2 research outputs found

    Functional Verification of Power Electronic Systems

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    This project is the final work of the degree in Industrial Electronics and Automatic Engineering. It has global concepts of electronics but it focuses in power electronic systems. There is a need for reliable testing systems to ensure the good functionality of power electronic systems. The constant evolution of this products requires the development of new testing techniques. This project aims to develop a new testing system to accomplish the functional verification of a new power electronic system manufactured on a company that is in the power electronic sector . This test system consists on two test bed platforms, one to test the control part of the systems and the other one to test their functionality. A software to perform the test is also designed. Finally, the testing protocol is presented. This design is validated and then implemented on a buck converter and an inverter that are manufactured at the company. The results show that the test system is reliable and is capable of testing the functional verification of the two power electronic system successfully. In summary, this design can be introduced in the power electronic production process to test the two products ensuring their reliability in the market

    Monitoring Power Dissipation for Fault Detection

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    In this paper, we suggest that the dynamic power dissipation of a circuit can be used to detect faults in it. The change in dissipation caused by a fault can be maximized by applying specific test vectors. For example circuits, we show that the power dissipation can be used to detect faults which do not affect static power dissipation. We also discuss how faults may be detected with a frequency domain analysis. In many cases, the Fourier spectra of the power supply currents in the good and faulty circuits will be very different. Power monitoring is also verified experimentally, for an example circuit. 1 Introduction Monitoring the current drawn from the power supply is one method to test a CMOS circuit [2--4]. In this paper, we demonstrate that monitoring the dynamic power dissipation of a device can also aid in fault detection. A fault which affects functionality also changes the energy consumption on input transitions. The inputs can be applied so as to maximize the difference in e..
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