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2 research outputs found
Design for Testability That Reduces Linearity Testing Time of SAR ADCs
Author
Publication venue
'Institute of Electronics, Information and Communications Engineers (IEICE)'
Publication date
01/01/2011
Field of study
No full text
Crossref
MOSFETデバイスモデリングとサイクリックAD変換器の研究
Author
新井 薫子
Publication venue
群馬大学大学院理工学府
Publication date
01/03/2015
Field of study
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修士論
Gunma University Academic Information Repository