4,031 research outputs found

    Bayesian Optimization Approach for Analog Circuit Synthesis Using Neural Network

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    Bayesian optimization with Gaussian process as surrogate model has been successfully applied to analog circuit synthesis. In the traditional Gaussian process regression model, the kernel functions are defined explicitly. The computational complexity of training is O(N 3 ), and the computation complexity of prediction is O(N 2 ), where N is the number of training data. Gaussian process model can also be derived from a weight space view, where the original data are mapped to feature space, and the kernel function is defined as the inner product of nonlinear features. In this paper, we propose a Bayesian optimization approach for analog circuit synthesis using neural network. We use deep neural network to extract good feature representations, and then define Gaussian process using the extracted features. Model averaging method is applied to improve the quality of uncertainty prediction. Compared to Gaussian process model with explicitly defined kernel functions, the neural-network-based Gaussian process model can automatically learn a kernel function from data, which makes it possible to provide more accurate predictions and thus accelerate the follow-up optimization procedure. Also, the neural-network-based model has O(N) training time and constant prediction time. The efficiency of the proposed method has been verified by two real-world analog circuits

    A Review of Bayesian Methods in Electronic Design Automation

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    The utilization of Bayesian methods has been widely acknowledged as a viable solution for tackling various challenges in electronic integrated circuit (IC) design under stochastic process variation, including circuit performance modeling, yield/failure rate estimation, and circuit optimization. As the post-Moore era brings about new technologies (such as silicon photonics and quantum circuits), many of the associated issues there are similar to those encountered in electronic IC design and can be addressed using Bayesian methods. Motivated by this observation, we present a comprehensive review of Bayesian methods in electronic design automation (EDA). By doing so, we hope to equip researchers and designers with the ability to apply Bayesian methods in solving stochastic problems in electronic circuits and beyond.Comment: 24 pages, a draft version. We welcome comments and feedback, which can be sent to [email protected]

    Tensor Computation: A New Framework for High-Dimensional Problems in EDA

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    Many critical EDA problems suffer from the curse of dimensionality, i.e. the very fast-scaling computational burden produced by large number of parameters and/or unknown variables. This phenomenon may be caused by multiple spatial or temporal factors (e.g. 3-D field solvers discretizations and multi-rate circuit simulation), nonlinearity of devices and circuits, large number of design or optimization parameters (e.g. full-chip routing/placement and circuit sizing), or extensive process variations (e.g. variability/reliability analysis and design for manufacturability). The computational challenges generated by such high dimensional problems are generally hard to handle efficiently with traditional EDA core algorithms that are based on matrix and vector computation. This paper presents "tensor computation" as an alternative general framework for the development of efficient EDA algorithms and tools. A tensor is a high-dimensional generalization of a matrix and a vector, and is a natural choice for both storing and solving efficiently high-dimensional EDA problems. This paper gives a basic tutorial on tensors, demonstrates some recent examples of EDA applications (e.g., nonlinear circuit modeling and high-dimensional uncertainty quantification), and suggests further open EDA problems where the use of tensor computation could be of advantage.Comment: 14 figures. Accepted by IEEE Trans. CAD of Integrated Circuits and System

    Post-Layout Simulation Driven Analog Circuit Sizing

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    Post-layout simulation provides accurate guidance for analog circuit design, but post-layout performance is hard to be directly optimized at early design stages. Prior work on analog circuit sizing often utilizes pre-layout simulation results as the optimization objective. In this work, we propose a post-layout-simulation-driven (post-simulation-driven for short) analog circuit sizing framework that directly optimizes the post-layout simulation performance. The framework integrates automated layout generation into the optimization loop of transistor sizing and leverages a coupled Bayesian optimization algorithm to search for the best post-simulation performance. Experimental results demonstrate that our framework can achieve over 20% better post-layout performance in competitive time than manual design and the method that only considers pre-layout optimization

    Practical Layout-Aware Analog/Mixed-Signal Design Automation with Bayesian Neural Networks

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    The high simulation cost has been a bottleneck of practical analog/mixed-signal design automation. Many learning-based algorithms require thousands of simulated data points, which is impractical for expensive to simulate circuits. We propose a learning-based algorithm that can be trained using a small amount of data and, therefore, scalable to tasks with expensive simulations. Our efficient algorithm solves the post-layout performance optimization problem where simulations are known to be expensive. Our comprehensive study also solves the schematic-level sizing problem. For efficient optimization, we utilize Bayesian Neural Networks as a regression model to approximate circuit performance. For layout-aware optimization, we handle the problem as a multi-fidelity optimization problem and improve efficiency by exploiting the correlations from cheaper evaluations. We present three test cases to demonstrate the efficiency of our algorithms. Our tests prove that the proposed approach is more efficient than conventional baselines and state-of-the-art algorithms.Comment: Accepted to the 42nd International Conference on Computer-Aided Design (ICCAD 2023); 8 pages, 8 figure
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