ CVPR 2017, Honolulu, Hawai