Energy-Efficient and Reliable Computing in Dark Silicon Era

Dark silicon denotes the phenomenon that, due to thermal and power constraints, the fraction of transistors that can operate at full frequency is decreasing in each technology generation. Moore’s law and Dennard scaling had been backed and coupled appropriately for five decades to bring commensurate exponential performance via single core and later muti-core design. However, recalculating Dennard scaling for recent small technology sizes shows that current ongoing multi-core growth is demanding exponential thermal design power to achieve linear performance increase. This process hits a power wall where raises the amount of dark or dim silicon on future multi/many-core chips more and more. Furthermore, from another perspective, by increasing the number of transistors on the area of a single chip and susceptibility to internal defects alongside aging phenomena, which also is exacerbated by high chip thermal density, monitoring and managing the chip reliability before and after its activation is becoming a necessity. The proposed approaches and experimental investigations in this thesis focus on two main tracks: 1) power awareness and 2) reliability awareness in dark silicon era, where later these two tracks will combine together. In the first track, the main goal is to increase the level of returns in terms of main important features in chip design, such as performance and throughput, while maximum power limit is honored. In fact, we show that by managing the power while having dark silicon, all the traditional benefits that could be achieved by proceeding in Moore’s law can be also achieved in the dark silicon era, however, with a lower amount. Via the track of reliability awareness in dark silicon era, we show that dark silicon can be considered as an opportunity to be exploited for different instances of benefits, namely life-time increase and online testing. We discuss how dark silicon can be exploited to guarantee the system lifetime to be above a certain target value and, furthermore, how dark silicon can be exploited to apply low cost non-intrusive online testing on the cores. After the demonstration of power and reliability awareness while having dark silicon, two approaches will be discussed as the case study where the power and reliability awareness are combined together. The first approach demonstrates how chip reliability can be used as a supplementary metric for power-reliability management. While the second approach provides a trade-off between workload performance and system reliability by simultaneously honoring the given power budget and target reliability

Adaptive Knobs for Resource Efficient Computing

Performance demands of emerging domains such as artificial intelligence, machine learning and vision, Internet-of-things etc., continue to grow. Meeting such requirements on modern multi/many core systems with higher power densities, fixed power and energy budgets, and thermal constraints exacerbates the run-time management challenge. This leaves an open problem on extracting the required performance within the power and energy limits, while also ensuring thermal safety. Existing architectural solutions including asymmetric and heterogeneous cores and custom acceleration improve performance-per-watt in specific design time and static scenarios. However, satisfying applications’ performance requirements under dynamic and unknown workload scenarios subject to varying system dynamics of power, temperature and energy requires intelligent run-time management. Adaptive strategies are necessary for maximizing resource efficiency, considering i) diverse requirements and characteristics of concurrent applications, ii) dynamic workload variation, iii) core-level heterogeneity and iv) power, thermal and energy constraints. This dissertation proposes such adaptive techniques for efficient run-time resource management to maximize performance within fixed budgets under unknown and dynamic workload scenarios. Resource management strategies proposed in this dissertation comprehensively consider application and workload characteristics and variable effect of power actuation on performance for pro-active and appropriate allocation decisions. Specific contributions include i) run-time mapping approach to improve power budgets for higher throughput, ii) thermal aware performance boosting for efficient utilization of power budget and higher performance, iii) approximation as a run-time knob exploiting accuracy performance trade-offs for maximizing performance under power caps at minimal loss of accuracy and iv) co-ordinated approximation for heterogeneous systems through joint actuation of dynamic approximation and power knobs for performance guarantees with minimal power consumption. The approaches presented in this dissertation focus on adapting existing mapping techniques, performance boosting strategies, software and dynamic approximations to meet the performance requirements, simultaneously considering system constraints. The proposed strategies are compared against relevant state-of-the-art run-time management frameworks to qualitatively evaluate their efficacy

A survey of system level power management schemes in the dark-silicon era for many-core architectures

Power consumption in Complementary Metal Oxide Semiconductor (CMOS) technology has escalated to a point that only a fractional part of many-core chips can be powered-on at a time. Fortunately, this fraction can be increased at the expense of performance through the dark-silicon solution. However, with many-core integration set to be heading towards its thousands, power consumption and temperature increases per time, meaning the number of active nodes must be reduced drastically. Therefore, optimized techniques are demanded for continuous advancement in technology. Existing efforts try to overcome this challenge by activating nodes from different parts of the chip at the expense of communication latency. Other efforts on the other hand employ run-time power management techniques to manage the power performance of the cores trading-off performance for power. We found out that, for a significant amount of power to saved and high temperature to be avoided, focus should be on reducing the power consumption of all the on-chip components. Especially, the memory hierarchy and the interconnect. Power consumption can be minimized by, reducing the size of high leakage power dissipating elements, turning-off idle resources and integrating power saving materials

