Design Techniques for High-Performance SAR A/D Converters

The design of electronics needs to account for the non-ideal characteristics of the device technologies used to realize practical circuits. This is particularly important in mixed analog-digital design since the best device technologies are very different for digital compared to analog circuits. One solution for this problem is to use a calibration correction approach to remove the errors introduced by devices, but this adds complexity and power dissipation, as well as reducing operation speed, and so must be optimised. This thesis addresses such an approach to improve the performance of certain types of analog-to-digital converter (ADC) used in advanced telecommunications, where speed, accuracy and power dissipation currently limit applications. The thesis specifically focuses on the design of compensation circuits for use in successive approximation register (SAR) ADCs. ADCs are crucial building blocks in communication systems, in general, and for mobile networks, in particular. The recently launched fifth generation of mobile networks (5G) has required new ADC circuit techniques to meet the higher speed and lower power dissipation requirements for 5G technology. The SAR has become one of the most favoured architectures for designing high-performance ADCs, but the successive nature of the circuit operation makes it difficult to reach ∼GS/s sampling rates at reasonable power consumption. Here, two calibration techniques for high-performance SAR ADCs are presented. The first uses an on-chip stochastic-based mismatch calibration technique that is able to accurately compute and compensate for the mismatch of a capacitive DAC in a SAR ADC. The stochastic nature of the proposed calibration method enables determination of the mismatch of the CAPDAC with a resolution much better than that of the DAC. This allows the unit capacitor to scale down to as low as 280aF for a 9-bit DAC. Since the CAP-DAC causes a large part of the overall dynamic power consumption and directly determines both the sizes of the driving and sampling switches and the size of the input capacitive load of the ADC and the kT/C noise power, a small CAP-DAC helps the power efficiency. To validate the proposed calibration idea, a 10-bit asynchronous SAR ADC was fabricated in 28-nm CMOS. Measurement results show that the proposed stochastic calibration improves the ADC’s SFDR and SNDR by 14.9 dB, 11.5 dB, respectively. After calibration, the fabricated SAR ADC achieves an ENOB of 9.14 bit at a sampling rate of 85 MS/s, resulting in a Walden FoM of 10.9 fJ/c-s. The second calibration technique is a timing-skew calibration for a time-interleaved (TI) SAR ADC that calibrates/computes the inter-channel timing and offset mismatch simultaneously. Simulation results show the effectiveness of this calibration method. When used together, the proposed mismatch calibration technique and the timing-skew calibration technique enables a TI SAR ADC to be designed that can achieve a sampling rate of ∼GS/s with 10-bit resolution and a power consumption as low as ∼10mW; specifications that satisfy the requirements of 5G technology

Digital Background Self-Calibration Technique for Compensating Transition Offsets in Reference-less Flash ADCs

This Dissertation focusses on proving that background calibration using adaptive algorithms are low-cost, stable and effective methods for obtaining high accuracy in flash A/D converters. An integrated reference-less 3-bit flash ADC circuit has been successfully designed and taped out in UMC 180 nm CMOS technology in order to prove the efficiency of our proposed background calibration. References for ADC transitions have been virtually implemented built-in in the comparators dynamic-latch topology by a controlled mismatch added to each comparator input front-end. An external very simple DAC block (calibration bank) allows control the quantity of mismatch added in each comparator front-end and, therefore, compensate the offset of its effective transition with respect to the nominal value. In order to assist to the estimation of the offset of the prototype comparators, an auxiliary A/D converter with higher resolution and lower conversion speed than the flash ADC is used: a 6-bit capacitive-DAC SAR type. Special care in synchronization of analogue sampling instant in both ADCs has been taken into account. In this thesis, a criterion to identify the optimum parameters of the flash ADC design with adaptive background calibration has been set. With this criterion, the best choice for dynamic latch architecture, calibration bank resolution and flash ADC resolution are selected. The performance of the calibration algorithm have been tested, providing great programmability to the digital processor that implements the algorithm, allowing to choose the algorithm limits, accuracy and quantization errors in the arithmetic. Further, systematic controlled offset can be forced in the comparators of the flash ADC in order to have a more exhaustive test of calibration

An Open-Loop Amplifier Multi-Bit Sigma Delta Modulator

A new multi-bit quantizer for sigma delta modulators is proposed. The multi-bit quantizer has multiple single-bit quantizers, and the output of one of the single-bit quantizers is fed back to the input of another single-bit quantizer via a filter. Multi-bit quantization is achieved by averaging the outputs of the single-bit quantizers. Because of this architecture, the multi-bit quantizer realizes multi-bit quantization without external signals such as dithering signals that are needed in conventional architectures. The multi-bit quantizer allows for designing a new open-loop amplifier multi-bit sigma delta modulator. The open-loop amplifier multi-bit sigma delta modulator uses differential pairs for its loop filter instead of closed-loop amplifiers that consume considerable power for high frequency applications. The open-loop amplifier multi-bit sigma delta modulator is designed with a 90nm CMOS process. The achievable SNDR is 43dB with the bandwidth of 80MHz when noises other than quantization noises are not taken into consideration. The sampling frequency is 2.56GHz, and the power consumption of main analog parts is 15mA

