Can deep-sub-micron device noise be used as the basis for probabilistic neural computation?

This thesis explores the potential of probabilistic neural architectures for computation with future nanoscale Metal-Oxide-Semiconductor Field Effect Transistors (MOSFETs). In particular, the performance of a Continuous Restricted Boltzmann Machine {CRBM) implemented with generated noise of Random Telegraph Signal (RTS) and 1/ f form has been studied with reference to the 'typical' Gaussian implementation. In this study, a time domain RTS based noise analysis capability has been developed based upon future nanoscale MOSFETs, to represent the effect of nanoscale MOSFET noise on circuit implementation in particular the synaptic analogue multiplier which is subsequently used to implement stochastic behaviour of the CRBM. The result of this thesis indicates little degradation in performance from that of the typical Gaussian CRBM. Through simulation experiments, the CRBM with nanoscale MOSFET noise shows the ability to reconstruct training data, although it takes longer to converge to equilibrium. The results in this thesis do not prove that nanoscale MOSFET noise can be exploited in all contexts and with all data, for probabilistic computation. However, the result indicates, for the first time, that nanoscale MOSFET noise has the potential to be used for probabilistic neural computation hardware implementation. This thesis thus introduces a methodology for a form of technology-downstreaming and highlights the potential of probabilistic architecture for computation with future nanoscale MOSFETs

Fiabilisation de convertisseurs analogique-numérique à modulation Sigma-Delta

This thesis concentrates on reliability-aware methodology development, reliability analysis based on simulation as well as failure prediction of CMOS 65nm analog and mixed signal (AMS) ICs. Sigma-Delta modulators are concerned as the object of reliability study at system level. A hierarchical statistical approach for reliability is proposed to analysis the performance of Sigma-Delta modulators under ageing effects and process variations. Statistical methods are combined into this analysis flow.Ce travail de thèse a porté sur des problèmes de fiabilité de circuits intégrés en technologie CMOS 65 nm, en particulier sur la conception en vue de la fiabilité, la simulation et l'amélioration de la fiabilité. Les mécanismes dominants de vieillissement HCI et NBTI ainsi que la variation du processus ont été étudiés et évalués quantitativement au niveau du circuit et au niveau du système. Ces méthodes ont été appliquées aux modulateurs Sigma-Delta afin de déterminer la fiabilité de ce type de composant qui est très utilisé

Fiabilisation de Convertisseurs Analogique-Num´erique a Modulation Sigma-Delta

Due to the continuously scaling down of CMOS technology, system-on-chips (SoCs) reliability becomes important in sub-90 nm CMOS node. Integrated circuits and systems applied to aerospace, avionic, vehicle transport and biomedicine are highly sensitive to reliability problems such as ageing mechanisms and parametric process variations. Novel SoCs with new materials and architectures of high complexity further aggravate reliability as a critical aspect of process integration. For instance, random and systematic defects as well as parametric process variations have a large influence on quality and yield of the manufactured ICs, right after production. During ICs usage time, time-dependent ageing mechanisms such as negative bias temperature instability (NBTI) and hot carrier injection (HCI) can significantly degrade ICs performance.La fiabilit´e des ICs est d´efinie ainsi : la capacit´e d’un circuit ou un syst`eme int´egr´e `amaintenir ses param`etres durant une p´eriode donn´ee sous des conditions d´efinies. Les rapportsITRS 2011 consid`ere la fiabilit´e comme un aspect critique du processus d’int´egration.Par cons´equent, il faut faire appel des m´ethodologies innovatrices prenant en comptela fiabilit´e afin d’assurer la fonctionnalit´e du SoCs et la fiabilit´e dans les technologiesCMOS `a l’´echelle nanom´etrique. Cela nous permettra de d´evelopper des m´ethodologiesind´ependantes du design et de la technologie CMOS, en revanche, sp´ecialis´ees en fiabilit´e

High-speed Low-voltage CMOS Flash Analog-to-Digital Converter for Wideband Communication System-on-a-Chip

