Adaptive Median Binary Patterns for Texture Classification

Abstract-This paper addresses the challenging problem of recognition and classification of textured surfaces under illumination variation, geometric transformations and noisy sensor measurements. We propose a new texture operator, Adaptive Median Binary Patterns (AMBP) that extends our previous Median Binary Patterns (MBP) texture feature. The principal idea of AMBP is to hash small local image patches into a binary pattern texton by fusing MBP and Local Binary Patterns (LBP) operators combined with using self-adaptive analysis window sizes to better capture invariant microstructure information while providing robustness to noise. The AMBP scheme is shown to be an effective mechanism for non-parametric learning of spatially varying image texture statistics. The local distribution of rotation invariant and uniform binary pattern subsets extended with more global joint information are used as the descriptors for robust texture classification. The AMBP is shown to outperform recent binary pattern and filtering-based texture analysis methods on two large texture corpora (CUReT and KTH TIPS2-b) with and without additive noise. The AMBP method is slightly superior to the best techniques in the noiseless case but significantly outperforms other methods in the presence of impulse noise

Joint Adaptive Median Binary Patterns for texture classification

a b s t r a c t This paper addresses the challenging problem of the recognition and classification of textured surfaces given a single instance acquired under unknown pose, scale and illumination conditions. We propose a novel texture descriptor, the Adaptive Median Binary Pattern (AMBP) based on an adaptive analysis window of local patterns. The principal idea of the AMBP is to convert a small local image patch to a binary pattern using adaptive threshold selection that switches between the central pixel value as used in the Local Binary Pattern (LBP) and the median as in Median Binary Pattern (MBP), but within a variable sized analysis window depending on the local microstructure of the texture. The variability of the local adaptive window is included as joint information to increase the discriminative properties. A new multiscale scheme is also proposed in this paper to handle the texture resolution problem. AMBP is evaluated in relation to other recent binary pattern techniques and many other texture analysis methods on three large texture corpora with and without noise added, CUReT, Outex_TC00012 and KTH_TIPS2. Generally, the proposed method performs better than the best state-of-the-art techniques in the noiseless case and significantly outperforms all of them in the presence of impulse noise

Robust Adaptive Median Binary Pattern for noisy texture classification and retrieval

Texture is an important cue for different computer vision tasks and applications. Local Binary Pattern (LBP) is considered one of the best yet efficient texture descriptors. However, LBP has some notable limitations, mostly the sensitivity to noise. In this paper, we address these criteria by introducing a novel texture descriptor, Robust Adaptive Median Binary Pattern (RAMBP). RAMBP based on classification process of noisy pixels, adaptive analysis window, scale analysis and image regions median comparison. The proposed method handles images with high noisy textures, and increases the discriminative properties by capturing microstructure and macrostructure texture information. The proposed method has been evaluated on popular texture datasets for classification and retrieval tasks, and under different high noise conditions. Without any train or prior knowledge of noise type, RAMBP achieved the best classification compared to state-of-the-art techniques. It scored more than $90\%$ under $50\%$ impulse noise densities, more than $95\%$ under Gaussian noised textures with standard deviation $\sigma = 5$, and more than $99\%$ under Gaussian blurred textures with standard deviation $\sigma = 1.25$. The proposed method yielded competitive results and high performance as one of the best descriptors in noise-free texture classification. Furthermore, RAMBP showed also high performance for the problem of noisy texture retrieval providing high scores of recall and precision measures for textures with high levels of noise

Scale Selective Extended Local Binary Pattern for Texture Classification

In this paper, we propose a new texture descriptor, scale selective extended local binary pattern (SSELBP), to characterize texture images with scale variations. We first utilize multi-scale extended local binary patterns (ELBP) with rotation-invariant and uniform mappings to capture robust local micro- and macro-features. Then, we build a scale space using Gaussian filters and calculate the histogram of multi-scale ELBPs for the image at each scale. Finally, we select the maximum values from the corresponding bins of multi-scale ELBP histograms at different scales as scale-invariant features. A comprehensive evaluation on public texture databases (KTH-TIPS and UMD) shows that the proposed SSELBP has high accuracy comparable to state-of-the-art texture descriptors on gray-scale-, rotation-, and scale-invariant texture classification but uses only one-third of the feature dimension.Comment: IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP), 201

Surface Defect Classification for Hot-Rolled Steel Strips by Selectively Dominant Local Binary Patterns

Developments in defect descriptors and computer vision-based algorithms for automatic optical inspection (AOI) allows for further development in image-based measurements. Defect classification is a vital part of an optical-imaging-based surface quality measuring instrument. The high-speed production rhythm of hot continuous rolling requires an ultra-rapid response to every component as well as algorithms in AOI instrument. In this paper, a simple, fast, yet robust texture descriptor, namely selectively dominant local binary patterns (SDLBPs), is proposed for defect classification. First, an intelligent searching algorithm with a quantitative thresholding mechanism is built to excavate the dominant non-uniform patterns (DNUPs). Second, two convertible schemes of pattern code mapping are developed for binary encoding of all uniform patterns and DNUPs. Third, feature extraction is carried out under SDLBP framework. Finally, an adaptive region weighting method is built for further strengthening the original nearest neighbor classifier in the feature matching stage. The extensive experiments carried out on an open texture database (Outex) and an actual surface defect database (Dragon) indicates that our proposed SDLBP yields promising performance on both classification accuracy and time efficiencyPeer reviewe