AI/ML Algorithms and Applications in VLSI Design and Technology

An evident challenge ahead for the integrated circuit (IC) industry in the nanometer regime is the investigation and development of methods that can reduce the design complexity ensuing from growing process variations and curtail the turnaround time of chip manufacturing. Conventional methodologies employed for such tasks are largely manual; thus, time-consuming and resource-intensive. In contrast, the unique learning strategies of artificial intelligence (AI) provide numerous exciting automated approaches for handling complex and data-intensive tasks in very-large-scale integration (VLSI) design and testing. Employing AI and machine learning (ML) algorithms in VLSI design and manufacturing reduces the time and effort for understanding and processing the data within and across different abstraction levels via automated learning algorithms. It, in turn, improves the IC yield and reduces the manufacturing turnaround time. This paper thoroughly reviews the AI/ML automated approaches introduced in the past towards VLSI design and manufacturing. Moreover, we discuss the scope of AI/ML applications in the future at various abstraction levels to revolutionize the field of VLSI design, aiming for high-speed, highly intelligent, and efficient implementations

Reliability and Security of Compute-In-Memory Based Deep Neural Network Accelerators

Compute-In-Memory (CIM) is a promising solution for accelerating DNNs at edge devices, utilizing mixed-signal computations. However, it requires more cross-layer designs from algorithm levels to hardware implementations as it behaves differently from the pure digital system. On one side, the mixed-signal computations of CIM face unignorable variations, which could hamper the software performance. On the other side, there are potential software/hardware security vulnerabilities with CIM accelerators. This research aims to solve the reliability and security issues in CIM design for accelerating Deep Neural Network (DNN) algorithms as they prevent the real-life use of the CIM-based accelerators. Some non-ideal effects in CIM accelerators are explored, which could cause reliability issues, and solved by the software-hardware co-design methods. In addition, different security vulnerabilities for SRAM-based CIM and eNVM-based CIM inference engines are defined, and corresponding countermeasures are proposed.Ph.D

Area-Efficient Transposable 6T SRAM for Fast Online Learning in Neuromorphic Processors

1