Increasing Flash Memory Lifetime by Dynamic Voltage Allocation for Constant Mutual Information

The read channel in Flash memory systems degrades over time because the Fowler-Nordheim tunneling used to apply charge to the floating gate eventually compromises the integrity of the cell because of tunnel oxide degradation. While degradation is commonly measured in the number of program/erase cycles experienced by a cell, the degradation is proportional to the number of electrons forced into the floating gate and later released by the erasing process. By managing the amount of charge written to the floating gate to maintain a constant read-channel mutual information, Flash lifetime can be extended. This paper proposes an overall system approach based on information theory to extend the lifetime of a flash memory device. Using the instantaneous storage capacity of a noisy flash memory channel, our approach allocates the read voltage of flash cell dynamically as it wears out gradually over time. A practical estimation of the instantaneous capacity is also proposed based on soft information via multiple reads of the memory cells.Comment: 5 pages. 5 figure

Dynamic Virtual Page-based Flash Translation Layer with Novel Hot Data Identification and Adaptive Parallelism Management

Solid-state disks (SSDs) tend to replace traditional motor-driven hard disks in high-end storage devices in past few decades. However, various inherent features, such as out-of-place update [resorting to garbage collection (GC)] and limited endurance (resorting to wear leveling), need to be reduced to a large extent before that day comes. Both the GC and wear leveling fundamentally depend on hot data identification (HDI). In this paper, we propose a hot data-aware flash translation layer architecture based on a dynamic virtual page (DVPFTL) so as to improve the performance and lifetime of NAND flash devices. First, we develop a generalized dual layer HDI (DL-HDI) framework, which is composed of a cold data pre-classifier and a hot data post-identifier. Those can efficiently follow the frequency and recency of information access. Then, we design an adaptive parallelism manager (APM) to assign the clustered data chunks to distinct resident blocks in the SSD so as to prolong its endurance. Finally, the experimental results from our realized SSD prototype indicate that the DVPFTL scheme has reliably improved the parallelizability and endurance of NAND flash devices with improved GC-costs, compared with related works.Peer reviewe

Self-Learning Hot Data Prediction: Where Echo State Network Meets NAND Flash Memories

© 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.Well understanding the access behavior of hot data is significant for NAND flash memory due to its crucial impact on the efficiency of garbage collection (GC) and wear leveling (WL), which respectively dominate the performance and life span of SSD. Generally, both GC and WL rely greatly on the recognition accuracy of hot data identification (HDI). However, in this paper, the first time we propose a novel concept of hot data prediction (HDP), where the conventional HDI becomes unnecessary. First, we develop a hybrid optimized echo state network (HOESN), where sufficiently unbiased and continuously shrunk output weights are learnt by a sparse regression based on L2 and L1/2 regularization. Second, quantum-behaved particle swarm optimization (QPSO) is employed to compute reservoir parameters (i.e., global scaling factor, reservoir size, scaling coefficient and sparsity degree) for further improving prediction accuracy and reliability. Third, in the test on a chaotic benchmark (Rossler), the HOESN performs better than those of six recent state-of-the-art methods. Finally, simulation results about six typical metrics tested on five real disk workloads and on-chip experiment outcomes verified from an actual SSD prototype indicate that our HOESN-based HDP can reliably promote the access performance and endurance of NAND flash memories.Peer reviewe

Dependability Assessment of NAND Flash-memory for Mission-critical Applications

It is a matter of fact that NAND flash memory devices are well established in consumer market. However, it is not true that the same architectures adopted in the consumer market are suitable for mission critical applications like space. In fact, USB flash drives, digital cameras, MP3 players are usually adopted to store "less significant" data which are not changing frequently (e.g., MP3s, pictures, etc.). Therefore, in spite of NAND flash's drawbacks, a modest complexity is usually needed in the logic of commercial flash drives. On the other hand, mission critical applications have different reliability requirements from commercial scenarios. Moreover, they are usually playing in a hostile environment (e.g., the space) which contributes to worsen all the issues. We aim at providing practical valuable guidelines, comparisons and tradeoffs among the huge number of dimensions of fault tolerant methodologies for NAND flash applied to critical environments. We hope that such guidelines will be useful for our ongoing research and for all the interested reader

Dependability Assessment of NAND Flash-memory for Mission-critical Applications

It is a matter of fact that NAND flash memory devices are well established in consumer market. However, it is not true that the same architectures adopted in the consumer market are suitable for mission critical applications like space. In fact, USB flash drives, digital cameras, MP3 players are usually adopted to store "less significant" data which are not changing frequently (e.g., MP3s, pictures, etc.). Therefore, in spite of NAND flash’s drawbacks, a modest complexity is usually needed in the logic of commercial flash drives. On the other hand, mission critical applications have different reliability requirements from commercial scenarios. Moreover, they are usually playing in a hostile environment (e.g., the space) which contributes to worsen all the issues. We aim at providing practical valuable guidelines, comparisons and tradeoffs among the huge number of dimensions of fault tolerant methodologies for NAND flash applied to critical environments. We hope that such guidelines will be useful for our ongoing research and for all the interested readers