Combined Time and Information Redundancy for SEU-Tolerance in Energy-Efficient Real-Time Systems

Recently the trade-off between energy consumption and fault-tolerance in real-time systems has been highlighted. These works have focused on dynamic voltage scaling (DVS) to reduce dynamic energy dissipation and on time redundancy to achieve transient-fault tolerance. While the time redundancy technique exploits the available slack time to increase the fault-tolerance by performing recovery executions, DVS exploits slack time to save energy. Therefore we believe there is a resource conflict between the time-redundancy technique and DVS. The first aim of this paper is to propose the usage of information redundancy to solve this problem. We demonstrate through analytical and experimental studies that it is possible to achieve both higher transient fault-tolerance (tolerance to single event upsets (SEU)) and less energy using a combination of information and time redundancy when compared with using time redundancy alone. The second aim of this paper is to analyze the interplay of transient-fault tolerance (SEU-tolerance) and adaptive body biasing (ABB) used to reduce static leakage energy, which has not been addressed in previous studies. We show that the same technique (i.e. the combination of time and information redundancy) is applicable to ABB-enabled systems and provides more advantages than time redundancy alone

LOT: Logic Optimization with Testability - new transformations for logic synthesis

A new approach to optimize multilevel logic circuits is introduced. Given a multilevel circuit, the synthesis method optimizes its area while simultaneously enhancing its random pattern testability. The method is based on structural transformations at the gate level. New transformations involving EX-OR gates as well as Reed–Muller expansions have been introduced in the synthesis of multilevel circuits. This method is augmented with transformations that specifically enhance random-pattern testability while reducing the area. Testability enhancement is an integral part of our synthesis methodology. Experimental results show that the proposed methodology not only can achieve lower area than other similar tools, but that it achieves better testability compared to available testability enhancement tools such as tstfx. Specifically for ISCAS-85 benchmark circuits, it was observed that EX-OR gate-based transformations successfully contributed toward generating smaller circuits compared to other state-of-the-art logic optimization tools

VLSI Architecture and Design

Integrated circuit technology is rapidly approaching a state where feature sizes of one micron or less are tractable. Chip sizes are increasing slowly. These two developments result in considerably increased complexity in chip design. The physical characteristics of integrated circuit technology are also changing. The cost of communication will be dominating making new architectures and algorithms both feasible and desirable. A large number of processors on a single chip will be possible. The cost of communication will make designs enforcing locality superior to other types of designs. Scaling down feature sizes results in increase of the delay that wires introduce. The delay even of metal wires will become significant. Time tends to be a local property which will make the design of globally synchronous systems more difficult. Self-timed systems will eventually become a necessity. With the chip complexity measured in terms of logic devices increasing by more than an order of magnitude over the next few years the importance of efficient design methodologies and tools become crucial. Hierarchical and structured design are ways of dealing with the complexity of chip design. Structered design focuses on the information flow and enforces a high degree of regularity. Both hierarchical and structured design encourage the use of cell libraries. The geometry of the cells in such libraries should be parameterized so that for instance cells can adjust there size to neighboring cells and make the proper interconnection. Cells with this quality can be used as a basis for "Silicon Compilers"

Low-energy standby-sparing for hard real-time systems

Time-redundancy techniques are commonly used in real-time systems to achieve fault tolerance without incurring high energy overhead. However, reliability requirements of hard real-time systems that are used in safety-critical applications are so stringent that time-redundancy techniques are sometimes unable to achieve them. Standby sparing as a hardwareredundancy technique can be used to meet high reliability requirements of safety-critical applications. However, conventional standby-sparing techniques are not suitable for lowenergy hard real-time systems as they either impose considerable energy overheads or are not proper for hard timing constraints. In this paper we provide a technique to use standby sparing for hard real-time systems with limited energy budgets. The principal contribution of this work is an online energymanagement technique which is specifically developed for standby-sparing systems that are used in hard real-time applications. This technique operates at runtime and exploits dynamic slacks to reduce the energy consumption while guaranteeing hard deadlines. We compared the low-energy standby-sparing (LESS) system with a low-energy timeredundancy system (from a previous work). The results show that for relaxed time constraints, the LESS system is more reliable and provides about 26% energy saving as compared to the time-redundancy system. For tight deadlines when the timeredundancy system is not sufficiently reliable (for safety-critical application), the LESS system preserves its reliability but with about 49% more energy consumptio

Concepts for on-board satellite image registration. Volume 3: Impact of VLSI/VHSIC on satellite on-board signal processing

Anticipated major advances in integrated circuit technology in the near future are described as well as their impact on satellite onboard signal processing systems. Dramatic improvements in chip density, speed, power consumption, and system reliability are expected from very large scale integration. Improvements are expected from very large scale integration enable more intelligence to be placed on remote sensing platforms in space, meeting the goals of NASA's information adaptive system concept, a major component of the NASA End-to-End Data System program. A forecast of VLSI technological advances is presented, including a description of the Defense Department's very high speed integrated circuit program, a seven-year research and development effort

EDACs and test integration strategies for NAND flash memories

Mission-critical applications usually presents several critical issues: the required level of dependability of the whole mission always implies to address different and contrasting dimensions and to evaluate the tradeoffs among them. A mass-memory device is always needed in all mission-critical applications: NAND flash-memories could be used for this goal. Error Detection And Correction (EDAC) techniques are needed to improve dependability of flash-memory devices. However also testing strategies need to be explored in order to provide highly dependable systems. Integrating these two main aspects results in providing a fault-tolerant mass-memory device, but no systematic approach has so far been proposed to consider them as a whole. As a consequence a novel strategy integrating a particular code-based design environment with newly selected testing strategies is presented in this pape