Inverse scattering for reflection intensity phase microscopy

Reflection phase imaging provides label-free, high-resolution characterization of biological samples, typically using interferometric-based techniques. Here, we investigate reflection phase microscopy from intensity-only measurements under diverse illumination. We evaluate the forward and inverse scattering model based on the first Born approximation for imaging scattering objects above a glass slide. Under this design, the measured field combines linear forward-scattering and height-dependent nonlinear back-scattering from the object that complicates object phase recovery. Using only the forward-scattering, we derive a linear inverse scattering model and evaluate this model's validity range in simulation and experiment using a standard reflection microscope modified with a programmable light source. Our method provides enhanced contrast of thin, weakly scattering samples that complement transmission techniques. This model provides a promising development for creating simplified intensity-based reflection quantitative phase imaging systems easily adoptable for biological research.https://arxiv.org/abs/1912.07709Accepted manuscrip

Lose The Views: Limited Angle CT Reconstruction via Implicit Sinogram Completion

Computed Tomography (CT) reconstruction is a fundamental component to a wide variety of applications ranging from security, to healthcare. The classical techniques require measuring projections, called sinograms, from a full 180$^\circ$ view of the object. This is impractical in a limited angle scenario, when the viewing angle is less than 180$^\circ$, which can occur due to different factors including restrictions on scanning time, limited flexibility of scanner rotation, etc. The sinograms obtained as a result, cause existing techniques to produce highly artifact-laden reconstructions. In this paper, we propose to address this problem through implicit sinogram completion, on a challenging real world dataset containing scans of common checked-in luggage. We propose a system, consisting of 1D and 2D convolutional neural networks, that operates on a limited angle sinogram to directly produce the best estimate of a reconstruction. Next, we use the x-ray transform on this reconstruction to obtain a "completed" sinogram, as if it came from a full 180$^\circ$ measurement. We feed this to standard analytical and iterative reconstruction techniques to obtain the final reconstruction. We show with extensive experimentation that this combined strategy outperforms many competitive baselines. We also propose a measure of confidence for the reconstruction that enables a practitioner to gauge the reliability of a prediction made by our network. We show that this measure is a strong indicator of quality as measured by the PSNR, while not requiring ground truth at test time. Finally, using a segmentation experiment, we show that our reconstruction preserves the 3D structure of objects effectively.Comment: Spotlight presentation at CVPR 201

Fourier ptychography: current applications and future promises

Traditional imaging systems exhibit a well-known trade-off between the resolution and the field of view of their captured images. Typical cameras and microscopes can either “zoom in” and image at high-resolution, or they can “zoom out” to see a larger area at lower resolution, but can rarely achieve both effects simultaneously. In this review, we present details about a relatively new procedure termed Fourier ptychography (FP), which addresses the above trade-off to produce gigapixel-scale images without requiring any moving parts. To accomplish this, FP captures multiple low-resolution, large field-of-view images and computationally combines them in the Fourier domain into a high-resolution, large field-of-view result. Here, we present details about the various implementations of FP and highlight its demonstrated advantages to date, such as aberration recovery, phase imaging, and 3D tomographic reconstruction, to name a few. After providing some basics about FP, we list important details for successful experimental implementation, discuss its relationship with other computational imaging techniques, and point to the latest advances in the field while highlighting persisting challenges

Automatic Differentiation for Inverse Problems in X-ray Imaging and Microscopy

Computational techniques allow breaking the limits of traditional imaging methods, such as time restrictions, resolution, and optics flaws. While simple computational methods can be enough for highly controlled microscope setups or just for previews, an increased level of complexity is instead required for advanced setups, acquisition modalities or where uncertainty is high; the need for complex computational methods clashes with rapid design and execution. In all these cases, Automatic Differentiation, one of the subtopics of Artificial Intelligence, may offer a functional solution, but only if a GPU implementation is available. In this paper, we show how a framework built to solve just one optimisation problem can be employed for many different X-ray imaging inverse problems

Machine learning -- based diffractive imaging with subwavelength resolution

Far-field characterization of small objects is severely constrained by the diffraction limit. Existing tools achieving sub-diffraction resolution often utilize point-by-point image reconstruction via scanning or labelling. Here, we present a new imaging technique capable of fast and accurate characterization of two-dimensional structures with at least wavelength/25 resolution, based on a single far-field intensity measurement. Experimentally, we realized this technique resolving the smallest-available to us 180-nm-scale features with 532-nm laser light. A comprehensive analysis of machine learning algorithms was performed to gain insight into the learning process and to understand the flow of subwavelength information through the system. Image parameterization, suitable for diffractive configurations and highly tolerant to random noise was developed. The proposed technique can be applied to new characterization tools with high spatial resolution, fast data acquisition, and artificial intelligence, such as high-speed nanoscale metrology and quality control, and can be further developed to high-resolution spectroscop