8,513 research outputs found

    Explicit Non-Adaptive Combinatorial Group Testing Schemes

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    Group testing is a long studied problem in combinatorics: A small set of rr ill people should be identified out of the whole (nn people) by using only queries (tests) of the form "Does set X contain an ill human?". In this paper we provide an explicit construction of a testing scheme which is better (smaller) than any known explicit construction. This scheme has \bigT{\min[r^2 \ln n,n]} tests which is as many as the best non-explicit schemes have. In our construction we use a fact that may have a value by its own right: Linear error-correction codes with parameters [m,k,δm]q[m,k,\delta m]_q meeting the Gilbert-Varshamov bound may be constructed quite efficiently, in \bigT{q^km} time.Comment: 15 pages, accepted to ICALP 200

    Noise-Resilient Group Testing: Limitations and Constructions

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    We study combinatorial group testing schemes for learning dd-sparse Boolean vectors using highly unreliable disjunctive measurements. We consider an adversarial noise model that only limits the number of false observations, and show that any noise-resilient scheme in this model can only approximately reconstruct the sparse vector. On the positive side, we take this barrier to our advantage and show that approximate reconstruction (within a satisfactory degree of approximation) allows us to break the information theoretic lower bound of Ω~(d2logn)\tilde{\Omega}(d^2 \log n) that is known for exact reconstruction of dd-sparse vectors of length nn via non-adaptive measurements, by a multiplicative factor Ω~(d)\tilde{\Omega}(d). Specifically, we give simple randomized constructions of non-adaptive measurement schemes, with m=O(dlogn)m=O(d \log n) measurements, that allow efficient reconstruction of dd-sparse vectors up to O(d)O(d) false positives even in the presence of δm\delta m false positives and O(m/d)O(m/d) false negatives within the measurement outcomes, for any constant δ<1\delta < 1. We show that, information theoretically, none of these parameters can be substantially improved without dramatically affecting the others. Furthermore, we obtain several explicit constructions, in particular one matching the randomized trade-off but using m=O(d1+o(1)logn)m = O(d^{1+o(1)} \log n) measurements. We also obtain explicit constructions that allow fast reconstruction in time \poly(m), which would be sublinear in nn for sufficiently sparse vectors. The main tool used in our construction is the list-decoding view of randomness condensers and extractors.Comment: Full version. A preliminary summary of this work appears (under the same title) in proceedings of the 17th International Symposium on Fundamentals of Computation Theory (FCT 2009

    Derandomization and Group Testing

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    The rapid development of derandomization theory, which is a fundamental area in theoretical computer science, has recently led to many surprising applications outside its initial intention. We will review some recent such developments related to combinatorial group testing. In its most basic setting, the aim of group testing is to identify a set of "positive" individuals in a population of items by taking groups of items and asking whether there is a positive in each group. In particular, we will discuss explicit constructions of optimal or nearly-optimal group testing schemes using "randomness-conducting" functions. Among such developments are constructions of error-correcting group testing schemes using randomness extractors and condensers, as well as threshold group testing schemes from lossless condensers.Comment: Invited Paper in Proceedings of 48th Annual Allerton Conference on Communication, Control, and Computing, 201

    Construction of Almost Disjunct Matrices for Group Testing

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    In a \emph{group testing} scheme, a set of tests is designed to identify a small number tt of defective items among a large set (of size NN) of items. In the non-adaptive scenario the set of tests has to be designed in one-shot. In this setting, designing a testing scheme is equivalent to the construction of a \emph{disjunct matrix}, an M×NM \times N matrix where the union of supports of any tt columns does not contain the support of any other column. In principle, one wants to have such a matrix with minimum possible number MM of rows (tests). One of the main ways of constructing disjunct matrices relies on \emph{constant weight error-correcting codes} and their \emph{minimum distance}. In this paper, we consider a relaxed definition of a disjunct matrix known as \emph{almost disjunct matrix}. This concept is also studied under the name of \emph{weakly separated design} in the literature. The relaxed definition allows one to come up with group testing schemes where a close-to-one fraction of all possible sets of defective items are identifiable. Our main contribution is twofold. First, we go beyond the minimum distance analysis and connect the \emph{average distance} of a constant weight code to the parameters of an almost disjunct matrix constructed from it. Our second contribution is to explicitly construct almost disjunct matrices based on our average distance analysis, that have much smaller number of rows than any previous explicit construction of disjunct matrices. The parameters of our construction can be varied to cover a large range of relations for tt and NN.Comment: 15 Page

    Efficiently Decodable Non-Adaptive Threshold Group Testing

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    We consider non-adaptive threshold group testing for identification of up to dd defective items in a set of nn items, where a test is positive if it contains at least 2ud2 \leq u \leq d defective items, and negative otherwise. The defective items can be identified using t=O((du)u(ddu)du(ulogdu+log1ϵ)d2logn)t = O \left( \left( \frac{d}{u} \right)^u \left( \frac{d}{d - u} \right)^{d-u} \left(u \log{\frac{d}{u}} + \log{\frac{1}{\epsilon}} \right) \cdot d^2 \log{n} \right) tests with probability at least 1ϵ1 - \epsilon for any ϵ>0\epsilon > 0 or t=O((du)u(ddu)dud3lognlognd)t = O \left( \left( \frac{d}{u} \right)^u \left( \frac{d}{d -u} \right)^{d - u} d^3 \log{n} \cdot \log{\frac{n}{d}} \right) tests with probability 1. The decoding time is t×poly(d2logn)t \times \mathrm{poly}(d^2 \log{n}). This result significantly improves the best known results for decoding non-adaptive threshold group testing: O(nlogn+nlog1ϵ)O(n\log{n} + n \log{\frac{1}{\epsilon}}) for probabilistic decoding, where ϵ>0\epsilon > 0, and O(nulogn)O(n^u \log{n}) for deterministic decoding
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