1,064 research outputs found

    Capacity-Achieving Ensembles of Accumulate-Repeat-Accumulate Codes for the Erasure Channel with Bounded Complexity

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    The paper introduces ensembles of accumulate-repeat-accumulate (ARA) codes which asymptotically achieve capacity on the binary erasure channel (BEC) with {\em bounded complexity}, per information bit, of encoding and decoding. It also introduces symmetry properties which play a central role in the construction of capacity-achieving ensembles for the BEC with bounded complexity. The results here improve on the tradeoff between performance and complexity provided by previous constructions of capacity-achieving ensembles of codes defined on graphs. The superiority of ARA codes with moderate to large block length is exemplified by computer simulations which compare their performance with those of previously reported capacity-achieving ensembles of LDPC and IRA codes. The ARA codes also have the advantage of being systematic.Comment: Submitted to IEEE Trans. on Information Theory, December 1st, 2005. Includes 50 pages and 13 figure

    Array Convolutional Low-Density Parity-Check Codes

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    This paper presents a design technique for obtaining regular time-invariant low-density parity-check convolutional (RTI-LDPCC) codes with low complexity and good performance. We start from previous approaches which unwrap a low-density parity-check (LDPC) block code into an RTI-LDPCC code, and we obtain a new method to design RTI-LDPCC codes with better performance and shorter constraint length. Differently from previous techniques, we start the design from an array LDPC block code. We show that, for codes with high rate, a performance gain and a reduction in the constraint length are achieved with respect to previous proposals. Additionally, an increase in the minimum distance is observed.Comment: 4 pages, 2 figures, accepted for publication in IEEE Communications Letter

    RS + LDPC-Staircase Codes for the Erasure Channel: Standards, Usage and Performance

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    Application-Level Forward Erasure Correction (AL-FEC) codes are a key element of telecommunication systems. They are used to recover from packet losses when retransmission are not feasible and to optimize the large scale distribution of contents. In this paper we introduce Reed-Solomon/LDPCStaircase codes, two complementary AL-FEC codes that have recently been recognized as superior to Raptor codes in the context of the 3GPP-eMBMS call for technology [1]. After a brief introduction to the codes, we explain how to design high performance codecs which is a key aspect when targeting embedded systems with limited CPU/battery capacity. Finally we present the performances of these codes in terms of erasure correction capabilities and encoding/decoding speed, taking advantage of the 3GPP-eMBMS results where they have been ranked first

    Fault Secure Encoder and Decoder for NanoMemory Applications

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    Memory cells have been protected from soft errors for more than a decade; due to the increase in soft error rate in logic circuits, the encoder and decoder circuitry around the memory blocks have become susceptible to soft errors as well and must also be protected. We introduce a new approach to design fault-secure encoder and decoder circuitry for memory designs. The key novel contribution of this paper is identifying and defining a new class of error-correcting codes whose redundancy makes the design of fault-secure detectors (FSD) particularly simple. We further quantify the importance of protecting encoder and decoder circuitry against transient errors, illustrating a scenario where the system failure rate (FIT) is dominated by the failure rate of the encoder and decoder. We prove that Euclidean geometry low-density parity-check (EG-LDPC) codes have the fault-secure detector capability. Using some of the smaller EG-LDPC codes, we can tolerate bit or nanowire defect rates of 10% and fault rates of 10^(-18) upsets/device/cycle, achieving a FIT rate at or below one for the entire memory system and a memory density of 10^(11) bit/cm^2 with nanowire pitch of 10 nm for memory blocks of 10 Mb or larger. Larger EG-LDPC codes can achieve even higher reliability and lower area overhead
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