12 research outputs found

    Low power data converters for specific applications

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    Due to increasing importance of portable equipment and reduction of the supply voltage due to technology scaling, recent efforts in the design of mixed-signal circuits have focused on developing new techniques to reduce the power dissipation and supply voltage. This requires research into new architectures and circuit techniques that enable both integration and programmability. Programmability allows each component to be used for different applications, reducing the total number of components, and increased integration by eliminating external components will reduce cost and power;Since data converters are used in many different applications, in this thesis new low voltage and low power data converter techniques at both the architecture and circuit design levels are investigated to minimize power dissipation and supply voltage. To demonstrate the proposed techniques, test the performance of the proposed architectures, and verify their effectiveness in terms of power savings, five prototype chips are fabricated and tested;First, a re-configurable data converter (RDC) architecture is presented that can be programmed as analog-to-digital converter (ADC), digital-to-analog converter (DAC), or both. The reconfigurability of the RDC to different numbers of ADCs and DACs having different speeds and resolutions makes it an ideal choice for analog test bus, mixed-mode boundary scan, and built-in self test applications. It combines the advantages of both analog test buses and boundary scan techniques while the area overhead of the proposed techniques is very low compared to the mixed-mode boundary scan techniques. RDC can save power by allowing the designer to program it as the right converter for desired application. This architecture can be potentially implemented inside a field programmable gate array (FPGA) to allow the FPGA communicate with the analog world. It can also be used as a stand-alone product to give flexibility to the user to choose ADC/DAC combinations for the desired application;Next, a new method for designing low power and small area ROMless direct digital frequency synthesizers (DDFSs) is presented. In this method, a non-linear digital-to-analog converter is used to replace the phase-to-sine amplitude ROM look-up table and the linear DAC in conventional DDFS. Since the non-linear DAC converts the phase information directly into analog sine wave, no phase-to-amplitude ROM look-up table is required;Finally, a new low voltage technique based on biased inverting opamp that can have almost rail-to-rail swing with continuously valid output is discussed. Based on this biasing technique, a 10-bit segmented R-2R DAC and an 8-bit successive approximation ADC are designed and presented

    High-speed Analog-to-digital Converters For Modern Satellite Receivers: Design Verification Test And Sensitivity Analysis

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    Mixed-signal System-on-chip devices such as analog-to-digital converters (ADCs) have become increasingly prevalent in the semiconductor industry. Since the complexity and applications are different for each device, complex testing and characterization methods are required. Specifically, signal integrity in I/O interfaces requires that standard RF design and test techniques must be integrated into mixed signal processes. While such techniques may be difficult to implement, on-chip test-vehicles and RF circuitry offer the possibility of wireless approaches to chip testing. This would eliminate expensive wafer probing solution to verify the design of high-speed ADC functionality currently required for high-speed product evaluation. This thesis describes a new high-speed analog-to-digital converter test methodology. The target systems used on-chip digital de-multiplexing and clock distribution. A detail sequence of performance testing operations is presented. Digital outputs are post processed and fed into a computer-aided ADC performance characterization tool which is custom-developed in a MATLAB GUI. The problems of high sampling rate ADC testing are described. The test methodologies described reduce test costs and overcome many test hardware limitations. As our focus is on satellite receiver systems, we emphasize the measurement of inter-modulation distortion and effective resolution bandwidth. As a primary characterization component, Fourier analysis is used and we address the issue of sample window adjustment to eliminate spectral leakage and false spur generation. A 6-bit 800 MSamples/sec dual channel SiGe-based ADC is used as a target example and investigated on the corner lot process variations to determine the impact of process variations and the sensitivity of the ADCs to critical process parameter variations

    High speed data converter techniques

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    Moore's law not only applies to the semiconductor technology, it also applies to the Hard Disk Drive (HDD) system in the last 35 years. In order to meet the emerging demands of high performance computing application, HDD will continue to evolve in a very rapid pace. Very high speed analog-to-digital converters are demanded for Hard Disk Drive application.;FLASH architecture provides the highest speed using 2n-1 comparators to perform an n-bit conversion. In the extremes of speed, however, exotic technologies must still be used to achieve conversion rates beyond those obtained with a conventional silicon implementation. In this research, a four-way, time-interleaved flash ADC is demonstrated to achieve conversion speed up to 900MS/s using a 2.5v digital 0.25 micron bulk CMOS process. The maximum conversion rate practical with any technology is extended by the use of an array of well-matched flash ADCs. This technique trades off increased die area for increased speed in nearly one for one relationship but an reduced performance if the ADCs are not well matched in terms of gain, offset, nonlinearities and sampling skew. In the approach considered here, these problems are minimized by use of a simple method that ensures the individual ADC gain, offset and nonlinearities characteristics are inherently almost identical. A simple four phase clock generator is demonstrated which introduces only a small sampling skew. This scheme has been demonstrated in the comparatively simple 6-bit flash ADC case which achieved the highest acquisition speed of 900MS/s. Compared with the prior works, our work achieves higher SNDR at much higher analog input frequency at sampling frequency of 900MS/s. This same scheme may be applied to the first n-bits of a pipeline converter (or other converter method) enabling the same identical performance in the most significant bits.;In the second part of this dissertation, a new calibration principle with Voltage Controlled Resistors (VCR) for matched current sources is proposed. This technique can be used to produce multi copies of current units. Therefore, it is suitable for the calibration of high-resolution digital-to-analog converters that are based on equal current sources.</p

    Sub-session: Data converter techniques

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    Amplifier and data converter techniques for low power sensor interfaces

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    Thesis: Ph. D., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2016.Cataloged from PDF version of thesis.Includes bibliographical references (pages 151-157).Sensor interfaces circuits are integral components of wireless sensor nodes, and improvements to their energy-efficiency help enable long-term medical and industrial monitoring applications. This thesis explores both analog and algorithmic energy-saving techniques in the sensor interface signal chain. First, a data-dependent successive-approximation algorithm is developed and is demonstrated in a low-power analog-to-digital converter (ADC) implementation. When averaged over many samples, the energy per conversion and number of bitcycles per conversion used by this algorithm both scale logarithmically with the activity of the input signal, with each N-bit conversion using between 2 and 2N+1 bitcycles, compared to N for conventional binary SA. This algorithm reduces ADC power consumption when sampling signals with low mean activity, and its effectiveness is demonstrated on an electrocardiogram signal. With a 0.6V supply, the 10-bit ADC test chip has a maximum sample rate of 16 kHz and an effective number of bits (ENOB) of 9.73b. The ADC's Walden Figure of Merit (FoM) ranges from 3.5 to 20 fJ/conversion-step depending on the input signal activity. Second, an ultra-low supply voltage amplifier stage is developed and used to create an energy-efficient low-noise instrumentation amplifier (LNIA). This chopper LNIA uses a 0.2V-supply inverter-based input stage followed by a 0.8V-supply folded-cascode common-source stage. The high input-stage current needed to reduce the input-referred noise is drawn from the 0.2V supply, significantly reducing power consumption. The 0.8V stage provides high gain and signal swing, improving linearity. Biasing and common-mode rejection techniques for the 0.2V-stage are also presented. The analog front-end (AFE) test chip incorporating the chopper LNIA achieves a power-efficiency figure (PEF) of 1.6 with an input noise of 0.94 [mu]VRMS, integrated from 0.5 to 670 Hz. Human biopotential signals are measured using the AFE.by Frank M. Yaul.Ph. D
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