1 research outputs found
A built-in self-test scheme for differential ring oscillators
In this paper a new Built-In Self-Test (BIST) scheme is proposed
suitable for testing differential voltage controlled ring oscillators.
The proposed testing-scheme is capable of detecting single realistic
faults of the circuit under test. These faults can be either short or
bridging faults between circuit nodes or open faults at the circuit
branches. The test result is provided by a digital Fail/Pass indication
signal. Exhaustive simulations have revealed the effectiveness of the
proposed technique regarding its fault coverage