Functional Testing and Constrained Synthesis of Sequential Architectures

A new approach is presented for test pattern generation for finite state machines and the relationships with their gate level implementation. The results on a study on implementation constraints that will guarantee a fixed fault coverage are presented. The proposed techniques are checked through some MCNC benchmarks and their results are compared with previous papers

Functional Testing and Constrained Synthesis of Sequential Architectures

A new approach is presented for test pattern generation for finite state machines and the relationships with their gate level implementation. The results on a study on implementation constraints that will guarantee a fixed fault coverage are presented. The proposed techniques are checked through some MCNC benchmarks and their results are compared with previous papers