Investigation and design of key circuit blocks in a 10 bit SAR ADC at 100 MS/s

The work in this thesis is based on the investigation and design of key circuit blocks in a high speed, high resolution SAR ADC in TSMC’s 28nm technology. The research carried out analyses the circuit limitations of the switched capacitor DAC and the settling problems of the reference voltage associated with a switched capacitor scheme. The switched capacitor DAC is a critical block for overall ADC performance and various trade-offs are weighed up before discussing the layout of the split capacitor DAC implemented in the project, from unit capacitor up to top level routing. It also investigates the main sources of error using this topology and implements effective ways of mitigating these errors. The schematic design of DAC switches is also carried out and the results section discusses the top level linearity performance of the DAC. This work also focuses on detailed analysis and implementation of a reference buffer circuit solution that is capable of supplying a reference voltage that is highly accurate and can settle in enough time for the high speed and high resolution specifications required by the SAR ADC. Various solutions were comprehensively investigated for this problem and the design of the chosen flipped voltage follower topology was implemented in schematic and layout. It was subsequently simulated at schematic and extracted parasitics level to verify its functionality and determine its overall performance. Finally, the work done in each block is verified in the context of the whole ADC by top level schematic and extracted layout simulation

Mismatch-Immune Successive-Approximation Techniques for Nanometer CMOS ADCs

During the past decade, SAR ADCs have enjoyed increasing prominence due to their inherently scaling-friendly architecture. Several recent SAR ADC innovations focus on decreasing power consumption, mitigating thermal noise, and improving bandwidth, however most of those that use non-hybrid architectures are limited to moderate (8-10 bit) resolu- tion. Assuming an almost rail-to-rail dynamic range, comparator noise and DAC element mismatch constraints are critical but not insurmountable at 10 bits of resolution or less in sub-100nm processes. On the other hand, analysis shows that for medium-resolution ADCs (11-15 bits, depending on the LSB voltage of the converter), the mismatch sizing constraint still dominates unit capacitor sizing over the kT/C sampling noise constraint, and can only be mitigated by drawing increasingly larger capacitors. The focus of this work is to extend the scaling benefits of the SAR architecture to medium and higher ADC resolutions through mitigating and ultimately harnessing DAC element mismatch. This goal is achieved via a novel, completely reconfigurable capacitor DAC that allows the rearranging of capacitors to different trial groupings in the SAR cycle so that mismatch can be canceled. The DAC is implemented in a 12-bit SAR ADC in 65nm CMOS, and a nearly 2-bit improvement in linearity is demonstrated with a simple reconfiguration algorithm.PHDElectrical EngineeringUniversity of Michigan, Horace H. Rackham School of Graduate Studieshttps://deepblue.lib.umich.edu/bitstream/2027.42/138630/1/ncolins_1.pd