CORE
🇺🇦Â
 make metadata, not war
Services
Services overview
Explore all CORE services
Access to raw data
API
Dataset
FastSync
Content discovery
Recommender
Discovery
OAI identifiers
OAI Resolver
Managing content
Dashboard
Bespoke contracts
Consultancy services
Support us
Support us
Membership
Sponsorship
Community governance
Advisory Board
Board of supporters
Research network
About
About us
Our mission
Team
Blog
FAQs
Contact us
Filters
2 research outputs found
Variation Analysis, Fault Modeling and Yield Improvement of Emerging Spintronic Memories
Author
Mohanachandran Nair Sarath
Publication venue
KIT-Bibliothek, Karlsruhe
Publication date
01/01/2020
Field of study
Get PDF
KITopen
A Comprehensive Framework for Parametric Failure Modeling and Yield Analysis of STT-MRAM
Author
Mehdi B. Tahoori
Rajendra Bishnoi
Sarath Mohanachandran Nair
Publication venue
'Institute of Electrical and Electronics Engineers (IEEE)'
Publication date
Field of study
No full text
Crossref
Get PDF
No full text
