Parallelization of cycle-based logic simulation

Verification of digital circuits by Cycle-based simulation can be performed in parallel. The parallel implementation requires two phases: the compilation phase, that sets up the data needed for the execution of the simulation, and the simulation phase, that consists in executing the parallel simulation of the considered circuit for a certain number of cycles. During the early phase of design, compilation phase has to be repeated each time a bug is found. Thus, if the time of the compilation phase is too high, the advantages stemming from the parallel approach may be lost. In this work we propose an effective version of the compilation phase and compute the corresponding execution time. We also analyze the percentage of execution time required by the different steps of the compilation phase for a set of literature benchmarks. Further, we implemented the simulation phase exploiting the GPU architecture, and we computed the execution times for a set of benchmarks obtaining values comparable with literature ones. Finally, we implemented the sequential version of the Cycle-based simulation in such a way that the execution time is optimized. We used the sequential values to compute the speedup of the parallel version for the considered set of benchmarks

Gate Delay Fault Test Generation for Non-Scan Circuits

This article presents a technique for the extension of delay fault test pattern generation to synchronous sequential circuits without making use of scan techniques. The technique relies on the coupling of TDgen, a robust combinational test pattern generator for delay faults, and SEMILET, a sequential test pattern generator for several static fault models. The approach uses a forward propagation-backward justification technique: The test pattern generation is started at the fault location, and after successful ¿local¿ test generation fault effect propagation is performed and finally a synchronising sequence to the required state is computed. The algorithm is complete for a robust gate delay fault model, which means that for every testable fault a test will be generated, assuming sufficient time. Experimental results for the ISCAS'89 benchmarks are presented in this pape

Using an FPGA for Fast Bit Accurate SoC Simulation

In this paper we describe a sequential simulation method to simulate large parallel homo- and heterogeneous systems on a single FPGA. The method is applicable for parallel systems were lengthy cycle and bit accurate simulations are required. It is particularly designed for systems that do not fit completely on the simulation platform (i.e. FPGA). As a case study, we use a Network-on-Chip (NoC) that is simulated in SystemC and on the described FPGA simulator. This enables us to observe the NoC behavior under a large variety of traffic patterns. Compared with the SystemC simulation we achieved a factor 80-300 of speed improvement, without compromising the cycle and bit level accuracy

Optimising Simulation Data Structures for the Xeon Phi

In this paper, we propose a lock-free architecture to accelerate logic gate circuit simulation using SIMD multi-core machines. We evaluate its performance on different test circuits simulated on the Intel Xeon Phi and 2 other machines. Comparisons are presented of this software/hardware combination with reported performances of GPU and other multi-core simulation platforms. Comparisons are also given between the lock free architecture and a leading commercial simulator running on the same Intel hardware

Verified AIG Algorithms in ACL2

And-Inverter Graphs (AIGs) are a popular way to represent Boolean functions (like circuits). AIG simplification algorithms can dramatically reduce an AIG, and play an important role in modern hardware verification tools like equivalence checkers. In practice, these tricky algorithms are implemented with optimized C or C++ routines with no guarantee of correctness. Meanwhile, many interactive theorem provers can now employ SAT or SMT solvers to automatically solve finite goals, but no theorem prover makes use of these advanced, AIG-based approaches. We have developed two ways to represent AIGs within the ACL2 theorem prover. One representation, Hons-AIGs, is especially convenient to use and reason about. The other, Aignet, is the opposite; it is styled after modern AIG packages and allows for efficient algorithms. We have implemented functions for converting between these representations, random vector simulation, conversion to CNF, etc., and developed reasoning strategies for verifying these algorithms. Aside from these contributions towards verifying AIG algorithms, this work has an immediate, practical benefit for ACL2 users who are using GL to bit-blast finite ACL2 theorems: they can now optionally trust an off-the-shelf SAT solver to carry out the proof, instead of using the built-in BDD package. Looking to the future, it is a first step toward implementing verified AIG simplification algorithms that might further improve GL performance.Comment: In Proceedings ACL2 2013, arXiv:1304.712

Strengthening Model Checking Techniques with Inductive Invariants

This paper describes optimized techniques to efficiently compute and reap benefits from inductive invariants within SAT-based model checking. We address sequential circuit verification, and we consider both equivalences and implications between pairs of nodes in the logic networks. First, we present a very efficient dynamic procedure, based on equivalence classes and incremental SAT, specifically oriented to reduce the set of checked invariants. Then, we show how to effectively integrate the computation of inductive invariants within state-of-the-art SAT-based model checking procedures. Experiments (on more than 600 designs) show the robustness of our approach on verification instances on which stand-alone techniques fai