A self-timed multipurpose delay sensor for field programmable gate arrays (FPGAs)

This paper presents a novel self-timed multi-purpose sensor especially conceived for Field Programmable Gate Arrays (FPGAs). The aim of the sensor is to measure performance variations during the life-cycle of the device, such as process variability, critical path timing and temperature variations. The proposed topology, through the use of both combinational and sequential FPGA elements, amplifies the time of a signal traversing a delay chain to produce a pulse whose width is the sensor’s measurement. The sensor is fully self-timed, avoiding the need for clock distribution networks and eliminating the limitations imposed by the system clock. One single off- or on-chip time-to-digital converter is able to perform digitization of several sensors in a single operation. These features allow for a simplified approach for designers wanting to intertwine a multi-purpose sensor network with their application logic. Employed as a temperature sensor, it has been measured to have an error of ±0.67 °C, over the range of 20–100 °C, employing 20 logic elements with a 2-point calibration

FPGA Architecture Optimization Using Geometric Programming

Volume 4 No 13 of the periodical Progression. Published November, February, May and August by The Radiant Healing Centre. SPCL PER BT 732 P76 V.1,1932-V.5,193

A Detailed Delay Path Model for FPGAs

Abstract—A complete circuit-level description of a representative FPGA is presented in this paper, from which a simple RC delay model as a function of architectural and technology parameters is derived. Using this model, the expression for the optimal delay of any path through the FPGA can be formulated. We distill our model into being purely architecture dependent, and use it to capture new insight into how FPGA parameters can directly affect its delay. Several applications of this model are: (1) to gain better intuition of how architecture and process parameters affect the delay path in an FPGA, (2) for initial studies into new circuit designs and integrated circuit technologies, (3) in CAD tools for optimisation and sensitivity analysis. The technique described can be applied to arbitrary circuits, and simulations show that our closed form equations give delay values that are accurate to approximately 10 % when compared to HSPICE simulation. I