2 research outputs found

    Design/Process Learning from Electrical Test

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    Modern Design-For-Test (DFT) practices not only simplify test generation but also make it much easier to diagnose problems uncovered in electrical test. In fact, many diagnostics steps can be automated enough to enable batch processing of large quantities of fail data captured during production test. Hidden in these fail data is very valuable information about the product design, manufacturing process, and interactions between the two. The embedded tutorial will provide an overview of some of the analysis methods that are being used and/or prototyped in the industry, as well as the underlying data sharing between the design and manufacturing areas that is required for and enabled by the analyses
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