Symmetry-guided nonrigid registration: the case for distortion correction in multidimensional photoemission spectroscopy

Image symmetrization is an effective strategy to correct symmetry distortion in experimental data for which symmetry is essential in the subsequent analysis. In the process, a coordinate transform, the symmetrization transform, is required to undo the distortion. The transform may be determined by image registration (i.e. alignment) with symmetry constraints imposed in the registration target and in the iterative parameter tuning, which we call symmetry-guided registration. An example use case of image symmetrization is found in electronic band structure mapping by multidimensional photoemission spectroscopy, which employs a 3D time-of-flight detector to measure electrons sorted into the momentum ($k_x$, $k_y$) and energy ($E$) coordinates. In reality, imperfect instrument design, sample geometry and experimental settings cause distortion of the photoelectron trajectories and, therefore, the symmetry in the measured band structure, which hinders the full understanding and use of the volumetric datasets. We demonstrate that symmetry-guided registration can correct the symmetry distortion in the momentum-resolved photoemission patterns. Using proposed symmetry metrics, we show quantitatively that the iterative approach to symmetrization outperforms its non-iterative counterpart in the restored symmetry of the outcome while preserving the average shape of the photoemission pattern. Our approach is generalizable to distortion corrections in different types of symmetries and should also find applications in other experimental methods that produce images with similar features

Numerical correction of anti-symmetric aberrations in single HRTEM images of weakly scattering 2D-objects

Here, we present a numerical post-processing method for removing the effect of anti-symmetric residual aberrations in high-resolution transmission electron microscopy (HRTEM) images of weakly scattering 2D-objects. The method is based on applying the same aberrations with the opposite phase to the Fourier transform of the recorded image intensity and subsequently inverting the Fourier transform. We present the theoretical justification of the method and its verification based on simulated images in the case of low-order anti-symmetric aberrations. Ultimately the method is applied to experimental hardware aberration-corrected HRTEM images of single-layer graphene and MoSe2 resulting in images with strongly reduced residual low-order aberrations, and consequently improved interpretability. Alternatively, this method can be used to estimate by trial and error the residual anti-symmetric aberrations in HRTEM images of weakly scattering objects