HOPE: Holistic STT-RAM Architecture Exploration Framework for Future Cross-Platform Analysis

Spin Transfer Torque Random Access Memory (STT-RAM) is an emerging Non-Volatile Memory (NVM) technology that has garnered attention to overcome the drawbacks of conventional CMOS-based technologies. However, such technologies must be evaluated before deployment under real workloads and architecture. But there is a lack of available open-source STT-RAM-based system evaluation framework, which hampers research and experimentation and impacts the adoption of STT- RAM in a system. This paper proposes a novel, extendable STT-RAM memory controller design integrated inside the gem5 simulator. Our framework enables understanding various aspects of STT-RAM, i.e., power, delay, clock cycles, energy, and system throughput. We will open-source our HOPE framework, which will fuel research and aid in accelerating the development of future system architectures based on STT-RAM. It will also facilitate the user for further tool enhancement

Safety and Reliability - Safe Societies in a Changing World

The contributions cover a wide range of methodologies and application areas for safety and reliability that contribute to safe societies in a changing world. These methodologies and applications include: - foundations of risk and reliability assessment and management - mathematical methods in reliability and safety - risk assessment - risk management - system reliability - uncertainty analysis - digitalization and big data - prognostics and system health management - occupational safety - accident and incident modeling - maintenance modeling and applications - simulation for safety and reliability analysis - dynamic risk and barrier management - organizational factors and safety culture - human factors and human reliability - resilience engineering - structural reliability - natural hazards - security - economic analysis in risk managemen

Full Proceedings, 2018

Full conference proceedings for the 2018 International Building Physics Association Conference hosted at Syracuse University