Computer Simulation of Woven Fabric Defects Based on Faulty Yarn Photographs

In this work, the appearance of woven fabric defects due to yam faults has been simulated by a method developed which is based on photographs taken from yams along their lengths. Simulation of woven fabric is based on yarn and fabric cross sectional geometry as well as on yam measurements and images. The transformation of yarn from a straight circular cylinder to a flattened and crimped form in fabric structure is modelled mathematically and this is applied to obtain its projected image on the fabric surface by resizing the yam image on the photographic plane. The resized yam images thus obtained are, then, rearranged to simulate pixel based fabric surface appearance onto which images of faulty yarn sections are superposed. This is achieved by a suitable software developed, based on raster graphics. The faulty fabric simulations are confined to single fabrics of plain, matt and twill weaves with neps, slubs, thick and thin places