An Integrated Approach to Energy Harvester Modeling and Performance Optimization

This paper proposes an integrated approach to energy harvester (EH) modeling and performance optimization where the complete mixed physical-domain EH (micro generator, voltage booster, storage element and load) can be modeled and optimized. We show that electrical equivalent models of the micro generator are inadequate for accurate prediction of the voltage booster’s performance. Through the use of hardware description language (HDL) we demonstrate that modeling the micro generator with analytical equations in the mechanical and magnetic domains provide an accurate model which has been validated in practice. Another key feature of the integrated approach is that it facilitates the incorporation of performance enhanced optimization, which as will be demonstrated is necessary due to the mechanicalelectrical interactions of an EH. A case study of a state-of-the-art vibration-based electromagnetic EH has been presented. We show that performance optimization can increase the energy harvesting rate by about 40%

Moving Towards Analog Functional Safety

Over the past century, the exponential growth of the semiconductor industry has led to the creation of tiny and complex integrated circuits, e.g., sensors, actuators, and smart power systems. Innovative techniques are needed to ensure the correct functionality of analog devices that are ubiquitous in every smart system. The standard ISO 26262 related to functional safety in the automotive context specifies that fault injection is necessary to validate all electronic devices. For decades, standardizing fault modeling, injection and simulation mainly focused on digital circuits and disregarding analog ones. An initial attempt is being made with the IEEE P2427 standard draft standard that started to give this field a structured and formal organization. In this context, new fault models, injection, and abstraction methodologies for analog circuits are proposed in this thesis to enhance this application field. The faults proposed by the IEEE P2427 standard draft standard are initially evaluated to understand the associated fault behaviors during the simulation. Moreover, a novel approach is presented for modeling realistic stuck-on/off defects based on oxide defects. These new defects proposed are required because digital stuck-at-fault models where a transistor is frozen in on-state or offstate may not apply well on analog circuits because even a slight variation could create deviations of several magnitudes. Then, for validating the proposed defects models, a novel predictive fault grouping based on faulty AC matrices is applied to group faults with equivalent behaviors. The proposed fault grouping method is computationally cheap because it avoids performing DC or transient simulations with faults injected and limits itself to faulty AC simulations. Using AC simulations results in two different methods that allow grouping faults with the same frequency response are presented. The first method is an AC-based grouping method that exploits the potentialities of the S-parameters ports. While the second is a Circle-based grouping based on the circle-fitting method applied to the extracted AC matrices. Finally, an open-source framework is presented for the fault injection and manipulation perspective. This framework relies on the shared semantics for reading, writing, or manipulating transistor-level designs. The ultimate goal of the framework is: reading an input design written in a specific syntax and then allowing to write the same design in another syntax. As a use case for the proposed framework, a process of analog fault injection is discussed. This activity requires adding, removing, or replacing nodes, components, or even entire sub-circuits. The framework is entirely written in C++, and its APIs are also interfaced with Python. The entire framework is open-source and available on GitHub. The last part of the thesis presents abstraction methodologies that can abstract transistor level models into Verilog-AMS models and Verilog- AMS piecewise and nonlinear models into C++. These abstracted models can be integrated into heterogeneous systems. The purpose of integration is the simulation of heterogeneous components embedded in a Virtual Platforms (VP) needs to be fast and accurate

Transient electrothermal simulation of power semiconductor devices

In this paper, a new thermal model based on the Fourier series solution of heat conduction equation has been introduced in detail. 1-D and 2-D Fourier series thermal models have been programmed in MATLAB/Simulink. Compared with the traditional finite-difference thermal model and equivalent RC thermal network, the new thermal model can provide high simulation speed with high accuracy, which has been proved to be more favorable in dynamic thermal characterization on power semiconductor switches. The complete electrothermal simulation models of insulated gate bipolar transistor (IGBT) and power diodes under inductive load switching condition have been successfully implemented in MATLAB/Simulink. The experimental results on IGBT and power diodes with clamped inductive load switching tests have verified the new electrothermal simulation model. The advantage of Fourier series thermal model over widely used equivalent RC thermal network in dynamic thermal characterization has also been validated by the measured junction temperature

Analog Defect Injection and Fault Simulation Techniques: A Systematic Literature Review

Since the last century, the exponential growth of the semiconductor industry has led to the creation of tiny and complex integrated circuits, e.g., sensors, actuators, and smart power. Innovative techniques are needed to ensure the correct functionality of analog devices that are ubiquitous in every smart system. The ISO 26262 standard for functional safety in the automotive context specifies that fault injection is necessary to validate all electronic devices. For decades, standardization of defect modeling and injection mainly focused on digital circuits and, in a minor part, on analog ones. An initial attempt is being made with the IEEE P2427 draft standard that started to give a structured and formal organization to the analog testing field. Various methods have been proposed in the literature to speed up the fault simulation of the defect universe for an analog circuit. A more limited number of papers seek to reduce the overall simulation time by reducing the number of defects to be simulated. This literature survey describes the state-of-the-art of analog defect injection and fault simulation methods. The survey is based on the Preferred Reporting Items for Systematic Reviews and Meta-Analyses (PRISMA) methodological flow, allowing for a systematic and complete literature survey. Each selected paper has been categorized and presented to provide an overview of all the available approaches. In addition, the limitations of the various approaches are discussed by showing possible future directions