With higher-level integration driven by increasingly complex digital systems and downscaling CMOS processes available, system-on-a-chip (SoC) is an emerging technology of low power, high cost effectiveness and high reliability and is exceedingly attractive for applications in high-speed data conversion wireless and wideband communication systems. This research presents a novel ADC comparator design methodology; the speed and performance of which is not restricted by the supply voltage reduction and device linearity deterioration in scaling-down CMOS processes. By developing a dynamic offset suppression technique and a circuit optimization method, the comparator can achieve a 3 dB frequency of 2 GHz in 130 nanometer (nm) CMOS process. Combining this new comparator design and a proposed pipelined thermometer-Gray- binary encoder designed by the DCVSPG logic, a high-speed, low-voltage clocked-digital- comparator (CDC) pipelined CMOS flash ADC architecture is proposed for wideband communication SoC. This architecture has advantages of small silicon area, low power, and low cost. Three CDC-based pipelined CMOS flash ADCs were implemented in 130 nm CMOS process and their experimental results are reported: 1. 4-b, 2.5-GSPS ADC: SFDR of 21.48-dB, SNDR of 15.99-dB, ENOB of 2.4-b, ERBW of 1-GHz, power of 7.9-mW, and area of 0.022-mm2. 2. 4-b, 4-GSPS ADC: SFDR of 25-dB, SNDR of 18.6-dB, ENOB of 2.8-b, ERBW of 2-GHz, power of 11-mW. 3. 6-b, 4-GSPS ADC: SFDR of 48-dB at a signal frequency of 11.72-MHz, SNDR of 34.43-dB, ENOB of 5.4-b, power of 28-mW. An application of the proposed CDC-based pipelined CMOS flash ADC is 1-GHz bandwidth, 2.5-GSPS digital receiver on a chip. To verify the performance of the receiver, a mixed-signal block-level simulation and verification flow was built in Cadence AMS integrated platform. The verification results of the digital receiver using a 4-b 2.5-GSPS CDC-based pipelined CMOS ADC, a 256-point, 12-point kernel function FFT and a frequency detection logic show that two tone signals up to 1125 MHz can be detected and discriminated. A notable contribution of this research is that the proposed ADC architecture and the comparator design with dynamic offset suppression and optimization are extremely suitable for future VDSM CMOS processes and make all-digital receiver SoC design practical

A Framework for Noise Analysis and Verification of Analog Circuits

Analog circuit design and verification face significant challenges due to circuit complexity and short market windows. In particular, the influence of technology parameters on circuits, noise modeling and verification still remain a priority for many applications. Noise could be due to unwanted interaction between the various circuit blocks or it could be inherited from the circuit elements. Current industrial designs rely heavily on simulation techniques, but ensuring the correctness of such designs under all circumstances usually becomes impractically expensive. In this PhD thesis, we propose a methodology for modeling and verification of analog designs in the presence of noise and process variation using run-time verification methods. Verification based on run-time techniques employs logical or statistical monitors to check if an execution (simulation) of the design model violates the design specifications (properties). In order to study the random behavior of noise, we propose an approach based on modeling the designs using stochastic differential equations (SDE) in the time domain. Then, we define assertion and statistical verification methods in a MATLAB SDE simulation framework for monitoring properties of interest in order to detect errors. In order to overcome some of the drawbacks associated with monitoring techniques, we define a pattern matching based verification method for qualitative estimation of the simulation traces. We illustrate the efficiency of the proposed methods on different benchmark circuits

A Dual-Point technique for the entire ID-VG characterization into subthreshold region under Random Telegraph Noise condition

A simple Dual-Point technique to measure the entire transfer characteristics (ID-VG) down to sub-threshold region in the nano-scaled MOSFET under Random Telegraph Noise (RTN) condition with either capturing or emitting one elementary charge by a trap in the gate dielectric is proposed. Its compatibility with the commercial semiconductor analyzer makes it a readily-usable tool for future RTN study. In this work, we use this technique to explore the VG dependence of RTN induced by a single trapped carrier in both n- and p- FETs

