Using MCD-DVS for dynamic thermal management performance improvement

With chip temperature being a major hurdle in microprocessor design, techniques to recover the performance loss due to thermal emergency mechanisms are crucial in order to sustain performance growth. Many techniques for power reduction in the past and some on thermal management more recently have contributed to alleviate this problem. Probably the most important thermal control technique is dynamic voltage and frequency scaling (DVS) which allows for almost cubic reduction in power with worst-case performance penalty only linear. So far, DVS techniques for temperature control have been studied at the chip level. Finer grain DVS is feasible if a globally-asynchronous locally-synchronous (GALS) design style is employed. GALS, also known as multiple-clock domain (MCD), allows for an independent voltage and frequency control for each one of the clock domains that are part of the chip. There are several studies on DVS for GALS that aim to improve energy and power efficiency but not temperature. This paper proposes and analyses the usage of DVS at the domain level to control temperature in a clustered MCD microarchitecture with the goal of improving the performance of applications that do not meet the thermal constraints imposed by the designers.Peer ReviewedPostprint (published version

Impact of parameter variations on circuits and microarchitecture

Parameter variations, which are increasing along with advances in process technologies, affect both timing and power. Variability must be considered at both the circuit and microarchitectural design levels to keep pace with performance scaling and to keep power consumption within reasonable limits. This article presents an overview of the main sources of variability and surveys variation-tolerant circuit and microarchitectural approaches.Peer ReviewedPostprint (published version

Understanding the thermal implications of multicore architectures

Multicore architectures are becoming the main design paradigm for current and future processors. The main reason is that multicore designs provide an effective way of overcoming instruction-level parallelism (ILP) limitations by exploiting thread-level parallelism (TLP). In addition, it is a power and complexity-effective way of taking advantage of the huge number of transistors that can be integrated on a chip. On the other hand, today's higher than ever power densities have made temperature one of the main limitations of microprocessor evolution. Thermal management in multicore architectures is a fairly new area. Some works have addressed dynamic thermal management in bi/quad-core architectures. This work provides insight and explores different alternatives for thermal management in multicore architectures with 16 cores. Schemes employing both energy reduction and activity migration are explored and improvements for thread migration schemes are proposed.Peer ReviewedPostprint (published version

Temperature Regulation in Multicore Processors Using Adjustable-Gain Integral Controllers

This paper considers the problem of temperature regulation in multicore processors by dynamic voltage-frequency scaling. We propose a feedback law that is based on an integral controller with adjustable gain, designed for fast tracking convergence in the face of model uncertainties, time-varying plants, and tight computing-timing constraints. Moreover, unlike prior works we consider a nonlinear, time-varying plant model that trades off precision for simple and efficient on-line computations. Cycle-level, full system simulator implementation and evaluation illustrates fast and accurate tracking of given temperature reference values, and compares favorably with fixed-gain controllers.Comment: 8 pages, 6 figures, IEEE Conference on Control Applications 2015, Accepted Versio

Energy challenges for ICT

The energy consumption from the expanding use of information and communications technology (ICT) is unsustainable with present drivers, and it will impact heavily on the future climate change. However, ICT devices have the potential to contribute signi - cantly to the reduction of CO2 emission and enhance resource e ciency in other sectors, e.g., transportation (through intelligent transportation and advanced driver assistance systems and self-driving vehicles), heating (through smart building control), and manu- facturing (through digital automation based on smart autonomous sensors). To address the energy sustainability of ICT and capture the full potential of ICT in resource e - ciency, a multidisciplinary ICT-energy community needs to be brought together cover- ing devices, microarchitectures, ultra large-scale integration (ULSI), high-performance computing (HPC), energy harvesting, energy storage, system design, embedded sys- tems, e cient electronics, static analysis, and computation. In this chapter, we introduce challenges and opportunities in this emerging eld and a common framework to strive towards energy-sustainable ICT

A Temperature and Reliability Oriented Simulation Framework for Multi-core Architectures

The increasing complexity of multi-core architectures demands for a comprehensive evaluation of different solutions and alternatives at every stage of the design process, considering different aspects at the same time. Simulation frameworks are attractive tools to fulfil this requirement, due to their flexibility. Nevertheless, state-of-the-art simulation frameworks lack a joint analysis of power, performance, temperature profile and reliability projection at system-level, focusing only on a specific aspect. This paper presents a comprehensive estimation framework that jointly exploits these design metrics at system-level, considering processing cores, interconnect design and storage elements. We describe the framework in details, and provide a set of experiments that highlight its capability and flexibility, focusing on temperature and reliability analysis of multi-core architectures supported by Network-on-Chip interconnect

Exceeding Conservative Limits: A Consolidated Analysis on Modern Hardware Margins

Modern large-scale computing systems (data centers, supercomputers, cloud and edge setups and high-end cyber-physical systems) employ heterogeneous architectures that consist of multicore CPUs, general-purpose many-core GPUs, and programmable FPGAs. The effective utilization of these architectures poses several challenges, among which a primary one is power consumption. Voltage reduction is one of the most efficient methods to reduce power consumption of a chip. With the galloping adoption of hardware accelerators (i.e., GPUs and FPGAs) in large datacenters and other large-scale computing infrastructures, a comprehensive evaluation of the safe voltage reduction levels for each different chip can be employed for efficient reduction of the total power. We present a survey of recent studies in voltage margins reduction at the system level for modern CPUs, GPUs and FPGAs. The pessimistic voltage guardbands inserted by the silicon vendors can be exploited in all devices for significant power savings. On average, voltage reduction can reach 12% in multicore CPUs, 20% in manycore GPUs and 39% in FPGAs.Comment: Accepted for publication in IEEE Transactions on Device and Materials Reliabilit

PROCESSOR TEMPERATURE AND RELIABILITY ESTIMATION USING ACTIVITY COUNTERS

With the advent of technology scaling lifetime reliability is an emerging threat in high-performance and deadline-critical systems. High on-chip thermal gradients accelerates localised thermal elevations (hotspots) which increases the aging rate of the semiconductor devices. As a result, reliable operation of the processors has become a challenging task. Therefore, cost effective schemes for estimating temperature and reliability are crucial. In this work we present a reliability estimation scheme that is based on a light-weight temperature estimation technique that monitors hardware events. Unlike previously pro- posed hardware counter-based approaches, our approach involves a linear-temporal-feedback estimator, taking into account the effects of thermal inertia. The proposed approach shows an average absolute error of We then present a counter-based technique to estimate the thermal accelerated aging factor (TAAF), which is an indicator of lifetime reliability. Results demonstrate that the estimation error is within [−3, +5]