Addressing the Smart Systems Design Challenge: The SMAC Platform

This article presents the concepts, the organization, and the preliminary application results of SMAC, a smart systems co-design platform. The SMAC platform, which has been developed as Integrated Project (IP) of the 7th ICT Call under the Objective 3.2 \u201cSmart components and Smart Systems integration\u201d addresses the challenges of the integration of heterogeneous and conflicting domains that emerge in the design of smart systems. SMAC includes methodologies and EDA tools enabling multi-disciplinary and multi-scale modelling and design, simulation of multidomain systems, subsystems and components at different levels of abstraction, system integration and exploration for optimization of functional and non-functional metrics. The article presents the preliminary results obtained by adopting the SMAC platform for the design of a limb tracking smart system

EE-BESD: Molecular FET Modeling for Efficient and Effective Nanocomputing Design

Molecular transistor is a good candidate as substitute of CMOS device due to small size, expected good performance and suitability to be included in high density-circuits. To date a lot of effort has been carried out to under- stand the conduction properties in molecular devices. However, minor effort has been devoted to reduce their computational complexity to obtain a compact molec- ular model. First-principle based methods frequently used are highly computational demanding for a single device, thus they are not suitable for complex circuit design. In this paper we present an accurate and at the same time computationally efficient method (named Efficient and Effective model based on Broadening level, Evalua- tion of peaks, Scf and Discrete levels, ee-besd) to calcu- late the electron transport characteristics of molecular transistors in presence of applied bias and gate voltages. The results obtained show a remarkable improve- ment in terms of computational time with respect to existing approaches, while maintaining a very good ac- curacy. Finally, the ee-besd model has been embedded in a circuit level simulator in order to show its function- alities and, particularly, its computational cost. This is shown to be affordable even for circuits based on a high number of devices

Circuit-level modelling and simulation of carbon nanotube devices

The growing academic interest in carbon nanotubes (CNTs) as a promising novel class of electronic materials has led to significant progress in the understanding of CNT physics including ballistic and non-ballistic electron transport characteristics. Together with the increasing amount of theoretical analysis and experimental studies into the properties of CNT transistors, the need for corresponding modelling techniques has also grown rapidly. This research is focused on the electron transport characteristics of CNT transistors, with the aim to develop efficient techniquesto model and simulate CNT devices for logic circuit analysis.The contributions of this research can be summarised as follows. Firstly, to accelerate the evaluation of the equations that model a CNT transistor, while maintaining high modelling accuracy, three efficient numerical techniques based on piece-wise linear, quadratic polynomial and cubic spline approximation have been developed. The numerical approximation simplifies the solution of the CNT transistor’s self-consistent voltage such that the calculation of the drain-source current is accelerated by at least two orders of magnitude. The numerical approach eliminates complicated calculations in the modelling process and facilitates the development of fast and efficient CNT transistor models for circuit simulation.Secondly, non-ballistic CNT transistors have been considered, and extended circuit-level models which can capture both ballistic and non-ballistic electron transport phenomena, including elastic scattering, phonon scattering, strain and tunnelling effects, have been developed. A salient feature of the developed models is their ability to incorporate both ballistic and non-ballistic transport mechanisms without a significant computational cost. The developed models have been extensively validated against reported transport theories of CNT transistors and experimental results.Thirdly, the proposed carbon nanotube transistor models have been implemented on several platforms. The underlying algorithms have been developed and tested in MATLAB, behaviourallevel models in VHDL-AMS, and improved circuit-level models have been implemented in two versions of the SPICE simulator. As the final contribution of this work, parameter variation analysis has been carried out in SPICE3 to study the performance of the proposed circuit-level CNT transistor models in logic circuit analysis. Typical circuits, including inverters and adders, have been analysed to determine the dependence of the circuit’s correct operation on CNT parameter variation

A new design methodology for mixed level and mixed signal simulation using PSpice A/D and VHDL

PSpice A/D is a simulation package that is used to analyze and predict the performance of analog and mixed signal circuits. It is very popular especially among Printed Circuit Board (PCB) engineers to verify board level designs. However, PSpice A/D currently lacks the ability to simulate analog components connected to digital circuits that are modeled using Hardware Descriptive Languages (HDLs), such as VHDL and Verilog HDL. Simulation of HDL models in PSpice A/D is necessary to verify mixed signal PCBs where programmable logic devices like Field Programmable Gate Arrays (FPGAs) and Complex Programmable Logic Devices (CPLDs) are connected to discrete analog components. More than 60% of the PCBs that are designed today contain at least one FPGA or CPLD. This thesis investigates the possibility of simulating VHDL models in PSpice A/D. A new design methodology and the necessary tools to achieve this goal are presented. The new design methodology achieves total system verification at PCB level. Total system verification reduces design failures and hence increases reliability. It also allows reducing the overall time to market. A mixed signal design from NASA Goddard Space Flight Center for a brushless three phase motor that runs a space application is implemented by following the proposed design methodology