Runtime resource management for lifetime extension in multi-core systems

The availability of numerous, possibly heterogeneous, processing resources in multi-core systems allows one to exploit them to optimize performance and/or power/energy consumption. In particular, strategies have been defined to map and schedule tasks on the system resources, with the aim of optimizing the adopted figure of merit, at design time, if the working context is known in advance and relatively stable, at run time when facing changing/unpredictable working conditions. However, it is important to be aware that such strategies may have an impact on the overall lifetime of the system because of aging and wear-out mechanisms. Therefore such management strategies, generally adopted for handling performance and power consumption aspects, should be enhanced in order to consider such issues. Furthermore, specific Dynamic Reliability Management (DRM) policies have been devised to deal with lifetime issues in multi-core systems, acting mainly on the workload distribution (and eventually on architectural knobs, such as voltage/frequency scaling) to mitigate the stress caused by the running applications. Here we will focus on DRM strategies, whose goal is pursuing the improvement of lifetime reliability by means of load distribution policies that identify the resource where to map a new application entering the system, or where to periodically migrate tasks to balance stress. More precisely, a selection of state-of-the-art solutions will be presented and analysed, with respect to the achieved expected lifetime, evaluated when considering the first failure as well as the sequence of failures leading to the system being unable to fulfill the user's performance of service requirements

Run-time Resource Management in CMPs Handling Multiple Aging Mechanisms

Abstract—Run-time resource management is fundamental for efficient execution of workloads on Chip Multiprocessors. Application- and system-level requirements (e.g. on performance vs. power vs. lifetime reliability) are generally conflicting each other, and any decision on resource assignment, such as core allocation or frequency tuning, may positively affect some of them while penalizing some others. Resource assignment decisions can be perceived in few instants of time on performance and power consumption, but not on lifetime reliability. In fact, this latter changes very slowly based on the accumulation of effects of various decisions over a long time horizon. Moreover, aging mechanisms are various and have different causes; most of them, such as Electromigration (EM), are subject to temperature levels, while Thermal Cycling (TC) is caused mainly by temperature variations (both amplitude and frequency). Mitigating only EM may negatively affect TC and vice versa. We propose a resource orchestration strategy to balance the performance and power consumption constraints in the short-term and EM and TC aging in the long-term. Experimental results show that the proposed approach improves the average Mean Time To Failure at least by 17% and 20% w.r.t. EM and TC, respectively, while providing same performance level of the nominal counterpart and guaranteeing the power budget

An Ageing-Aware and Temperature Mapping Algorithm For Multi-Level Cache Nodes

Increase in chip inactivity in the future threatens the performance of many-core systems and therefore, efficient techniques are required for continuous scaling of transistors. As of a result of this challenge, future proposed many-core system designs must consider the possibility of a 50% functioning chip per time as well maintaining performance. Fortunately, this 50% inactivity can be increased by managing the temperature of active nodes and the placement of the dark nodes to leverage a balance working chip whilst considering the lifetime of nodes. However, allocating dark nodes inefficiently can increase the temperature of the chip and increase the waiting time of applications. Consequently, due to stochastic application characteristics, a dynamic rescheduling technique is more desirable compared to fixed design mapping. In this paper, we propose an Ageing Before Temperature Electromigration-Aware, Negative Bias Temperature Instability (NBTI) & Time-dependent Dielectric Breakdown (TDDB) Neighbour Allocation (ABENA 2.0), a dynamic rescheduling management system which considers the ageing and temperature before mapping applications. ABENA also considers the location of active and dark nodes and migrate task based on the characteristics of the nodes. Our proposed algorithm employ Dynamic Voltage Frequency Scaling (DVFS) to reduce the Voltage and Frequency (VF) of the nodes. Results show that, our proposed methods improve the ageing of nodes compared to a conventional round-robin management system by 10% in temperature, and 10% agein

A Survey of Fault-Tolerance Techniques for Embedded Systems from the Perspective of Power, Energy, and Thermal Issues

The relentless technology scaling has provided a significant increase in processor performance, but on the other hand, it has led to adverse impacts on system reliability. In particular, technology scaling increases the processor susceptibility to radiation-induced transient faults. Moreover, technology scaling with the discontinuation of Dennard scaling increases the power densities, thereby temperatures, on the chip. High temperature, in turn, accelerates transistor aging mechanisms, which may ultimately lead to permanent faults on the chip. To assure a reliable system operation, despite these potential reliability concerns, fault-tolerance techniques have emerged. Specifically, fault-tolerance techniques employ some kind of redundancies to satisfy specific reliability requirements. However, the integration of fault-tolerance techniques into real-time embedded systems complicates preserving timing constraints. As a remedy, many task mapping/scheduling policies have been proposed to consider the integration of fault-tolerance techniques and enforce both timing and reliability guarantees for real-time embedded systems. More advanced techniques aim additionally at minimizing power and energy while at the same time satisfying timing and reliability constraints. Recently, some scheduling techniques have started to tackle a new challenge, which is the temperature increase induced by employing fault-tolerance techniques. These emerging techniques aim at satisfying temperature constraints besides timing and reliability constraints. This paper provides an in-depth survey of the emerging research efforts that exploit fault-tolerance techniques while considering timing, power/energy, and temperature from the real-time embedded systems’ design perspective. In particular, the task mapping/scheduling policies for fault-tolerance real-time embedded systems are reviewed and classified according to their considered goals and constraints. Moreover, the employed fault-tolerance techniques, application models, and hardware models are considered as additional dimensions of the presented classification. Lastly, this survey gives deep insights into the main achievements and shortcomings of the existing approaches and highlights the most promising ones

Thermal Management for Dependable On-Chip Systems

This thesis addresses the dependability issues in on-chip systems from a thermal perspective. This includes an explanation and analysis of models to show the relationship between dependability and tempature. Additionally, multiple novel methods for on-chip thermal management are introduced aiming to optimize thermal properties. Analysis of the methods is done through simulation and through infrared thermal camera measurements