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1 research outputs found
Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment
Author
B. Li
B. Li
+28 more
Chatterjee
Chatterjee
Colinge
Ding
Dixit
F. Wan
H. Yin
Hughes
J. Luo
J. Wu
Jan
Jin
King
L. Yang
Li
Q. Zhang
Rafí
Rafí
Ribes
Song
Subramanian
Y. Huang
Y. Huang
Yang
Z. Han
Zhang
Zhao
Zhao
Publication venue
'Elsevier BV'
Publication date
Field of study
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