DeepTopPush: Simple and Scalable Method for Accuracy at the Top

Accuracy at the top is a special class of binary classification problems where the performance is evaluated only on a small number of relevant (top) samples. Applications include information retrieval systems or processes with manual (expensive) postprocessing. This leads to the minimization of irrelevant samples above a threshold. We consider classifiers in the form of an arbitrary (deep) network and propose a new method DeepTopPush for minimizing the top loss function. Since the threshold depends on all samples, the problem is non-decomposable. We modify the stochastic gradient descent to handle the non-decomposability in an end-to-end training manner and propose a way to estimate the threshold only from values on the current minibatch. We demonstrate the good performance of DeepTopPush on visual recognition datasets and on a real-world application of selecting a small number of molecules for further drug testing

Top Rank Optimization in Linear Time

Bipartite ranking aims to learn a real-valued ranking function that orders positive instances before negative instances. Recent efforts of bipartite ranking are focused on optimizing ranking accuracy at the top of the ranked list. Most existing approaches are either to optimize task specific metrics or to extend the ranking loss by emphasizing more on the error associated with the top ranked instances, leading to a high computational cost that is super-linear in the number of training instances. We propose a highly efficient approach, titled TopPush, for optimizing accuracy at the top that has computational complexity linear in the number of training instances. We present a novel analysis that bounds the generalization error for the top ranked instances for the proposed approach. Empirical study shows that the proposed approach is highly competitive to the state-of-the-art approaches and is 10-100 times faster

Amortising the Cost of Mutation Based Fault Localisation using Statistical Inference

Mutation analysis can effectively capture the dependency between source code and test results. This has been exploited by Mutation Based Fault Localisation (MBFL) techniques. However, MBFL techniques suffer from the need to expend the high cost of mutation analysis after the observation of failures, which may present a challenge for its practical adoption. We introduce SIMFL (Statistical Inference for Mutation-based Fault Localisation), an MBFL technique that allows users to perform the mutation analysis in advance against an earlier version of the system. SIMFL uses mutants as artificial faults and aims to learn the failure patterns among test cases against different locations of mutations. Once a failure is observed, SIMFL requires either almost no or very small additional cost for analysis, depending on the used inference model. An empirical evaluation of SIMFL using 355 faults in Defects4J shows that SIMFL can successfully localise up to 103 faults at the top, and 152 faults within the top five, on par with state-of-the-art alternatives. The cost of mutation analysis can be further reduced by mutation sampling: SIMFL retains over 80% of its localisation accuracy at the top rank when using only 10% of generated mutants, compared to results obtained without sampling

Nonlinear classifiers for ranking problems based on kernelized SVM

Many classification problems focus on maximizing the performance only on the samples with the highest relevance instead of all samples. As an example, we can mention ranking problems, accuracy at the top or search engines where only the top few queries matter. In our previous work, we derived a general framework including several classes of these linear classification problems. In this paper, we extend the framework to nonlinear classifiers. Utilizing a similarity to SVM, we dualize the problems, add kernels and propose a componentwise dual ascent method. This allows us to perform one iteration in less than 20 milliseconds on relatively large datasets such as FashionMNIST

A Batch Learning Framework for Scalable Personalized Ranking

In designing personalized ranking algorithms, it is desirable to encourage a high precision at the top of the ranked list. Existing methods either seek a smooth convex surrogate for a non-smooth ranking metric or directly modify updating procedures to encourage top accuracy. In this work we point out that these methods do not scale well to a large-scale setting, and this is partly due to the inaccurate pointwise or pairwise rank estimation. We propose a new framework for personalized ranking. It uses batch-based rank estimators and smooth rank-sensitive loss functions. This new batch learning framework leads to more stable and accurate rank approximations compared to previous work. Moreover, it enables explicit use of parallel computation to speed up training. We conduct empirical evaluation on three item recommendation tasks. Our method shows consistent accuracy improvements over state-of-the-art methods. Additionally, we observe time efficiency advantages when data scale increases.Comment: AAAI 2018, Feb 2-7, New Orleans, US