Fast MTF measurement of CMOS imagers at the chip level using ISO 12233 slanted-edge methodology

MTF measurement methods for imaging devices usually require the use of an optical system to project the image of the object onto the detector. So, MTF results quality strongly depends on the accuracy of the optical adjustments (alignments, focusing…). Dedicated edge patterns have been implemented at the chip level on a CMOS imager. One of them emulates the target used in the ISO 12233 slanted-edge technique and the others one are inspired by the knife-edge method. This allows to get the MTF data without optical focusing. In order to validate the results, comparisons have been made between MTF measurements using these patterns and results obtained through direct measurements with the transmissive slanted-edge target and sine target

Quantum Point Contacts and Coherent Electron Focusing

I. Introduction II. Electrons at the Fermi level III. Conductance quantization of a quantum point contact IV. Optical analogue of the conductance quantization V. Classical electron focusing VI. Electron focusing as a transmission problem VII. Coherent electron focusing (Experiment, Skipping orbits and magnetic edge states, Mode-interference and coherent electron focusing) VIII. Other mode-interference phenomenaComment: #3 of a series of 4 legacy reviews on QPC'

Imaging transverse electron focusing in semiconducting heterostructures with spin-orbit coupling

Transverse electron focusing in two-dimensional electron gases (2DEGs) with strong spin-orbit coupling is revisited. The transverse focusing is related to the transmission between two contacts at the edge of a 2DEG when a perpendicular magnetic field is applied. Scanning probe microscopy imaging techniques can be used to study the electron flow in these systems. Using numerical techniques we simulate the images that could be obtained in such experiments. We show that hybrid edge states can be imaged and that the outgoing flux can be polarized if the microscope tip probe is placed in specific positions.Comment: Contribution to the Book/Proceedings of the PITP Les Houches School on "Quantum Magnetism" held on June, 2006. Final forma