Efficient verification/testing of system-on-chip through fault grading and analog behavioral modeling

textThis dissertation presents several cost-effective production test solutions using fault grading and mixed-signal design verification cases enabled by analog behavioral modeling. Although the latest System-on-Chip (SOC) is getting denser, faster, and more complex, the manufacturing technology is dominated by subtle defects that are introduced by small-scale technology. Thus, SOC requires more mature testing strategies. By performing various types of testing, better quality SoC can be manufactured, but test resources are too limited to accommodate all those tests. To create the most efficient production test flow, any redundant or ineffective tests need to be removed or minimized. Chapter 3 proposes new method of test data volume reduction by combining the nonlinear property of feedback shift register (FSR) and dictionary coding. Instead of using the nonlinear FSR for actual hardware implementation, the expanded test set by nonlinear expansion is used as the one-column test sets and provides big reduction ratio for the test data volume. The experimental results show the combined method reduced the total test data volume and increased the fault coverage. Due to the increased number of test patterns, total test time is increased. Chapter 4 addresses a whole process of functional fault grading. Fault grading has always been a ”desire-to-have” flow because it can bring up significant value for cost saving and yield analysis. However, it is very hard to perform the fault grading on the complex large scale SOC. A commercial tool called Z01X is used as a fault grading platform, and whole fault grading process is coordinated and each detailed execution is performed. Simulation- based functional fault grading identifies the quality of the given functional tests against the static faults and transition delay faults. With the structural tests and functional tests, functional fault grading can indicate the way to achieve the same test coverage by spending minimal test time. Compared to the consumed time and resource for fault grading, the contribution to the test time saving might not be acceptable as very promising, but the fault grading data can be reused for yield analysis and test flow optimization. For the final production testing, confident decisions on the functional test selection can be made based on the fault grading results. Chapter 5 addresses the challenges of Package-on-Package (POP) testing. Because POP devices have pins on both the top and the bottom of the package, the increased test pins require more test channels to detect packaging defects. Boundary scan chain testing is used to detect those continuity defects by relying on leakage current from the power supply. This proposed test scheme does not require direct test channels on the top pins. Based on the counting algorithm, minimal numbers of test cycles are generated, and the test achieved full test coverage for any combinations of pin-to-pin shortage defects on the top pins of the POP package. The experimental results show about 10 times increased leakage current from the shorted defect. Also, it can be expanded to multi-site testing with less test channels for high-volume production. Fault grading is applied within different structural test categories in Chapter 6. Stuck-at faults can be considered as TDFs having infinite delay. Hence, the TDF Automatic Test Pattern Generation (ATPG) tests can detect both TDFs and stuck-at faults. By removing the stuck-at faults being detected by the given TDF ATPG tests, the tests that target stuck-at faults can be reduced, and the reduced stuck-at fault set results in fewer stuck-at ATPG patterns. The structural test time is reduced while keeping the same test coverage. This TDF grading is performed with the same ATPG tool used to generate the stuck-at and TDF ATPG tests. To expedite the mixed-signal design verification of complex SoC, analog behavioral modeling methods and strategies are addressed in Chapter 7 and case studies for detailed verification with actual mixed-signal design are ad- dressed in Chapter 8. Analog modeling effort can enhance verification quality for a mixed-signal design with less turnaround time, and it enables compatible integration of the mixed-signal design cores into the SoC. The modeling process may reveal any potential design errors or incorrect testbench setup, and it results in minimizing unnecessary debugging time for quality devices. Two mixed-signal design cases were verified by me using the analog models. A fully hierarchical digital-to-analog converter (DAC) model is implemented and silicon mismatches caused by process variation are modeled and inserted into the DAC model, and the calibration algorithm for the DAC is successfully verified by model-based simulation at the full DAC-level. When the mismatch amount is increased and exceeded the calibration capability of the DAC, the simulation results show the increased calibration error with some outliers. This verification method can identify the saturation range of the DAC and predict the yield of the devices from process variation. A phase-locked loop (PLL) design cases were also verified by me using the analog model. Both open-loop PLL model and closed-loop PLL model cases are presented. Quick bring-up of open-loop PLL model provides low simulation overhead for widely-used PLLs in the SOC and enables early starting of design verification for the upper-level design using the PLL generated clocks. Accurate closed-loop PLL model is implemented for DCO-based PLL design, and the mixed-simulation with analog models and schematic designs enables flexible analog verification. Only focused analog design block is set to the schematic design and the rest of the analog design is replaced by the analog model. Then, this scaled-down SPICE simulation is performed about 10 times to 100 times faster than full-scale SPICE simulation. The analog model of the focused block is compared with the scaled-down SPICE simulation result and the quality of the model is iteratively enhanced. Hence, the analog model enables both compatible integration and flexible analog design verification. This dissertation contributes to reduce test time and to enhance test quality, and helps to set up efficient production testing flows. Depending on the size and performance of CUT, proper testing schemes can maximize the efficiency of production testing. The topics covered in this dissertation can be used in optimizing the test flow and selecting the final production tests to achieve maximum test capability. In addition, the strategies and benefits of analog behavioral modeling techniques that I implemented are presented, and actual verification cases shows the effectiveness of analog modeling for better quality SoC products.Electrical and Computer Engineerin

