Generation of Software Test Data from the Design Specification Using Heuristic Techniques. Exploring the UML State Machine Diagrams and GA Based Heuristic Techniques in the Automated Generation of Software Test Data and Test Code.

Software testing is a tedious and very expensive undertaking. Automatic test data generation is, therefore, proposed in this research to help testers reduce their work as well as ascertain software quality. The concept of test driven development (TDD) has become increasingly popular during the past several years. According to TDD, test data should be prepared before the beginning of code implementation. Therefore, this research asserts that the test data should be generated from the software design documents which are normally created prior to software code implementation. Among such design documents, the UML state machine diagrams are selected as a platform for the proposed automated test data generation mechanism. Such diagrams are selected because they show behaviours of a single object in the system. The genetic algorithm (GA) based approach has been developed and applied in the process of searching for the right amount of quality test data. Finally, the generated test data have been used together with UML class diagrams for JUnit test code generation. The GA-based test data generation methods have been enhanced to take care of parallel path and loop problems of the UML state machines. In addition the proposed GA-based approach is also targeted to solve the diagrams with parameterised triggers. As a result, the proposed framework generates test data from the basic state machine diagram and the basic class diagram without any additional nonstandard information, while most other approaches require additional information or the generation of test data from other formal languages. The transition coverage values for the introduced approach here are also high; therefore, the generated test data can cover most of the behaviour of the system.EU Asia-Link project TH/Asia Link/004(91712) East-West and CAM

A Parallel Algorithm for Approximating the Minimum Cycle Cover

We address the problem of approximating a minimum cycle cover in parallel. We give the first efficient parallel algorithm for finding an approximation to a minimum cycle cover. Our algorithm finds a cycle cover whose size is within a factor of O(1 + n log n m+n ) of the minimum sized cover using O(log² n) time on (m + n)= log n processors