Fault-based Analysis of Industrial Cyber-Physical Systems

The fourth industrial revolution called Industry 4.0 tries to bridge the gap between traditional Electronic Design Automation (EDA) technologies and the necessity of innovating in many indus- trial fields, e.g., automotive, avionic, and manufacturing. This complex digitalization process in- volves every industrial facility and comprises the transformation of methodologies, techniques, and tools to improve the efficiency of every industrial process. The enhancement of functional safety in Industry 4.0 applications needs to exploit the studies related to model-based and data-driven anal- yses of the deployed Industrial Cyber-Physical System (ICPS). Modeling an ICPS is possible at different abstraction levels, relying on the physical details included in the model and necessary to describe specific system behaviors. However, it is extremely complicated because an ICPS is com- posed of heterogeneous components related to different physical domains, e.g., digital, electrical, and mechanical. In addition, it is also necessary to consider not only nominal behaviors but even faulty behaviors to perform more specific analyses, e.g., predictive maintenance of specific assets. Nevertheless, these faulty data are usually not present or not available directly from the industrial machinery. To overcome these limitations, constructing a virtual model of an ICPS extended with different classes of faults enables the characterization of faulty behaviors of the system influenced by different faults. In literature, these topics are addressed with non-uniformly approaches and with the absence of standardized and automatic methodologies for describing and simulating faults in the different domains composing an ICPS. This thesis attempts to overcome these state-of-the-art gaps by proposing novel methodologies, techniques, and tools to: model and simulate analog and multi-domain systems; abstract low-level models to higher-level behavioral models; and monitor industrial systems based on the Industrial Internet of Things (IIOT) paradigm. Specifically, the proposed contributions involve the exten- sion of state-of-the-art fault injection practices to improve the ICPSs safety, the development of frameworks for safety operations automatization, and the definition of a monitoring framework for ICPSs. Overall, fault injection in analog and digital models is the state of the practice to en- sure functional safety, as mentioned in the ISO 26262 standard specific for the automotive field. Starting from state-of-the-art defects defined for analog descriptions, new defects are proposed to enhance the IEEE P2427 draft standard for analog defect modeling and coverage. Moreover, dif- ferent techniques to abstract a transistor-level model to a behavioral model are proposed to speed up the simulation of faulty circuits. Therefore, unlike the electrical domain, there is no extensive use of fault injection techniques in the mechanical one. Thus, extending the fault injection to the mechanical and thermal fields allows for supporting the definition and evaluation of more reliable safety mechanisms. Hence, a taxonomy of mechanical faults is derived from the electrical domain by exploiting the physical analogies. Furthermore, specific tools are built for automatically instru- menting different descriptions with multi-domain faults. The entire work is proposed as a basis for supporting the creation of increasingly resilient and secure ICPS that need to preserve functional safety in any operating context

Modeling and simulation of magnetic components in electric circuits

This thesis demonstrates how by using a variety of model constructions and parameter extraction techniques, a range of magnetic component models can be developed for a wide range of application areas, with different levels of accuracy appropriate for the simulation required. Novel parameter extraction and model optimization methods are developed, including the innovative use of Genetic Algorithms and Metrics, to ensure the accuracy of the material models used. Multiple domain modeling, including the magnetic, thermal and magnetic aspects are applied in integrated simulations to ensure correct and complete dynamic behaviour under a range of environmental conditions. Improvements to the original Jiles-Atherton theory to more accurately model loop closure and dynamic thermal behaviour are proposed, developed and tested against measured results. Magnetic Component modeling techniques are reviewed and applied in practical examples to evaluate the effectiveness of lumped models, 1D and 2D Finite Element Analysis models and coupling Finite Element Analysis with Circuit Simulation. An original approach, linking SPICE with a Finite Element Analysis solver is presented and evaluated. Practical test cases illustrate the effectiveness of the models used in a variety of contexts. A Passive Fault Current Limiter (FCL) was investigated using a saturable inductor with a magnet offset, and the comparison between measured and simulated results allows accurate prediction of the behaviour of the device. A series of broadband hybrid transformers for ADSL were built, tested, modeled and simulated. Results show clearly how the Total Harmonic Distortion (THD), Inter Modulation Distortion (IMD) and Insertion Loss (IL) can be accurately predicted using simulation.A new implementation of ADSL transformers using a planar magnetic structure is presented, with results presented that compare favourably with current wire wound techniques. The inclusion of transformer models in complete ADSL hybrid simulations demonstrate the effectiveness of the models in the context of a complete electrical system in predicting the overall circuit performance