Energy-efficient analog-to-digital conversion for ultra-wideband radio

Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2007.Includes bibliographical references (p. 207-222).In energy constrained signal processing and communication systems, a focus on the analog or digital circuits in isolation cannot achieve the minimum power consumption. Furthermore, in advanced technologies with significant variation, yield is traditionally achieved only through conservative design and a sacrifice of energy efficiency. In this thesis, these limitations are addressed with both a comprehensive mixed-signal design methodology and new circuits and architectures, as presented in the context of an analog-to-digital converter (ADC) for ultra-wideband (UWB) radio. UWB is an emerging technology capable of high-data-rate wireless communication and precise locationing, and it requires high-speed (>500MS/s), low-resolution ADCs. The successive approximation register (SAR) topology exhibits significantly reduced complexity compared to the traditional flash architecture. Three time-interleaved SAR ADCs have been implemented. At the mixed-signal optimum energy point, parallelism and reduced voltage supplies provide more than 3x energy savings. Custom control logic, a new capacitive DAC, and a hierarchical sampling network enable the high-speed operation. Finally, only a small amount of redundancy, with negligible power penalty, dramatically improves the yield of the highly parallel ADC in deep sub-micron CMOS.by Brian P. Ginsburg.Ph.D

High Performance RF and Basdband Analog-to-Digital Interface for Multi-standard/Wideband Applications

The prevalence of wireless standards and the introduction of dynamic standards/applications, such as software-defined radio, necessitate the next generation wireless devices that integrate multiple standards in a single chip-set to support a variety of services. To reduce the cost and area of such multi-standard handheld devices, reconfigurability is desirable, and the hardware should be shared/reused as much as possible. This research proposes several novel circuit topologies that can meet various specifications with minimum cost, which are suited for multi-standard applications. This doctoral study has two separate contributions: 1. The low noise amplifier (LNA) for the RF front-end; and 2. The analog-to-digital converter (ADC). The first part of this dissertation focuses on LNA noise reduction and linearization techniques where two novel LNAs are designed, taped out, and measured. The first LNA, implemented in TSMC (Taiwan Semiconductor Manufacturing Company) 0.35Cm CMOS (Complementary metal-oxide-semiconductor) process, strategically combined an inductor connected at the gate of the cascode transistor and the capacitive cross-coupling to reduce the noise and nonlinearity contributions of the cascode transistors. The proposed technique reduces LNA NF by 0.35 dB at 2.2 GHz and increases its IIP3 and voltage gain by 2.35 dBm and 2dB respectively, without a compromise on power consumption. The second LNA, implemented in UMC (United Microelectronics Corporation) 0.13Cm CMOS process, features a practical linearization technique for high-frequency wideband applications using an active nonlinear resistor, which obtains a robust linearity improvement over process and temperature variations. The proposed linearization method is experimentally demonstrated to improve the IIP3 by 3.5 to 9 dB over a 2.5–10 GHz frequency range. A comparison of measurement results with the prior published state-of-art Ultra-Wideband (UWB) LNAs shows that the proposed linearized UWB LNA achieves excellent linearity with much less power than previously published works. The second part of this dissertation developed a reconfigurable ADC for multistandard receiver and video processors. Typical ADCs are power optimized for only one operating speed, while a reconfigurable ADC can scale its power at different speeds, enabling minimal power consumption over a broad range of sampling rates. A novel ADC architecture is proposed for programming the sampling rate with constant biasing current and single clock. The ADC was designed and fabricated using UMC 90nm CMOS process and featured good power scalability and simplified system design. The programmable speed range covers all the video formats and most of the wireless communication standards, while achieving comparable Figure-of-Merit with customized ADCs at each performance node. Since bias current is kept constant, the reconfigurable ADC is more robust and reliable than the previous published works

An Open-Loop Amplifier Multi-Bit Sigma Delta Modulator

A new multi-bit quantizer for sigma delta modulators is proposed. The multi-bit quantizer has multiple single-bit quantizers, and the output of one of the single-bit quantizers is fed back to the input of another single-bit quantizer via a filter. Multi-bit quantization is achieved by averaging the outputs of the single-bit quantizers. Because of this architecture, the multi-bit quantizer realizes multi-bit quantization without external signals such as dithering signals that are needed in conventional architectures. The multi-bit quantizer allows for designing a new open-loop amplifier multi-bit sigma delta modulator. The open-loop amplifier multi-bit sigma delta modulator uses differential pairs for its loop filter instead of closed-loop amplifiers that consume considerable power for high frequency applications. The open-loop amplifier multi-bit sigma delta modulator is designed with a 90nm CMOS process. The achievable SNDR is 43dB with the bandwidth of 80MHz when noises other than quantization noises are not taken into consideration. The sampling frequency is 2.56GHz, and the power consumption of main analog parts is 15mA

