4 research outputs found

    A Fault Analytic Method against HB+

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    The search for lightweight authentication protocols suitable for low-cost RFID tags constitutes an active and challenging research area. In this context, a family of protocols based on the LPN problem has been proposed: the so-called HB-family. Despite the rich literature regarding the cryptanalysis of these protocols, there are no published results about the impact of fault analysis over them. The purpose of this paper is to fill this gap by presenting a fault analytic method against a prominent member of the HB-family: HB+ protocol. We demonstrate that the fault analysis model can lead to a flexible and effective attack against HB-like protocols, posing a serious threat over them

    The Fault Attack Jungle - A Classification Model to Guide You

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    Analysis and Design of Clock-glitch Fault Injection within an FPGA

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    In modern cryptanalysis, an active attacker may induce errors during the computation of a cryptographic algorithm and exploit the faulty results to extract information about the secret key in embedded systems. This kind of attack is called a fault attack. There have been various attack mechanisms with diff erent fault models proposed in the literature. Among them, clock glitch faults support practically dangerous fault attacks on cryptosystems. This thesis presents an FPGA-based practical testbed for characterizing exploitable clock glitch faults and uniformly evaluating cryptographic systems against them. Concentrating on Advanced Encryption Standard (AES), simulation and experimental results illustrates proper features for the clock glitches generated by the implemented on-chip glitch generator. These glitches can be injected reliably with acceptably accurate timing. The produced faults are random but their eff ect domain is finely controllable by the attacker. These features makes clock glitch faults practically suitable for future possible complete fault attacks on AES. This research is important for investigating the viability and analysis of fault injections on various cryptographic functions in future embedded systems
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