A Simulation Methodology for Reliability Analysis in Multi-Core SoCs

Reliability has become a significant challenge for system design in new process technologies. Higher integration levels dramatically increase power densities, which leads to higher temperature and adverse effects on reliability. In this paper, we introduce a simulation methodology to analyze reliability of multi-core SoCs. The proposed simulator is the first to provide system-on-chip level fine-grained reliability analysis. We use our simulation methodology to study the reliability effects of design choices such as thermal packaging and placement, as well as runtime events such as power management policies and workload distributions

Register File Reliability Analysis Through Cycle-Accurate Thermal Emulation

Continuous transistor scaling due to improvements in CMOS devices and manufacturing technologies is increasing processor power densities and temperatures; thus, creating challenges when trying to maintain manufacturing yield rates and devices which will be reliable throughout their lifetime. New microarchitectures require new reliability-aware design methods that can face these challenges without significantly increasing cost and performance. In this paper we present a complete analysis of reliability for the register file architecture of the Leon 3 processor. The analysis conducted is supported by the use of an accurate HW/SW FPGA-based emulation platform that enables a complete design space exploration of thermal and reliability metrics during the execution of an extended set of benchmarks, in a very limited amount of time. The effect of various compiler optimizations and register assignments on the reliability of the register file is then analyzed. Our results quantify the respective effects of these different factors and enable us to design a reliability-aware register file assignment policy that consistently improves the Mean-Time-To-Failure figure (20% on average) for the various types of applications

Market-Based Resourse Management for Many-Core Systems

101 σ.Αντικείμενο της διπλωματικής αποτελεί η μελέτη και η ανάπτυξη μιας κλιμακώσιμης και κατανεμημένης πλατφόρμας (framework) διαχείρισης πόρων σε χρόνο εκτέλεσης για συστήματα πολλαπλών πυρήνων. Σε αυτήν την πλατφόρμα η διαχείριση πόρων είναι βασισμένη σε μοντέλα, τα οποία είναι εμπνευσμένα από την οικονομία. Παρουσιάζεται ένας διαχειριστής πόρων, ο οποίος προσφέρει ένα περιβάλλον διαχείρισης πόρων και εφαρμογών καθ ́ όλη τη διάρκεια ζωής τους, στο οποίο η κατανομή και δρομολόγηση των εφαρμογών στους πόρους πραγματοποιείται με αλγόριθμους βασισμένους σε κανόνες αγοράς. Η αποδοτικότητα κάθε μοντέλου αξιολογείται βάσει της πτώσης της αξιοπιστίας των πόρων (μετρική MTTF-Mean Time To Failure).The purpose of this diploma thesis is the design and development of a scalable and distributed run-time resource management framework for Many-core systems. In this framework, resource management is based on economy-inspired models. The presented resource management framework offers an environment that manages both application tasks and resources at run-time, matches and distributes application tasks across resources with algorithms which are based on market principles. The efficiency of each model is evaluated with respect to resource reliability degradation (metric MTTF-Mean Time to Failure).Θεμιστοκλής Γ. Μελισσάρη

Estimation à haut-niveau des dégradations temporelles dans les processeurs (méthodologie et mise en oeuvre logicielle)

Actuellement, les circuits numériques nécessitent d'être de plus en plus performants. Aussi, les produits doivent être conçus le plus rapidement possible afin de gagner les précieuses parts de marché. Les méthodes rapides de conception et l'utilisation de MPSoC ont permis de satisfaire à ces exigences, mais sans tenir compte précisément de l'impact du vieillissement des circuits sur la conception. Or les MPSoC utilisent les technologies de fabrication les plus récentes et sont de plus en plus soumis aux défaillances matérielles. De nos jours, les principaux mécanismes de défaillance observés dans les transistors des MPSoC sont le HCI et le NBTI. Des marges sont alors ajoutées pour que le circuit soit fonctionnel pendant son utilisation, en considérant le cas le plus défavorable pour chaque mécanisme. Ces marges deviennent de plus en plus importantes et diminuent les performances attendues. C'est pourquoi les futures méthodes de conception nécessitent de tenir compte des dégradations matérielles en fonction de l utilisation du circuit. Dans cette thèse, nous proposons une méthode originale pour simuler le vieillissement des MPSoC à haut niveau d'abstraction. Cette méthode s'applique lors de la conception du système c.-à-d. entre l'étape de définition des spécifications et la mise en production. Un modèle empirique permet d'estimer les dégradations temporelles en fin de vie d'un circuit. Un exemple d'application est donné pour un processeur embarqué et les résultats pour un ensemble d'applications sont reportés. La solution proposée permet d'explorer différentes configurations d'une architecture MPSoC pour comparer le vieillissement. Aussi, l'application la plus sévère pour le vieillissement peut être identifiée.Nowadays, more and more performance is expected from digital circuits. What s more, the market requires fast conception methods, in order to propose the newest technology available. Fast conception methods and the utilization of MPSoC have enabled high performance and short time-to-market while taking little attention to aging. However, MPSoC are more and more prone to hardware failures that occur in transistors. Today, the prevailing failure mechanisms in MPSoC are HCI and NBTI. Margins are usually added on new products to avoid failures during execution, by considering worst case scenario for each mechanism. For the newest technology, margins are becoming more and more important and products performance is getting lower and lower. That s why the conception needs to take into account hardware failures according to the execution of software. This thesis propose a new methodology to simulate aging at high level of abstraction, which can be applied to MPSoC. The method can be applied during product conception, between the specification phase and the production. An empirical model is used to estimate slack time at circuit's end of life. A use case is conducted on an embedded processor and degradation results are reported for a set of applications. The solution enables architecture exploration and MPSoC aging can thus be compared. The software with most severe impact on aging can also be determined.BORDEAUX1-Bib.electronique (335229901) / SudocSudocFranceF