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1 research outputs found
A test method for analog circuits : using sensitivity analysis and the singular value decomposition
Author
Spaandonk van, J.
Publication venue
Technische Universiteit Eindhoven
Publication date
01/01/1996
Field of study
Get PDF
XVII+C.3hlm.;24c
Repository TU/e
Pure OAI Repository
uilis.unsyiah.ac.id