Guest Editors' Introduction: Selected Papers from IEEE VLSI Test Symposium

The articles in this special section were presented at the 2019 IEEE VLSI Test Symposium (VTS) that was held in Monterey, CA. The 2019 VTS Conference laid particular emphasis on enlarging its scope by soliciting submissions on testing, reliability, and security aspects on the following hot topics: approximate computing, neuromorphic computing, and quantum computing

A survey of dynamic power optimization techniques

One of the most important considerations for the current VLSI/SOC design is power, which can be classified into power analysis and optimization. In this survey, the main concepts of power optimization including the sources and policies are introduced. Among the various approaches, dynamic power management (DPM), which implies to change devices states when they are not working at the highest speed or at their full capacity, is the most efficient one. Our explanations accompanying the figures specify the abstract concepts of DPM. This paper briefly surveys both heuristic and stochastic policies and discusses their advantages and disadvantages

Low Power Processor Architectures and Contemporary Techniques for Power Optimization – A Review

The technological evolution has increased the number of transistors for a given die area significantly and increased the switching speed from few MHz to GHz range. Such inversely proportional decline in size and boost in performance consequently demands shrinking of supply voltage and effective power dissipation in chips with millions of transistors. This has triggered substantial amount of research in power reduction techniques into almost every aspect of the chip and particularly the processor cores contained in the chip. This paper presents an overview of techniques for achieving the power efficiency mainly at the processor core level but also visits related domains such as buses and memories. There are various processor parameters and features such as supply voltage, clock frequency, cache and pipelining which can be optimized to reduce the power consumption of the processor. This paper discusses various ways in which these parameters can be optimized. Also, emerging power efficient processor architectures are overviewed and research activities are discussed which should help reader identify how these factors in a processor contribute to power consumption. Some of these concepts have been already established whereas others are still active research areas. © 2009 ACADEMY PUBLISHER

Dynamic Voltage Scaling Aware Delay Fault Testing

The application of Dynamic Voltage Scaling (DVS) to reduce energy consumption may have a detrimental impact on the quality of manufacturing tests employed to detect permanent faults. This paper analyses the influence of different voltage/frequency settings on fault detection within a DVS application. In particular, the effect of supply voltage on different types of delay faults is considered. This paper presents a study of these problems with simulation results. We have demonstrated that the test application time increases as we reduce the test voltage. We have also shown that for newer technologies we do not have to go to very low voltage levels for delay fault testing. We conclude that it is necessary to test at more than one operating voltage and that the lowest operating voltage does not necessarily give the best fault cover