High-Bandwidth Voltage-Controlled Oscillator based architectures for Analog-to-Digital Conversion

The purpose of this thesis is the proposal and implementation of data conversion open-loop architectures based on voltage-controlled oscillators (VCOs) built with ring oscillators (RO-based ADCs), suitable for highly digital designs, scalable to the newest complementary metal-oxide-semiconductor (CMOS) nodes. The scaling of the design technologies into the nanometer range imposes the reduction of the supply voltage towards small and power-efficient architectures, leading to lower voltage overhead of the transistors. Additionally, phenomena like a lower intrinsic gain, inherent noise, and parasitic effects (mismatch between devices and PVT variations) make the design of classic structures for ADCs more challenging. In recent years, time-encoded A/D conversion has gained relevant popularity due to the possibility of being implemented with mostly digital structures. Within this trend, VCOs designed with ring oscillator based topologies have emerged as promising candidates for the conception of new digitization techniques. RO-based data converters show excellent scalability and sensitivity, apart from some other desirable properties, such as inherent quantization noise shaping and implicit anti-aliasing filtering. However, their nonlinearity and the limited time delay achievable in a simple NOT gate drastically limits the resolution of the converter, especially if we focus on wide-band A/D conversion. This thesis proposes new ways to alleviate these issues. Firstly, circuit-based techniques to compensate for the nonlinearity of the ring oscillator are proposed and compared to equivalent state-of-the-art solutions. The proposals are designed and simulated in a 65-nm CMOS node for open-loop RO-based ADC architectures. One of the techniques is also validated experimentally through a prototype. Secondly, new ways to artificially increase the effective oscillation frequency are introduced and validated by simulations. Finally, new approaches to shape the quantization noise and filter the output spectrum of a RO-based ADC are proposed theoretically. In particular, a quadrature RO-based band-pass ADC and a power-efficient Nyquist A/D converter are proposed and validated by simulations. All the techniques proposed in this work are especially devoted for highbandwidth applications, such as Internet-of-Things (IoT) nodes or maximally digital radio receivers. Nevertheless, their field of application is not restricted to them, and could be extended to others like biomedical instrumentation or sensing.El propósito de esta tesis doctoral es la propuesta y la implementación de arquitecturas de conversión de datos basadas en osciladores en anillos, compatibles con diseños mayoritariamente digitales, escalables en los procesos CMOS de fabricación más modernos donde las estructuras digitales se ven favorecidas. La miniaturización de las tecnologías CMOS de diseño lleva consigo la reducción de la tensión de alimentación para el desarrollo de arquitecturas pequeñas y eficientes en potencia. Esto reduce significativamente la disponibilidad de tensión para saturar transistores, lo que añadido a una ganancia cada vez menor de los mismos, ruido y efectos parásitos como el “mismatch” y las variaciones de proceso, tensión y temperatura han llevado a que sea cada vez más complejo el diseño de estructuras analógicas eficientes. Durante los últimos años la conversión A/D basada en codificación temporal ha ganado gran popularidad dado que permite la implementación de estructuras mayoritariamente digitales. Como parte de esta evolución, los osciladores controlados por tensión diseñados con topologías de oscilador en anillo han surgido como un candidato prometedor para la concepción de nuevas técnicas de digitalización. Los convertidores de datos basados en osciladores en anillo son extremadamente sensibles (variación de frecuencia con respecto a la señal de entrada) así como escalables, además de otras propiedades muy atractivas, como el conformado espectral de ruido de cuantificación y el filtrado “anti-aliasing”. Sin embargo, su respuesta no lineal y el limitado tiempo de retraso alcanzable por una compuerta NOT restringen la resolución del conversor, especialmente para conversión A/D en aplicaciones de elevado ancho de banda. Esta tesis doctoral propone nuevas técnicas para aliviar este tipo de problemas. En primer lugar, se proponen técnicas basadas en circuito para compensar el efecto de la no linealidad en los osciladores en anillo, y se comparan con soluciones equivalentes ya publicadas. Las propuestas se diseñan y simulan en tecnología CMOS de 65 nm para arquitecturas en lazo abierto. Una de estas técnicas presentadas es también validada experimentalmente a través de un prototipo. En segundo lugar, se introducen y validan por simulación varias formas de incrementar artificialmente la frecuencia de oscilación efectiva. Para finalizar, se proponen teóricamente dos enfoques para configurar nuevas formas de conformación del ruido de cuantificación y filtrado del espectro de salida de los datos digitales. En particular, son propuestos y validados por simulación un ADC pasobanda en cuadratura de fase y un ADC de Nyquist de gran eficiencia en potencia. Todas las técnicas propuestas en este trabajo están destinadas especialmente para aplicaciones de alto ancho de banda, tales como módulos para el Internet de las cosas o receptores de radiofrecuencia mayoritariamente digitales. A pesar de ello, son extrapolables también a otros campos como el de la instrumentación biomédica o el de la medición de señales mediante sensores.Programa de Doctorado en Ingeniería Eléctrica, Electrónica y Automática por la Universidad Carlos III de MadridPresidente: Juan Pablo Alegre Pérez.- Secretario: Celia López Ongil.- Vocal: Fernando Cardes Garcí