Novel Computing Paradigms using Oscillators

This dissertation is concerned with new ways of using oscillators to perform computational tasks. Specifically, it introduces methods for building finite state machines (for general-purpose Boolean computation) as well as Ising machines (for solving combinatorial optimization problems) using coupled oscillator networks.But firstly, why oscillators? Why use them for computation?An important reason is simply that oscillators are fascinating. Coupled oscillator systems often display intriguing synchronization phenomena where spontaneous patterns arise. From the synchronous flashing of fireflies to Huygens' clocks ticking in unison, from the molecular mechanism of circadian rhythms to the phase patterns in oscillatory neural circuits, the observation and study of synchronization in coupled oscillators has a long and rich history. Engineers across many disciplines have also taken inspiration from these phenomena, e.g., to design high-performance radio frequency communication circuits and optical lasers. To be able to contribute to the study of coupled oscillators and leverage them in novel paradigms of computing is without question an interesting andfulfilling quest in and of itself.Moreover, as Moore's Law nears its limits, new computing paradigms that are different from mere conventional complementary metal–oxide–semiconductor (CMOS) scaling have become an important area of exploration. One broad direction aims to improve CMOS performance using device technology such as fin field-effect transistors (FinFET) and gate-all-around (GAA) FETs. Other new computing schemes are based on non-CMOS material and device technology, e.g., graphene, carbon nanotubes, memristive devices, optical devices, etc.. Another growing trend in both academia and industry is to build digital application-specific integrated circuits (ASIC) suitable for speeding up certain computational tasks, often leveraging the parallel nature of unconventional non-von Neumann architectures. These schemes seek to circumvent the limitations posed at the device level through innovations at the system/architecture level.Our work on oscillator-based computation represents a direction that is different from the above and features several points of novelty and attractiveness. Firstly, it makes meaningful use of nonlinear dynamical phenomena to tackle well-defined computational tasks that span analog and digital domains. It also differs from conventional computational systems at the fundamental logic encoding level, using timing/phase of oscillation as opposed to voltage levels to represent logic values. These differences bring about several advantages. The change of logic encoding scheme has several device- and system-level benefits related to noise immunity and interference resistance. The use of nonlinear oscillator dynamics allows our systems to address problems difficult for conventional digital computation. Furthermore, our schemes are amenable to realizations using almost all types of oscillators, allowing a wide variety of devices from multiple physical domains to serve as the substrate for computing. This ability to leverage emerging multiphysics devices need not put off the realization of our ideas far into the future. Instead, implementations using well-established circuit technology are already both practical and attractive.This work also differs from all past work on oscillator-based computing, which mostly focuses on specialized image preprocessing tasks, such as edge detection, image segmentation and pattern recognition. Perhaps its most unique feature is that our systems use transitions between analog and digital modes of operation --- unlike other existing schemes that simply couple oscillators and let their phases settle to a continuum of values, we use a special type of injection locking to make each oscillator settle to one of the several well-defined multistable phase-locked states, which we use to encode logic values for computation. Our schemes of oscillator-based Boolean and Ising computation are built upon this digitization of phase; they expand the scope of oscillator-based computing significantly.Our ideas are built on years of past research in the modelling, simulation and analysis of oscillators. While there is a considerable amount of literature (arguably since Christiaan Huygens wrote about his observation of synchronized pendulum clocks in the 17th century) analyzing the synchronization phenomenon from different perspectives at different levels, we have been able to further develop the theory of injection locking, connecting the dots to find a path of analysis that starts from the low-level differential equations of individual oscillators and arrives at phase-based models and energy landscapes of coupled oscillator systems. This theoretical scaffolding is able not only to explain the operation of oscillator-based systems, but also to serve as the basis for simulation and design tools. Building on this, we explore the practical design of our proposed systems, demonstrate working prototypes, as well as develop the techniques, tools and methodologies essential for the process