Ring oscillator based injection locked clock multiplier

This thesis describes a ring-based injection locked clock multiplier (ILCM) designed with the goal of generating a high-frequency and low-jitter clock. Building on prior research done on injection locking, this design uses a reference frequency doubling technique to push the noise bandwidth of the circuit to Fref/3 to suppress DCO noise to a large extent. A background duty cycle error correction technique is employed to correct errors on the doubled clock that could be detrimental to performance. The design also modifies an existing architecture to achieve type-II suppression of DCO noise in order to fully suppress the flicker noise which becomes prevalent in low process nodes. The prototype ILCM was fabricated in TSMC 65 nm CMOS technology. Thorough testing was performed to characterize the effectiveness of the aforementioned techniques. The circuit achieves 340 fsrms integrated jitter when operating at 5 GHz while only consuming 5.3 mW of power. The ILCM's figure of merit, -242.4 dB, is on par with state-of-the-art ring-based clock multipliers while operating at a much higher output frequency and multiplication factor than previously published work. These results indicate the effectiveness of reference frequency doubling in a ring-based, high-performance clock multiplier design

Design of energy efficient high speed I/O interfaces

Energy efficiency has become a key performance metric for wireline high speed I/O interfaces. Consequently, design of low power I/O interfaces has garnered large interest that has mostly been focused on active power reduction techniques at peak data rate. In practice, most systems exhibit a wide range of data transfer patterns. As a result, low energy per bit operation at peak data rate does not necessarily translate to overall low energy operation. Therefore, I/O interfaces that can scale their power consumption with data rate requirement are desirable. Rapid on-off I/O interfaces have a potential to scale power with data rate requirements without severely affecting either latency or the throughput of the I/O interface. In this work, we explore circuit techniques for designing rapid on-off high speed wireline I/O interfaces and digital fractional-N PLLs. A burst-mode transmitter suitable for rapid on-off I/O interfaces is presented that achieves 6 ns turn-on time by utilizing a fast frequency settling ring oscillator in digital multiplying delay-locked loop and a rapid on-off biasing scheme for current mode output driver. Fabricated in 90 nm CMOS process, the prototype achieves 2.29 mW/Gb/s energy efficiency at peak data rate of 8 Gb/s. A 125X (8 Gb/s to 64 Mb/s) change in effective data rate results in 67X (18.29 mW to 0.27 mW) change in transmitter power consumption corresponding to only 2X (2.29 mW/Gb/s to 4.24 mW/Gb/s) degradation in energy efficiency for 32-byte long data bursts. We also present an analytical bit error rate (BER) computation technique for this transmitter under rapid on-off operation, which uses MDLL settling measurement data in conjunction with always-on transmitter measurements. This technique indicates that the BER bathtub width for 10^(−12) BER is 0.65 UI and 0.72 UI during rapid on-off operation and always-on operation, respectively. Next, a pulse response estimation-based technique is proposed enabling burst-mode operation for baud-rate sampling receivers that operate over high loss channels. Such receivers typically employ discrete time equalization to combat inter-symbol interference. Implementation details are provided for a receiver chip, fabricated in 65nm CMOS technology, that demonstrates efficacy of the proposed technique. A low complexity pulse response estimation technique is also presented for low power receivers that do not employ discrete time equalizers. We also present techniques for implementation of highly digital fractional-N PLL employing a phase interpolator based fractional divider to improve the quantization noise shaping properties of a 1-bit ∆Σ frequency-to-digital converter. Fabricated in 65nm CMOS process, the prototype calibration-free fractional-N Type-II PLL employs the proposed frequency-to-digital converter in place of a high resolution time-to-digital converter and achieves 848 fs rms integrated jitter (1 kHz-30 MHz) and -101 dBc/Hz in-band phase noise while generating 5.054 GHz output from 31.25 MHz input