Design and debugging of multi-step analog to digital converters

With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, and higher re-configurability. The trend of increasing integration level for integrated circuits has forced the A/D converter interface to reside on the same silicon in complex mixed-signal ICs containing mostly digital blocks for DSP and control. However, specifications of the converters in various applications emphasize high dynamic range and low spurious spectral performance. It is nontrivial to achieve this level of linearity in a monolithic environment where post-fabrication component trimming or calibration is cumbersome to implement for certain applications or/and for cost and manufacturability reasons. Additionally, as CMOS integrated circuits are accomplishing unprecedented integration levels, potential problems associated with device scaling – the short-channel effects – are also looming large as technology strides into the deep-submicron regime. The A/D conversion process involves sampling the applied analog input signal and quantizing it to its digital representation by comparing it to reference voltages before further signal processing in subsequent digital systems. Depending on how these functions are combined, different A/D converter architectures can be implemented with different requirements on each function. Practical realizations show the trend that to a first order, converter power is directly proportional to sampling rate. However, power dissipation required becomes nonlinear as the speed capabilities of a process technology are pushed to the limit. Pipeline and two-step/multi-step converters tend to be the most efficient at achieving a given resolution and sampling rate specification. This thesis is in a sense unique work as it covers the whole spectrum of design, test, debugging and calibration of multi-step A/D converters; it incorporates development of circuit techniques and algorithms to enhance the resolution and attainable sample rate of an A/D converter and to enhance testing and debugging potential to detect errors dynamically, to isolate and confine faults, and to recover and compensate for the errors continuously. The power proficiency for high resolution of multi-step converter by combining parallelism and calibration and exploiting low-voltage circuit techniques is demonstrated with a 1.8 V, 12-bit, 80 MS/s, 100 mW analog to-digital converter fabricated in five-metal layers 0.18-µm CMOS process. Lower power supply voltages significantly reduce noise margins and increase variations in process, device and design parameters. Consequently, it is steadily more difficult to control the fabrication process precisely enough to maintain uniformity. Microscopic particles present in the manufacturing environment and slight variations in the parameters of manufacturing steps can all lead to the geometrical and electrical properties of an IC to deviate from those generated at the end of the design process. Those defects can cause various types of malfunctioning, depending on the IC topology and the nature of the defect. To relive the burden placed on IC design and manufacturing originated with ever-increasing costs associated with testing and debugging of complex mixed-signal electronic systems, several circuit techniques and algorithms are developed and incorporated in proposed ATPG, DfT and BIST methodologies. Process variation cannot be solved by improving manufacturing tolerances; variability must be reduced by new device technology or managed by design in order for scaling to continue. Similarly, within-die performance variation also imposes new challenges for test methods. With the use of dedicated sensors, which exploit knowledge of the circuit structure and the specific defect mechanisms, the method described in this thesis facilitates early and fast identification of excessive process parameter variation effects. The expectation-maximization algorithm makes the estimation problem more tractable and also yields good estimates of the parameters for small sample sizes. To allow the test guidance with the information obtained through monitoring process variations implemented adjusted support vector machine classifier simultaneously minimize the empirical classification error and maximize the geometric margin. On a positive note, the use of digital enhancing calibration techniques reduces the need for expensive technologies with special fabrication steps. Indeed, the extra cost of digital processing is normally affordable as the use of submicron mixed signal technologies allows for efficient usage of silicon area even for relatively complex algorithms. Employed adaptive filtering algorithm for error estimation offers the small number of operations per iteration and does not require correlation function calculation nor matrix inversions. The presented foreground calibration algorithm does not need any dedicated test signal and does not require a part of the conversion time. It works continuously and with every signal applied to the A/D converter. The feasibility of the method for on-line and off-line debugging and calibration has been verified by experimental measurements from the silicon prototype fabricated in standard single poly, six metal 0.09-µm CMOS process