Layout optimization in ultra deep submicron VLSI design

As fabrication technology keeps advancing, many deep submicron (DSM) effects have become increasingly evident and can no longer be ignored in Very Large Scale Integration (VLSI) design. In this dissertation, we study several deep submicron problems (eg. coupling capacitance, antenna effect and delay variation) and propose optimization techniques to mitigate these DSM effects in the place-and-route stage of VLSI physical design. The place-and-route stage of physical design can be further divided into several steps: (1) Placement, (2) Global routing, (3) Layer assignment, (4) Track assignment, and (5) Detailed routing. Among them, layer/track assignment assigns major trunks of wire segments to specific layers/tracks in order to guide the underlying detailed router. In this dissertation, we have proposed techniques to handle coupling capacitance at the layer/track assignment stage, antenna effect at the layer assignment, and delay variation at the ECO (Engineering Change Order) placement stage, respectively. More specifically, at layer assignment, we have proposed an improved probabilistic model to quickly estimate the amount of coupling capacitance for timing optimization. Antenna effects are also handled at layer assignment through a linear-time tree partitioning algorithm. At the track assignment stage, timing is further optimized using a graph based technique. In addition, we have proposed a novel gate splitting methodology to reduce delay variation in the ECO placement considering spatial correlations. Experimental results on benchmark circuits showed the effectiveness of our approaches

Electrical Design for Manufacturability Solutions: Fast Systematic Variation Analysis and Design Enhancement Techniques

The primary objectives in this research are to develop computer-aided design (CAD) tools for Design for Manufacturability (DFM) solutions that enable designers to conduct more rapid and more accurate systematic variation analysis, with different design enhancement techniques. Four main CAD tools are developed throughout my thesis. The first CAD tool facilitates a quantitative study of the impact of systematic variations for different circuits' electrical and geometrical behavior. This is accomplished by automatically performing an extensive analysis of different process variations (lithography and stress) and their dependency on the design context. Such a tool helps to explore and evaluate the systematic variation impact on any type of design. Secondly, solutions in the industry focus on the "design and then fix philosophy", or "fix during design philosophy", whereas the next CAD tool involves the "fix before design philosophy". Here, the standard cell library is characterized in different design contexts, different resolution enhancement techniques, and different process conditions, generating a fully DFM-aware standard cell library using a newly developed methodology that dramatically reduce the required number of silicon simulations. Several experiments are conducted on 65nm and 45nm designs, and demonstrate more robust and manufacturable designs that can be implemented by using the DFM-aware standard cell library. Thirdly, a novel electrical-aware hotspot detection solution is developed by using a device parameter-based matching technique since the state-of-the-art hotspot detection solutions are all geometrical based. This CAD tool proposes a new philosophy by detecting yield limiters, also known as hotspots, through the model parameters of the device, presented in the SPICE netlist. This novel hotspot detection methodology is tested and delivers extraordinary fast and accurate results. Finally, the existing DFM solutions, mainly address the digital designs. Process variations play an increasingly important role in the success of analog circuits. Knowledge of the parameter variances and their contribution patterns is crucial for a successful design process. This information is valuable to find solutions for many problems in design, design automation, testing, and fault tolerance. The fourth CAD solution, proposed in this thesis, introduces a variability-aware DFM solution that detects, analyze, and automatically correct hotspots for analog circuits

Timing optimization during the physical synthesis of cell-based VLSI circuits

Tese (doutorado) - Universidade Federal de Santa Catarina, Centro Tecnológico, Programa de Pós-Graduação em Engenharia de Automação e Sistemas, Florianópolis, 2016.Abstract : The evolution of CMOS technology made possible integrated circuits with billions of transistors assembled into a single silicon chip, giving rise to the jargon Very-Large-Scale Integration (VLSI). The required clock frequency affects the performance of a VLSI circuit and induces timing constraints that must be properly handled by synthesis tools. During the physical synthesis of VLSI circuits, several optimization techniques are used to iteratively reduce the number of timing violations until the target clock frequency is met. The dramatic increase of interconnect delay under technology scaling represents one of the major challenges for the timing closure of modern VLSI circuits. In this scenario, effective interconnect synthesis techniques play a major role. That is why this thesis targets two timing optimization problems for effective interconnect synthesis: Incremental Timing-Driven Placement (ITDP) and Incremental Timing-Driven Layer Assignment (ITLA). For solving the ITDP problem, this thesis proposes a new Lagrangian Relaxation formulation that minimizes timing violations for both setup and hold timing constraints. This work also proposes a netbased technique that uses Lagrange multipliers as net-weights, which are dynamically updated using an accurate timing analyzer. The netbased technique makes use of a novel discrete search to relocate cells by employing the Euclidean distance to define a proper neighborhood. For solving the ITLA problem, this thesis proposes a network flow approach that handles simultaneously critical and non-critical segments, and exploits a few flow conservation conditions to extract timing information for each net segment individually, thereby enabling the use of an external timing engine. The experimental validation using benchmark suites derived from industrial circuits demonstrates the effectiveness of the proposed techniques when compared with state-of-the-art works.A evolução da tecnologia CMOS viabilizou a fabricação de circuitos integrados contendo bilhões de transistores em uma única pastilha de silício, dando origem ao jargão Very-Large-Scale Integration (VLSI). A frequência-alvo de operação de um circuito VLSI afeta o seu desempenho e induz restrições de timing que devem ser manipuladas pelas ferramentas de síntese. Durante a síntese física de circuitos VLSI, diversas técnicas de otimização são usadas para iterativamente reduzir o número de violações de timing até que a frequência-alvo de operação seja atingida. O aumento dramático do atraso das interconexões devido à evolução tecnológica representa um dos maiores desafios para o fluxo de timing closure de circuitos VLSI contemporâneos. Nesse cenário, técnicas de síntese de interconexão eficientes têm um papel fundamental. Por este motivo, esta tese aborda dois problemas de otimização de timing para uma síntese eficiente das interconexões de um circuito VLSI: Incremental Timing-Driven Placement (ITDP) e Incremental Timing-Driven Layer Assignment (ITLA). Para resolver o problema de ITDP, esta tese propõe uma nova formulação utilizando Relaxação Lagrangeana que tem por objetivo a minimização simultânea das violações de timing para restrições do tipo setup e hold. Este trabalho também propõe uma técnica que utiliza multiplicadores de Lagrange como pesos para as interconexões, os quais são atualizados dinamicamente através dos resultados de uma ferramenta de análise de timing. Tal técnica realoca as células do circuito por meio de uma nova busca discreta que adota a distância Euclidiana como vizinhança.Para resolver o problema de ITLA, esta tese propõe uma abordagem em fluxo em redes que otimiza simultaneamente segmentos críticos e não-críticos, e explora algumas condições de fluxo para extrair as informações de timing para cada segmento individualmente, permitindo assim o uso de uma ferramenta de timing externa. A validação experimental, utilizando benchmarks derivados de circuitos industriais, demonstra a eficiência das técnicas propostas quando comparadas com trabalhos estado da arte